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    • 1. 发明申请
    • LIQUID CRYSTAL DISPLAY
    • 液晶显示器
    • US20120314163A1
    • 2012-12-13
    • US13481446
    • 2012-05-25
    • Sun-Kyu JOOSam Jin HWANGJu Hyeon BAEKJi Young JEONG
    • Sun-Kyu JOOSam Jin HWANGJu Hyeon BAEKJi Young JEONG
    • G02F1/1335
    • G02F1/13394G02F1/133514G02F2001/13396
    • According to exemplary embodiments of the invention, a liquid crystal display is provided which includes a plurality of spacers having different heights or a different distance or different pressure tolerance from a corresponding display panel and disposed in at least two pixel areas displaying different colors. As compared with conventional techniques (e.g., disposing the spacers only in one pixel area), the disposition density of the spacer per pixel area is lowered, such that it is possible to prevent the pressure tolerance of the spacer from intensively acting only on a specific pixel. The pressure tolerance of the spacer is uniformly maintained for every pixel, so that insufficiency of the amount of dropping liquid crystal is avoided. As a result, it is possible to prevent the light leakage caused by the insufficient liquid crystal.
    • 根据本发明的示例性实施例,提供一种液晶显示器,其包括具有不同高度的多个间隔件或与相应的显示面板不同的距离或不同的压力容限,并且设置在显示不同颜色的至少两个像素区域中。 与常规技术相比(例如,将间隔物仅设置在一个像素区域中),每个像素区域的间隔物的配置密度降低,使得可以防止间隔物的压力公差集中地作用于特定的 像素。 对于每个像素均匀地保持间隔物的压力公差,从而避免了滴下液晶的量不足。 结果,可以防止由于液晶不足引起的漏光。
    • 2. 发明授权
    • Liquid crystal display
    • 液晶显示器
    • US09291861B2
    • 2016-03-22
    • US13481446
    • 2012-05-25
    • Sun-Kyu JooSam Jin HwangJu Hyeon BaekJi Young Jeong
    • Sun-Kyu JooSam Jin HwangJu Hyeon BaekJi Young Jeong
    • G02F1/1339G02F1/1335
    • G02F1/13394G02F1/133514G02F2001/13396
    • According to exemplary embodiments of the invention, a liquid crystal display is provided which includes a plurality of spacers having different heights or a different distance or different pressure tolerance from a corresponding display panel and disposed in at least two pixel areas displaying different colors. As compared with conventional techniques (e.g., disposing the spacers only in one pixel area), the disposition density of the spacer per pixel area is lowered, such that it is possible to prevent the pressure tolerance of the spacer from intensively acting only on a specific pixel. The pressure tolerance of the spacer is uniformly maintained for every pixel, so that insufficiency of the amount of dropping liquid crystal is avoided. As a result, it is possible to prevent the light leakage caused by the insufficient liquid crystal.
    • 根据本发明的示例性实施例,提供一种液晶显示器,其包括具有不同高度的多个间隔件或与相应的显示面板不同的距离或不同的压力容限,并且设置在显示不同颜色的至少两个像素区域中。 与常规技术相比(例如,将间隔物仅设置在一个像素区域中),每个像素区域的间隔物的配置密度降低,使得可以防止间隔物的压力公差集中地作用于特定的 像素。 对于每个像素均匀地保持间隔物的压力公差,从而避免了滴下液晶的量不足。 结果,可以防止由于液晶不足引起的漏光。
    • 5. 发明授权
    • Semiconductor chip ground noise immunity testing system and tester
    • 半导体芯片接地噪声抗扰度测试系统和测试仪
    • US06429676B1
    • 2002-08-06
    • US09458461
    • 1999-12-09
    • Chan-Woong ChunSam Jin Hwang
    • Chan-Woong ChunSam Jin Hwang
    • G01R3126
    • G01R31/31924G01R31/3161
    • A semiconductor chip testing system comprises a tester with a predetermined number of pin drivers; high current and low current drivers are connected between the pin drivers of the tester and a ground voltage applying terminal of the semiconductor chip to be tested. Control signals are applied to the pin drivers according to a testing method of a tester to generate ground noise at the ground voltage applying terminal of the semiconductor chip, thereby performing a ground noise immunity test on the semiconductor chip. A semiconductor chip tester comprises a predetermined number of pin drivers with large current driving capacity; and a predetermined number of pin drivers with small current driving capacity, wherein ground noise control signals are applied to the pin drivers with large current driving capacity according to a test program to apply ground noise to a ground voltage applying terminal of a semiconductor chip to be tested while the semiconductor chip is tested according to the test program. Ground noise thus is induced to the semiconductor chip to ensure immunity from ground noise of the semiconductor chip. A semiconductor chip that cannot endure the higher range of ground noise during the test is classified as defective.
    • 半导体芯片测试系统包括具有预定数量的引脚驱动器的测试器; 高电流和低电流驱动器连接在测试器的引脚驱动器和要测试的半导体芯片的接地电压施加端子之间。 根据测试仪的测试方法,对引脚驱动器施加控制信号,以在半导体芯片的接地电压施加端产生接地噪声,从而对半导体芯片进行接地抗噪声测试。 半导体芯片测试器包括具有大电流驱动能力的预定数量的引脚驱动器; 以及具有小电流驱动能力的预定数量的引脚驱动器,其中,根据测试程序将接地噪声控制信号施加到具有大电流驱动能力的引脚驱动器,以将接地噪声施加到半导体芯片的接地电压施加端子为 在半导体芯片根据测试程序进行测试时进行测试。 因此,引起对半导体芯片的接地噪声,以确保对半导体芯片的接地噪声的抵抗。 在测试期间不能忍受较高范围的接地噪声的半导体芯片被分类为有缺陷的。