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    • 2. 发明授权
    • Redundancy architecture and method for block write access cycles
permitting defective memory line replacement
    • 用于块写访问周期的冗余架构和方法允许有缺陷的存储器线更换
    • US5901093A
    • 1999-05-04
    • US464044
    • 1995-06-05
    • Nathan Rafael HiltebeitelRobert TamlynSteven William TomashotThomas Walter Wyckoff
    • Nathan Rafael HiltebeitelRobert TamlynSteven William TomashotThomas Walter Wyckoff
    • G11C11/401G11C29/00G11C29/04G11C7/00
    • G11C29/808G11C29/818
    • An invention is disclosed which implements bit line redundancy in a memory module, such as a dynamic random access memory (DRAM), in accordance with a block write operation. The block write operation is commonly used in dual port RAMs, sometimes referred to as video random access memories (VRAM). Specifically, a block write operation allows a plurality of bits of data to be written to a plurality of adjacent bit lines defined by a column address. The precise combination of adjacent bit lines selected by the column address is designated by an address mask. The invention provides a memory module with a redundant bit decoder that incorporates an address masking function into the redundant bit decoder during block write operations and also bypasses a masking function during normal read and write operations. This redundant bit decoder allows a single redundant bit line to replace any single defective bit line of the selected group of block write bit lines. It eliminates the need for replacing all the selected bit lines and, thereby, saves silicon area and maximizes the utilization of available redundant bit elements.
    • 公开了根据块写入操作在存储器模块(例如动态随机存取存储器(DRAM))中实现位线冗余的发明。 块写操作通常用于双端口RAM,有时称为视频随机存取存储器(VRAM)。 具体地,块写入操作允许将多个数据位写入由列地址定义的多个相邻位线。 由列地址选择的相邻位线的精确组合由地址掩码指定。 本发明提供了一种具有冗余位解码器的存储器模块,其在块写入操作期间将地址掩蔽功能合并到冗余位解码器中,并且在正常读取和写入操作期间绕过掩蔽功能。 该冗余位解码器允许单个冗余位线替代所选择的块写入位线组中的任何单个缺陷位线。 它不需要更换所有选定的位线,从而节省了硅面积并最大限度地利用了可用的冗余位元件。
    • 5. 发明授权
    • Non-delay based address transition detector (ATD)
    • 基于非延迟的地址转换检测器(ATD)
    • US5606269A
    • 1997-02-25
    • US548651
    • 1995-10-26
    • Dale E. PontiusRobert Tamlyn
    • Dale E. PontiusRobert Tamlyn
    • H03K5/1534H03K19/003
    • H03K5/1534
    • A circuit for detecting an input signal, the circuit having an input node and an output node, includes a first latch having a set input coupled to the input node, for detecting falling transitions at the input node. A second latch having a set input coupled to the input node, detects rising transitions at the input node. A first logic device, responsive to outputs of the first and second latches, detects that an input signal has been received at both the first and second latches. A second logic device, responsive to a complement output of both the first and second latches, resets both the first and second latches.
    • 用于检测输入信号的电路,具有输入节点和输出节点的电路包括具有耦合到输入节点的设置输入的第一锁存器,用于检测输入节点处的下降转换。 具有耦合到输入节点的设置输入的第二锁存器检测输入节点处的上升转变。 响应于第一和第二锁存器的输出的第一逻辑器件检测到在第一和第二锁存器都已经接收到输入信号。 响应于第一和第二锁存器的补码输出的第二逻辑器件复位第一和第二锁存器。
    • 6. 发明授权
    • Circuits and methods for providing refresh addresses and alternate refresh addresses to be refreshed
    • 用于提供刷新地址和备用刷新地址以刷新的电路和方法
    • US08630141B2
    • 2014-01-14
    • US13016657
    • 2011-01-28
    • Robert Tamlyn
    • Robert Tamlyn
    • G11C7/00
    • G11C11/406G11C8/18G11C11/408
    • Circuits and refresh address circuits for providing a refresh address, and methods for refreshing memory cells. One such method includes refreshing a first plurality of memory cells and interrupting the refreshing of the first plurality of memory cells. A second plurality of memory cells is refreshed, at least one of the second plurality of memory cells the same as one of the first plurality of memory cells. Refreshing of the first plurality of memory cells is resumed following the refreshing of the second plurality of memory cells. One such refresh address circuit includes a refresh address counter configured to provide addresses to be refreshed and a refresh address interrupt circuit configured to interrupt the provision of addresses. An alternate refresh address circuit is configured to provide an alternate address and the refresh address counter resumes providing the addresses responsive to completing the refreshing of the alternate address.
