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1. 发明申请

US20080016396A1 TEST EMULATOR, TEST MODULE EMULATOR AND RECORD MEDIUM STORING PROGRAM THEREIN 审中-公开
公开(公告)号：US20080016396A1
公开(公告)日：2008-01-17
申请号：US11860437
申请日：2007-09-24
申请人： Shinsaku Higashi , Seiji Ichiyoshi , Ankan Pramanick , Mark Elston , Leon Chen , Robert Sauer , Ramachandran Krishnaswamy , Harsanjeet Singh , Toshiaki Adachi , Yoshihumi Tahara
发明人： Shinsaku Higashi , Seiji Ichiyoshi , Ankan Pramanick , Mark Elston , Leon Chen , Robert Sauer , Ramachandran Krishnaswamy , Harsanjeet Singh , Toshiaki Adachi , Yoshihumi Tahara
IPC分类号： G06F11/25
CPC分类号： G01R31/3183 , G01R31/318307 , G01R31/318342 , G01R31/31907
摘要： There is provided a test emulator for emulating a test apparatus including a plurality of test modules for supplying test signal to devices under test respectively, including: a plurality of test module emulation sections for emulating the plurality of test modules generating the test signal based on different cycles, a control emulation section for emulating a control apparatus for controlling the test of the devices under test, a synchronous emulation section for generating test signal generating timings, at which each of the plurality of test module emulation sections is to generate the test signal in simulation corresponding to cycle time of the test module emulation section, based on instructions from the control emulation section, a timing alignment section for aligning the plurality of test signal generating timings generated by the synchronous emulation section in order of time, and outputting them one by one, and a schedule section for causing the test module emulation section corresponding to one of the test signal generating timings output by the timing alignment section to generate the test signal in simulation in the cycle time corresponding to the test signal generating timing.

2. 发明授权

US07290192B2 Test apparatus and test method for testing plurality of devices in parallel 有权
标题翻译：用于同时测试多个设备的测试装置和测试方法
公开(公告)号：US07290192B2
公开(公告)日：2007-10-30
申请号：US10403817
申请日：2003-03-31
申请人： Seiji Ichiyoshi
发明人： Seiji Ichiyoshi
IPC分类号： G01R31/3183 , G01R31/3185
CPC分类号： G01R31/318342 , G01R31/318307 , G01R31/31907
摘要： A test apparatus according to the present invention includes: a plurality of test modules, connected to either of the plurality of devices under test, for supplying a test signal to the connected device under test; a plurality of control apparatuses for controlling the plurality of test modules, and for testing the plurality of devices under test in parallel; and a connection switching section for switching topology of the plurality of control apparatuses and the plurality of test modules so that the plurality of control apparatuses connect with the plurality of devices under test respectively.
摘要翻译：根据本发明的测试装置包括：多个测试模块，连接到被测试的多个设备中的任一个，用于向所连接的被测设备提供测试信号; 多个控制装置，用于控制多个测试模块，并且并行地测试所述多个被测设备; 以及连接切换部，用于切换多个控制装置和多个测试模块的拓扑结构，使得多个控制装置分别与被测试的多个装置连接。

3. 发明授权

US07272765B2 Test apparatus and test method for testing plurality of devices in parallel 有权
标题翻译：用于同时测试多个设备的测试装置和测试方法
公开(公告)号：US07272765B2
公开(公告)日：2007-09-18
申请号：US10813594
申请日：2004-03-30
申请人： Seiji Ichiyoshi
发明人： Seiji Ichiyoshi
IPC分类号： G01R31/28
CPC分类号： G01R31/318342 , G01R31/318307 , G01R31/31907
摘要： A test apparatus 10 according to the present invention includes: a plurality of test modules 150, connected to either of the plurality of devices under test 100, for supplying a test signal to the connected device under test 100; a plurality of control apparatuses 130 for controlling the plurality of test modules 150, and for testing the plurality of devices under test 100 in parallel; and a connection setting section 140 for switching topology of the plurality of control apparatuses 130 and the plurality of test modules 150 so that the plurality of control apparatuses 10 connect with the plurality of devices under test 100 respectively.
摘要翻译：根据本发明的测试设备10包括：多个测试模块150，连接到被测试的多个设备中的任一个测试模块，用于向连接的被测设备100提供测试信号; 多个控制装置130，用于控制多个测试模块150，并且用于并行地测试被测试的多个设备100; 以及用于切换多个控制装置130和多个测试模块150的拓扑结构的连接设置部分140，使得多个控制装置10分别与被测试的多个被测设备100连接。

