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    • 7. 发明授权
    • Differential column readout scheme for CMOS APS pixels
    • CMOS APS像素差分列读出方案
    • US06919551B2
    • 2005-07-19
    • US10230176
    • 2002-08-29
    • Sandor L. BarnaAlex Krymski
    • Sandor L. BarnaAlex Krymski
    • H01J40/14H01L31/00H04N5/357H04N5/374H04N5/378
    • H04N5/361H03F3/08H04N5/3575H04N5/378
    • The present invention provides an improved column readout circuitry and method of operation which minimizes substrate and other common mode noise during a read out operation. The circuit improves the consistency of the pixel to pixel output of the pixel array and increases the dynamic range of the pixel output. This is accomplished by obtaining a differential readout of the reset signal and integrated charge signal from a desired pixel along with the reset signal and charge signal from a reference circuit. In this manner common mode noise can be minimized by a combination of signals from the desired and reference pixels in the sample and hold aspect of the column circuitry. In one exemplary embodiment of the invention, a 3T pixel arrangement is used. In another exemplary embodiment, a 4T arrangement is used. Additional exemplary embodiments provide differential column readout circuitry that can be used with any two signal sources.
    • 本发明提供一种改进的列读出电路和操作方法,其在读出操作期间使衬底和其它共模噪声最小化。 该电路提高像素阵列的像素与像素输出的一致性,并增加像素输出的动态范围。 这是通过从参考电路获得来自期望像素的复位信号和积分电荷信号的差分读出以及复位信号和电荷信号来实现的。 以这种方式,可以通过来自列电路的采样和保持方面中的期望参考像素和参考像素的信号的组合来最小化共模噪声。 在本发明的一个示例性实施例中,使用3T像素排列。 在另一示例性实施例中,使用4T布置。 附加的示例性实施例提供可与任何两个信号源一起使用的差分列读出电路。
    • 9. 再颁专利
    • Analog to digital conversion for a CMOS imager
    • CMOS成像器的模数转换
    • USRE45493E1
    • 2015-04-28
    • US13532165
    • 2012-06-25
    • Eric R. FossumSandor L. Barna
    • Eric R. FossumSandor L. Barna
    • H03M1/34H03M1/18
    • H03M1/18H03M1/1215H03M1/46
    • An image sensor system using offset analog to digital converters. The analog to digital converters require a plurality of clock cycles to carry out the actual conversion. These conversions are offset in time from one another, so that at each clock cycle, new data is available. A CMOS image sensor converts successive analog signals, representing at least a portion of an image, into successive digital signals using an analog to digital circuit block. Multiple clock cycles may be used by the circuit block to fully convert an analog signal into a corresponding digital signal. The conversion of one analog signal into a corresponding digital signal by the circuit block may be offset in time and partially overlapping with the conversion of a successive analog signal into its corresponding successive digital signal by the circuit block.
    • 使用偏移模数转换器的图像传感器系统。 模数转换器需要多个时钟周期来执行实际的转换。 这些转换在时间上彼此偏移,因此在每个时钟周期,新的数据可用。 CMOS图像传感器将表示图像的至少一部分的连续模拟信号转换成使用模数电路块的连续数字信号。 电路块可以使用多个时钟周期来将模拟信号完全转换成相应的数字信号。 通过电路块将一个模拟信号转换成相应的数字信号可能在时间上偏移,并且部分地与连续的模拟信号由电路块转换成其对应的连续的数字信号部分重叠。