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    • 8. 发明授权
    • Detecting element, detecting device and detecting method
    • 检测元件,检测装置及检测方法
    • US08045141B2
    • 2011-10-25
    • US12296426
    • 2007-05-08
    • Yoichiro HandaSatoru Nishiuma
    • Yoichiro HandaSatoru Nishiuma
    • G01N33/48G01N21/55
    • G01N21/554B82Y15/00G01N33/54386G01N33/553G01N2021/258
    • The present invention provides a detecting element which can stably detect a substance with high sensitivity; a detecting device therefor; and a detecting method therefor. The detecting element and the detecting device according to the present invention have a plurality of planes having a plurality of mutually-separated metallic structures arranged thereon. The detecting method according to the present invention includes making a detecting light irradiate the detecting element so that the light can intersect a plurality of the planes. Thereby, the detecting light is more frequently absorbed in the vicinity of the metallic structure and the detecting device can stably detect a slight change of a spectrum originating from a trace change of a refractive index occurring in the vicinity of the metallic structure, with the high sensitivity.
    • 本发明提供一种能够以高灵敏度稳定地检测物质的检测元件; 一种检测装置; 及其检测方法。 根据本发明的检测元件和检测装置具有多个平面,其上布置有多个相互分离的金属结构。 根据本发明的检测方法包括使检测光照射到检测元件,使得光可以与多个平面相交。 因此,检测光更多地被吸收在金属结构附近,并且检测装置可以稳定地检测由金属结构附近发生的折射率的痕量变化引起的光谱的轻微变化,高 灵敏度。