4. 发明申请

US20050039079A1 Test emulator, test module emulator, and record medium storing program therein 审中-公开
标题翻译：测试仿真器，测试模块仿真器和其中的记录介质存储程序
公开(公告)号：US20050039079A1
公开(公告)日：2005-02-17
申请号：US10814603
申请日：2004-03-31
申请人： Shinsaku Higashi , Seiji Ichiyoshi , Ankan Pramanick , Mark Elston , Leon Chen , Robert Sauer , Ramachandran Krishnaswamy , Harsanjeet Singh , Toshiaki Adachi , Yoshihumi Tahara
发明人： Shinsaku Higashi , Seiji Ichiyoshi , Ankan Pramanick , Mark Elston , Leon Chen , Robert Sauer , Ramachandran Krishnaswamy , Harsanjeet Singh , Toshiaki Adachi , Yoshihumi Tahara
IPC分类号： G01R31/3183 , G01R31/319 , H02H3/05
CPC分类号： G01R31/3183 , G01R31/318307 , G01R31/318342 , G01R31/31907
摘要： There is provided a test emulator for emulating a test apparatus including a plurality of test modules for supplying test signal to devices under test respectively, including: a plurality of test module emulation sections for emulating the plurality of test modules generating the test signal based on different cycles, a control emulation section for emulating a control apparatus for controlling the test of the devices under test, a synchronous emulation section for generating test signal generating timings, at which each of the plurality of test module emulation sections is to generate the test signal in simulation corresponding to cycle time of the test module emulation section, based on instructions from the control emulation section, a timing alignment section for aligning the plurality of test signal generating timings generated by the synchronous emulation section in order of time, and outputting them one by one, and a schedule section for causing the test module emulation section corresponding to one of the test signal generating timings output by the timing alignment section to generate the test signal in simulation in the cycle time corresponding to the test signal generating timing.
摘要翻译：提供了一种用于模拟测试装置的测试仿真器，该测试装置包括用于将测试信号分别提供给被测试器件的多个测试模块，包括：多个测试模块仿真部分，用于仿真基于不同的测试信号生成测试信号的多个测试模块循环，用于仿真用于控制被测设备的测试的控制装置的控制仿真部分，用于产生测试信号产生定时的同步仿真部分，多个测试模块仿真部分中的每个测试信号产生定时部分将在其中生成测试信号基于来自控制仿真部分的指令，对应于测试模块仿真部分的周期时间的模拟定时对准部分，用于对准由同步仿真部分按时间顺序产生的多个测试信号产生定时，并且通过一个以及用于引起测试模块仿真部分的调度部分对应于由定时对准部分输出的测试信号产生定时之一，以在对应于测试信号产生定时的周期时间中在仿真中产生测试信号。

5. 发明申请

US20080010524A1 TEST EMULATOR, TEST MODULE EMULATOR AND RECORD MEDIUM STORING PROGRAM THEREIN 审中-公开
标题翻译：测试仿真器，测试模块仿真器和记录媒体存储程序
公开(公告)号：US20080010524A1
公开(公告)日：2008-01-10
申请号：US11860469
申请日：2007-09-24
申请人： Shinsaku Higashi , Seiji Ichiyoshi , Ankan Pramanick , Mark Elston , Leon Chen , Robert Sauer , Ramachandran Krishnaswamy , Harsanjeet Singh , Toshiaki Adachi , Yoshihumi Tahara
发明人： Shinsaku Higashi , Seiji Ichiyoshi , Ankan Pramanick , Mark Elston , Leon Chen , Robert Sauer , Ramachandran Krishnaswamy , Harsanjeet Singh , Toshiaki Adachi , Yoshihumi Tahara
IPC分类号： H02H3/05
CPC分类号： G01R31/3183 , G01R31/318307 , G01R31/318342 , G01R31/31907
摘要： There is provided a test emulator for emulating a test apparatus including a plurality of test modules for supplying test signal to devices under test respectively, including: a plurality of test module emulation sections for emulating the plurality of test modules generating the test signal based on different cycles, a control emulation section for emulating a control apparatus for controlling the test of the devices under test, a synchronous emulation section for generating test signal generating timings, at which each of the plurality of test module emulation sections is to generate the test signal in simulation corresponding to cycle time of the test module emulation section, based on instructions from the control emulation section, a timing alignment section for aligning the plurality of test signal generating timings generated by the synchronous emulation section in order of time, and outputting them one by one, and a schedule section for causing the test module emulation section corresponding to one of the test signal generating timings output by the timing alignment section to generate the test signal in simulation in the cycle time corresponding to the test signal generating timing.
摘要翻译：提供了一种用于模拟测试装置的测试仿真器，该测试装置包括用于将测试信号分别提供给被测试器件的多个测试模块，包括：多个测试模块仿真部分，用于仿真基于不同的测试信号生成测试信号的多个测试模块循环，用于仿真用于控制被测设备的测试的控制装置的控制仿真部分，用于产生测试信号产生定时的同步仿真部分，多个测试模块仿真部分中的每个测试信号产生定时部分将在其中生成测试信号基于来自控制仿真部分的指令，对应于测试模块仿真部分的周期时间的模拟定时对准部分，用于对准由同步仿真部分按时间顺序产生的多个测试信号产生定时，并且通过一个以及用于引起测试模块仿真部分的调度部分对应于由定时对准部分输出的测试信号产生定时之一，以在对应于测试信号产生定时的周期时间中在仿真中产生测试信号。

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