    • 用于提供刷新地址的电路和刷新地址电路,以及用于刷新存储器单元的方法。 一种这样的方法包括刷新第一多个存储单元并中断第一多个存储单元的刷新。 刷新第二多个存储器单元,第二多个存储器单元中的至少一个与第一多个存储器单元中的一个相同。 在第二多个存储单元的刷新之后,恢复第一多个存储单元的刷新。 一个这样的刷新地址电路包括被配置为提供要刷新的地址的刷新地址计数器和被配置为中断提供地址的刷新地址中断电路。 替代刷新地址电路被配置为提供备用地址,并且刷新地址计数器恢复提供响应于完成备用地址的刷新的地址。
    • 7. 发明申请
    • CIRCUITS AND METHODS FOR PROVIDING REFRESH ADDRESSES AND ALTERNATE REFRESH ADDRESSES TO BE REFRESHED
    • 提供刷新地址和替代修复地址的电路和方法要刷新
    • US20120195149A1
    • 2012-08-02
    • US13016657
    • 2011-01-28
    • Robert Tamlyn
    • Robert Tamlyn
    • G11C8/04G11C8/10G11C7/00G11C8/12
    • G11C11/406G11C8/18G11C11/408
    • Circuits and refresh address circuits for providing a refresh address, and methods for refreshing memory cells. An example method includes refreshing a first plurality of memory cells and interrupting the refreshing of the first plurality of memory cells. A second plurality of memory cells is refreshed, at least one of the second plurality of memory cells the same as one of the first plurality of memory cells. Refreshing of the first plurality of memory cells is resumed following the refreshing of the second plurality of memory cells. An example refresh address circuit includes a refresh address counter configured to provide addresses to be refreshed and a refresh address interrupt circuit configured to interrupt the provision of addresses. An alternate refresh address circuit is configured to provide an alternate address and the refresh address counter resumes providing the addresses responsive to completing the refreshing of the alternate address.
    • 用于提供刷新地址的电路和刷新地址电路,以及用于刷新存储器单元的方法。 示例性方法包括刷新第一多个存储器单元并中断第一多个存储器单元的刷新。 刷新第二多个存储器单元,第二多个存储器单元中的至少一个与第一多个存储器单元中的一个相同。 在第二多个存储单元的刷新之后,恢复第一多个存储单元的刷新。 示例性刷新地址电路包括被配置为提供要刷新的地址的刷新地址计数器和被配置为中断提供地址的刷新地址中断电路。 替代刷新地址电路被配置为提供备用地址,并且刷新地址计数器恢复提供响应于完成备用地址的刷新的地址。
    • 8. 发明申请
    • Reduced-Delay Clocked Logic
    • 减少延迟时钟逻辑
    • US20080238483A1
    • 2008-10-02
    • US11692245
    • 2007-03-28
    • Robert Tamlyn
    • Robert Tamlyn
    • H03K19/00
    • H03K3/03
    • Delay in a clocked logic circuit is reduced by partially determining a next state of the clocked logic circuit based on a current state of the clocked logic circuit during a first portion of a clock cycle. The partially determined next state of the clocked logic circuit is prevented from affecting the current state of the clocked logic circuit during the first portion of the clock cycle. The next state of the clocked logic circuit is completely determined based on a previous state of the clocked logic circuit and the partially determined next state of the clocked logic circuit during a second portion of the clock cycle.
    • 在时钟周期的第一部分期间,基于时钟逻辑电路的当前状态部分地确定时钟逻辑电路的下一个状态来减少时钟逻辑电路的延迟。 抑制时钟逻辑电路的部分确定的下一状态在时钟周期的第一部分期间不影响时钟逻辑电路的当前状态。 在时钟周期的第二部分期间,基于时钟逻辑电路的先前状态和时钟逻辑电路的部分确定的下一状态,完全确定时钟逻辑电路的下一状态。
    • 9. 发明授权
    • Compressed input/output test mode
    • 压缩输入/输出测试模式
    • US06009026A
    • 1999-12-28
    • US901509
    • 1997-07-28
    • Robert TamlynEdward Butler
    • Robert TamlynEdward Butler
    • G11C7/10G11C29/28G11C29/40G11C7/00
    • G11C29/28G11C29/40G11C7/10
    • The present invention discloses a system and method of testing semiconductor memory devices formed as integrated circuits on semiconductor substrates. The present invention allows parallel testing of arrays using only one input/output (I/O or DQ) to write to the arrays and only two DQs to read from the arrays. The broad search should be directed to methods of compressing the time and number of I/O's required for testing wide, high pin count, or highly partitioned memory arrays. The specific method of this invention comprises simultaneously writing the same test bit to each array, simultaneously reading a common address from each array and comparing the output of each array to report a fail if all outputs are not the same.
    • 本发明公开了一种在半导体衬底上形成为集成电路的半导体存储器件的测试系统和方法。 本发明允许使用仅一个输入/输出(I / O或DQ)对数组进行并行测试来写入阵列,并且只有两个DQ从阵列读取。 广泛的搜索应该针对压缩测试宽,高引脚数或高度分区的存储器阵列所需的I / O的时间和数量的方法。 本发明的具体方法包括同时将相同的测试位写入每个阵列,同时从每个阵列读取公共地址,并且如果所有输出不相同,则比较每个阵列的输出以报告失败。