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    • 8. 发明授权
    • Non-volatile memory device and method of programming the same
    • 非易失性存储器件及其编程方法相同
    • US07515477B2
    • 2009-04-07
    • US11751586
    • 2007-05-21
    • Jae Won ChaSam Kyu WonKwang Ho Baek
    • Jae Won ChaSam Kyu WonKwang Ho Baek
    • G11C16/06
    • G11C16/24G11C16/0483G11C16/12
    • A non-volatile memory device comprises an even bit line and an odd bit line contacting to a memory cell array. A register unit includes a first register and a second register for temporarily storing data. A detecting node detects a voltage level of the specific bit line or the specific register which is connected to the bit lines and the registers. A selecting unit of the bit line includes a first variable voltage input terminal and a second variable voltage input terminal. The first variable voltage input terminal applies a first variable voltage of a specific voltage level to the even bit line in response to an even discharge signal. The second variable voltage input terminal applies a second variable voltage of a specific voltage level to the odd bit line in response to an odd discharge signal.
    • 非易失性存储器件包括偶数位线和与存储器单元阵列接触的奇数位线。 寄存器单元包括用于临时存储数据的第一寄存器和第二寄存器。 检测节点检测连接到位线和寄存器的特定位线或特定寄存器的电压电平。 位线的选择单元包括第一可变电压输入端和第二可变电压输入端。 第一可变电压输入端子响应于均匀放电信号向偶数位线施加特定电压电平的第一可变电压。 第二可变电压输入端子响应于奇数放电信号向奇数位线施加特定电压电平的第二可变电压。
    • 9. 发明申请
    • BLOCK DECODER AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME
    • 块解码器和半导体存储器件,包括它们
    • US20090040830A1
    • 2009-02-12
    • US12163905
    • 2008-06-27
    • Kwang Ho BAEKSam Kyu WONJae Won CHA
    • Kwang Ho BAEKSam Kyu WONJae Won CHA
    • G11C16/04G11C7/00G11C8/00
    • G11C16/08G11C11/10G11C11/12G11C11/14G11C16/0483
    • A semiconductor memory device can improve electrical properties by prohibiting a leakage current, which flows through a memory cell, in such a way as to turn off a drain select transistor, a source select transistor and a side transistor of an unselected memory cell block when the semiconductor memory device operates. The semiconductor memory device includes a memory cell block in which a plurality of memory cells, drain and source select transistors, and side word line transistors are connected in a string structure, a block decoder for outputting a block select signal in response to predecoded address signals and controlling the drain and source select transistors and the side word line transistors, and a block switch for connecting a global word line to word lines of the memory cell block in response to the block select signal.
    • 半导体存储器件可以通过阻止流过存储单元的泄漏电流来改善电性能,以便当非选择存储单元块的漏极选择晶体管,源选择晶体管和侧晶体管截止时 半导体存储器件工作。 半导体存储器件包括存储单元块,其中多个存储器单元,漏极和源极选择晶体管和侧面字线晶体管串联连接在一起;块解码器,用于响应于预解码的地址信号输出块选择信号 以及控制漏极和源极选择晶体管和侧面字线晶体管,以及用于响应于块选择信号将全局字线连接到存储器单元块的字线的块开关。