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    • 1. 发明授权
    • Integrated circuit with dynamically controlled voltage supply
    • 具有动态控制电压供应的集成电路
    • US07519925B2
    • 2009-04-14
    • US11139452
    • 2005-05-27
    • Sami IssaUming KoDavid Scott
    • Sami IssaUming KoDavid Scott
    • G06F17/50
    • G01R31/3004G06F17/5063
    • An electronic system (10). The system comprises circuitry (P1) for receiving a system voltage from a voltage supply. The system also comprises circuitry (141), responsive to the system voltage, for providing data processing functionality. The circuitry for providing data processing functionality comprises a critical path (CP1) and the critical path comprises a plurality of transistors. At least some transistors in the plurality of transistors have a corresponding predetermined voltage operating limit corresponding to a predicted lifespan. The system also comprises circuitry (221) for indicating a potential capability of operational speed of the critical path. The system also comprises circuitry (CB) for coupling the system voltage to the critical path. Lastly, the system also comprises circuitry (26) for adjusting the system voltage, as provided by the voltage supply, in response to the circuitry for indicating a potential capability. In selected instances, the circuitry for adjusting adjusts the voltage supplied by the voltage supply to be a voltage greater than the predetermined voltage operating limit while still complying with the predicted lifespan.
    • 电子系统(10)。 该系统包括用于从电压源接收系统电压的电路(P1)。 系统还包括响应系统电压的用于提供数据处理功能的电路(141)。 用于提供数据处理功能的电路包括关键路径(CP1),并且关键路径包括多个晶体管。 多个晶体管中的至少一些晶体管具有对应于预测寿命的相应的预定电压工作极限。 该系统还包括用于指示关键路径的操作速度的潜在能力的电路(221)。 该系统还包括用于将系统电压耦合到关键路径的电路(CB)。 最后,该系统还包括用于响应于用于指示潜在能力的电路来调节由电压源提供的系统电压的电路(26)。 在选择的情况下,用于调整的电路将电压供应提供的电压调整为大于预定电压工作极限的电压,同时仍然符合预期的使用寿命。
    • 3. 发明申请
    • Integrated circuit with dynamically controlled voltage supply
    • 具有动态控制电压供应的集成电路
    • US20050273742A1
    • 2005-12-08
    • US11139452
    • 2005-05-27
    • Sami IssaUming KoDavid Scott
    • Sami IssaUming KoDavid Scott
    • G06F9/45
    • G01R31/3004G06F17/5063
    • An electronic system (10). The system comprises circuitry (P1) for receiving a system voltage from a voltage supply. The system also comprises circuitry (141), responsive to the system voltage, for providing data processing functionality. The circuitry for providing data processing functionality comprises a critical path (CP1) and the critical path comprises a plurality of transistors. At least some transistors in the plurality of transistors have a corresponding predetermined voltage operating limit corresponding to a predicted lifespan. The system also comprises circuitry (221) for indicating a potential capability of operational speed of the critical path. The system also comprises circuitry (CB) for coupling the system voltage to the critical path. Lastly, the system also comprises circuitry (26) for adjusting the system voltage, as provided by the voltage supply, in response to the circuitry for indicating a potential capability. In selected instances, the circuitry for adjusting adjusts the voltage supplied by the voltage supply to be a voltage greater than the predetermined voltage operating limit while still complying with the predicted lifespan.
    • 电子系统(10)。 该系统包括用于从电压源接收系统电压的电路(P 1 SUB)。 该系统还包括响应于系统电压的用于提供数据处理功能的电路(14 1 1)。 用于提供数据处理功能的电路包括关键路径(CP <1> 1),并且关键路径包括多个晶体管。 多个晶体管中的至少一些晶体管具有对应于预测寿命的相应的预定电压工作极限。 该系统还包括用于指示关键路径的操作速度的潜在能力的电路(22I 1)。 该系统还包括用于将系统电压耦合到关键路径的电路(CB)。 最后,该系统还包括用于响应于用于指示潜在能力的电路来调节由电压源提供的系统电压的电路(26)。 在选择的情况下,用于调整的电路将电压供应提供的电压调整为大于预定电压工作极限的电压,同时仍然符合预期的使用寿命。
    • 5. 发明授权
    • Compact and highly efficient DRAM cell
    • 紧凑高效的DRAM单元
    • US06906946B2
    • 2005-06-14
    • US10657848
    • 2003-09-09
    • Sami Issa
    • Sami Issa
    • G11C11/404G11C11/405G11C11/24
    • G11C11/404G11C11/405
    • A compact dynamic random access memory (DRAM) cell and highly efficient methods for using the DRAM cell are disclosed. The DRAM cell provides reading, writing, and storage of a data bit on an ASIC chip. The DRAM cell includes a first transistor acting as a pass gate and having a first source node, a first gate node, and a first drain node. The DRAM cell also includes a second transistor acting as a storage device and having a second drain node that is electrically connected to the first drain node to form a storage node. The second transistor also includes a second source node and a second gate node. The second source node is electrically floating, thus increasing the effective storage capacitance of the storage node.
