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1. 发明申请

WO2005068965A1 SYSTEM AND METHOD FOR MEASUREMENT OF OPTICAL PARAMETERS AND CHARACTERIZATION OF MULTIPORT OPTICAL DEVICES 审中-公开
标题翻译：用于测量光学参数的系统和方法以及多光学设备的表征
公开(公告)号：WO2005068965A1
公开(公告)日：2005-07-28
申请号：PCT/BR2005/000004
申请日：2005-01-13
申请人： FIBERWORK COMUNICACÕES OPTICAS LTDA-ME , BARCELOS, Sérgio , RANDO, Rafael Faraone , SASAKI, Nelson Kiyoshi , RIGON, Elso Luiz
发明人： BARCELOS, Sérgio , RANDO, Rafael Faraone , SASAKI, Nelson Kiyoshi , RIGON, Elso Luiz
IPC分类号： G01M11/00
CPC分类号： G01M11/337 , G01M11/3136 , G01M11/331 , G01M11/333 , G01M11/335 , G01M11/338 , G01M11/39
摘要： System and method for measurement of optical parameters and characterization of multiport optical devices constituted by process control systems, one or more sources of optical test signal (11) (tunable laser source), optical circuit including optical fiber and several other optical components arranged so as to constitute an interferometric optical arrangement, optical connectors, optoeletronic interfaces, photodetectors, analogical electronic; circuits, digital electronic circuits for digital signal processing and electronic circuits for data acquisition, the test and reference optical signals traversing paths with any lengths, that can be identical or distinct, the optical signal traversing at least one of said paths of interferometer being phase- and/or frequency-modulated. The signals of both interferometer arms are summed at a same photodetector (26) that translates to the electric domain the heterodyning of the optic signals, which contain the information of the optical characteristics of the DUT (17) (device under test), the transfer of the optical signals between the diverse ports of the DUT being described by means of the Optical "S"-Parameters where each "Sxy" parameter is represented using the formalism of Jones (Jones matrix) and/or the formalism of Muller (Muller matrix) and where all the determinations of the optical characteristics of the DUT (17) (bandwidth, phase, time delay, chromatic dispersion, 2nd order chromatic dispersion, reflectance, reflection coefficient, transmittance of the port "y" to the port "x" and vice versa, transmission coefficient of the port "y" to the port "x" and vice versa, insertion loss, polarization dependent loss, polarization mode dispersion (DGD/PMD), 2nd order DGD, etc.) are based on said "Sxy" parameters.
摘要翻译：用于测量光学参数的系统和方法以及由过程控制系统，一个或多个光学测试信号源（11）（可调谐激光源）组成的多端口光学器件的特性，包括光纤的光学电路和若干其他光学组件构成干涉光学布置，光学连接器，光电子接口，光电探测器，模拟电子; 电路，用于数字信号处理的数字电子电路和用于数据采集的电子电路，测试和参考光信号遍历具有任何长度的路径，其可以相同或不同，穿过至少一个所述干涉仪路径的光信号是相位差的，和/或频率调制。两个干涉仪臂的信号在相同的光电检测器（26）处相加，该光电检测器（26）转换为电畴的光信号的外差，其包含DUT（17）（待测器件）的光学特性的信息，转移通过光学“S”参数描述的DUT的不同端口之间的光信号，其中每个“Sxy”参数使用琼斯（琼斯矩阵）的形式和/或Muller的形式主义（Muller矩阵），并且其中DUT（17）的光学特性（带宽，相位，时间延迟，色散，二阶色散，反射率，反射系数，端口“y”对端口“x”的透射率）的所有确定端口“y”到端口“x”的传输系数反之亦然，插入损耗，偏振相关损耗，偏振模色散（DGD / PMD），二阶DGD等）都是基于所说的“ Sxy“参数。

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