会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明申请
    • FAULT INJECTION
    • 故障注意
    • US20100218058A1
    • 2010-08-26
    • US12392468
    • 2009-02-25
    • Senthil SOMASUNDARAMJun QIANPaul CHANGThomas A. HAMILTON
    • Senthil SOMASUNDARAMJun QIANPaul CHANGThomas A. HAMILTON
    • G01R31/3177G06F11/25
    • G01R31/31716G01R31/31706G01R31/31717
    • Systems, methods, and other embodiments associated with programmable application specific integrated circuit (ASIC) fault injection are described. One example ASIC includes a serializer de-serializer (SERDES). The example ASIC may also include logics to process data in the ASIC. At least one of the logics either receives data from the SERDES and/or provides data to the SERDES. The example ASIC may also include an embedded fault injection logic (EFIL) to control injection of a fault to a path (e.g., data, control) associated with at least one of the logics. The example ASIC may also include an embedded set of multiplexers (ESOMs) controlled by the EFIL. The ESOMs are controllable by the EFIL to inject a fault signal to the data path.
    • 描述了与可编程应用专用集成电路(ASIC)故障注入相关联的系统,方法和其他实施例。 一个示例性ASIC包括串行器解串器(SERDES)。 示例ASIC还可以包括用于处理ASIC中的数据的逻辑。 至少有一个逻辑可以从SERDES接收数据和/或向SERDES提供数据。 示例性ASIC还可以包括嵌入式故障注入逻辑(EFIL),以控制将故障注入与至少一个逻辑相关联的路径(例如,数据,控制)。 示例性ASIC还可以包括由EFIL控制的嵌入式多路复用器集合(ESOM)。 ESOM可由EFIL控制,以将故障信号注入数据通路。
    • 3. 发明授权
    • Processor to JTAG test access port interface
    • 处理器到JTAG测试访问端口接口
    • US07908533B2
    • 2011-03-15
    • US12203109
    • 2008-09-02
    • Senthil SomasundaramJun Qian
    • Senthil SomasundaramJun Qian
    • G01R31/28
    • G06F11/267G01R31/318533G01R31/318555
    • Method and apparatus for operating for operating an Institute of Electrical and Electronics Engineers (IEEE) Standard 1149.1 compliant Joint Test Action Group (JTAG) Test Access Port (TAP) controller are disclosed. An example apparatus includes write logic that is configured to operationally interface with a TAP controller and a processor. The write logic is further configured to receive, from the processor, data for initializing the apparatus and operating the TAP controller, convert at least a portion of the data from a parallel format to a serial format and communicate the converted data to the TAP controller.
    • 公开了用于操作电气和电子工程师协会(IEEE)标准1149.1兼容联合测试行动组(JTAG)测试访问端口(TAP)控制器的方法和装置。 一种示例性装置包括被配置为与TAP控制器和处理器操作地接口的写入逻辑。 写逻辑还被配置为从处理器接收用于初始化装置和操作TAP控制器的数据,将来自并行格式的数据的至少一部分转换为串行格式,并将转换后的数据传送给TAP控制器。