    • 公开了一种紧凑的动态随机存取存储器(DRAM)单元和用于使用DRAM单元的高效方法。 DRAM单元提供ASIC芯片上的数据位的读取,写入和存储。 DRAM单元包括用作通过栅极并具有第一源极节点,第一栅极节点和第一漏极节点的第一晶体管。 DRAM单元还包括用作存储装置的第二晶体管,并且具有电连接到第一漏极节点以形成存储节点的第二漏极节点。 第二晶体管还包括第二源极节点和第二栅极节点。 第二源节点是电浮动的,从而增加存储节点的有效存储电容。
    • 7. 发明授权
    • Compact analog-multiplexed global sense amplifier for rams
    • 紧凑型模拟多路复用全局读出放大器
    • US06650572B2
    • 2003-11-18
    • US10224841
    • 2002-08-21
    • Sami Issa
    • Sami Issa
    • G11C1604
    • G11C11/4097G11C7/1006G11C7/12G11C7/18G11C2207/002G11C2207/104
    • The method and system of the present invention superimposes read and write operations by connecting the global bit lines that are not selected to the Vdd. As a result, the respective local sense amplifiers for the non-selected global bit lines will just read and refresh the respective memory cells. This new approach results in smaller local sense amplifiers and one global sense amplifiers for several memory cells (and local sense amplifiers). In one embodiment, eight global bit lines are shared by one global sense amplifier and multiplexed to achieve the advantages of the present invention. Due to an analog global multiplexing scheme used by the present invention, only one global bit line pair generates voltage development as an input to a respective local sense amplifier during a write operation, while the other three global bit line pairs are disconnected from their respective local sense amplifiers and thus have no voltage development. The global bit line pairs with no voltage development generate zero voltage development on the local bit lines and the respective activated sense amplifiers amplify only the cell data which reassembles a read and refresh operation.
    • 本发明的方法和系统通过将未选择的全局位线连接到Vdd来叠加读写操作。 结果,用于非选择的全局位线的各个本地读出放大器将仅读取和刷新相应的存储器单元。 这种新方法导致较小的本地读出放大器和用于多个存储器单元(和局部读出放大器)的一个全局读出放大器。在一个实施例中,八个全局位线由一个全局读出放大器共享并被多路复用以实现本发明的优点 。 由于本发明使用的模拟全局复用方案,在写入操作期间,只有一个全局位线对产生作为相应局部读出放大器的输入的电压开发,而另外三个全局位线对与它们各自的本地 感测放大器,因此没有电压发展。 没有电压开发的全局位线对在局部位线上产生零电压显影,并且相应的激活的读出放大器仅放大重新组合读取和刷新操作的单元数据。
    • 9. 发明授权
    • Compact analog-multiplexed global sense amplifier for RAMS
    • 用于RAMS的紧凑型模拟多路复用全局读出放大器
    • US06480424B1
    • 2002-11-12
    • US09976236
    • 2001-10-12
    • Sami Issa
    • Sami Issa
    • G11C1604
    • G11C11/4097G11C7/1006G11C7/12G11C7/18G11C2207/002G11C2207/104
    • The method and system of the present invention superimposes read and write operations by connecting the global bit lines that are not selected to the Vdd. The respective local sense amplifiers for the non-selected global bit lines just read and refresh the respective memory cells resulting in smaller local sense amplifiers and one global sense amplifiers for several memory cells (and local sense amplifiers). In one embodiment, eight global bit lines are shared by one global sense amplifier and are multiplexed. Only one global bit line pair generates voltage development as an input to a respective local sense amplifier during a write operation, while the other three global bit line pairs are disconnected from their respective local sense amplifiers and thus have no voltage development. Thus, the respective activated sense amplifiers amplify only the cell data which reassembles a read and refresh operation.
    • 本发明的方法和系统通过将未选择的全局位线连接到Vdd来叠加读写操作。 用于未选择的全局位线的相应的局部读出放大器刚刚读取和刷新相应的存储器单元,导致较小的本地读出放大器和用于多个存储器单元(和局部读出放大器)的一个全局读出放大器。 在一个实施例中,八个全局位线由一个全局读出放大器共享并被复用。 只有一个全局位线对在写入操作期间产生作为相应局部读出放大器的输入的电压开发,而另外三个全局位线对与其相应的本地读出放大器断开连接,因此没有电压发展。 因此,相应的激活的读出放大器仅放大重新组合读取和刷新操作的单元数据。
    • 10. 发明申请
    • COMPACT AND HIGHLY EFFICIENT DRAM CELL
    • 紧凑,高效的DRAM单元
    • US20090080235A1
    • 2009-03-26
    • US12323283
    • 2008-11-25
    • Sami Issa
    • Sami Issa
    • G11C11/24H01L27/108
    • G11C11/404G11C11/405
    • A compact dynamic random access memory (DRAM) cell and highly efficient methods for using the DRAM cell are disclosed. The DRAM cell provides reading, writing, and storage of a data bit on an ASIC chip. The DRAM cell includes a first transistor acting as a pass gate and having a first source node, a first gate node, and a first drain node. The DRAM cell also includes a second transistor acting as a storage device and having a second drain node that is electrically connected to the first drain node to form a storage node. The second transistor also includes a second source node and a second gate node. The second source node is electrically floating, thus increasing the effective storage capacitance of the storage node.
    • 公开了一种紧凑的动态随机存取存储器(DRAM)单元和用于使用DRAM单元的高效方法。 DRAM单元提供ASIC芯片上的数据位的读取,写入和存储。 DRAM单元包括用作通过栅极并具有第一源极节点,第一栅极节点和第一漏极节点的第一晶体管。 DRAM单元还包括用作存储装置的第二晶体管,并且具有电连接到第一漏极节点以形成存储节点的第二漏极节点。 第二晶体管还包括第二源极节点和第二栅极节点。 第二源节点是电浮动的,从而增加存储节点的有效存储电容。