专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20090108856A1 APPARATUS, SYSTEM, AND METHOD FOR DETECTING CRACKING WITHIN AN AFTERTREATMENT DEVICE 有权
标题翻译：用于在后处理装置中检测裂纹的装置，系统和方法
公开(公告)号：US20090108856A1
公开(公告)日：2009-04-30
申请号：US11688697
申请日：2007-03-20
申请人： Thomas M. Yonushonis , Randall J. Stafford , Edgar Lara-Curzio , Amit Shyam
发明人： Thomas M. Yonushonis , Randall J. Stafford , Edgar Lara-Curzio , Amit Shyam
IPC分类号： G01R27/08
CPC分类号： B01D46/0086 , B01D2273/18
摘要： An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.
摘要翻译：公开了用于检测颗粒过滤器中的裂纹的装置，系统和方法。该方法可以包括提供一种包括具有基板和基板表面的后处理装置的装置，形成结合到基板表面的导电路径的导电材料以及被配置为允许传导路径的电阻测量的接入点。该方法可以包括测量导电路径的电阻，并且基于电阻测量来确定衬底表面上是否发生了一个或多个裂纹。该方法可以进一步包括基于指定的裂纹量标记后处理装置的劣化水平，并且在服务事件之后，基于劣化水平，用等效的后处理装置替换后处理装置。

2. 发明授权

US07701231B2 Apparatus, system, and method for detecting cracking within an aftertreatment device 有权
标题翻译：用于检测后处理装置中的裂纹的装置，系统和方法
公开(公告)号：US07701231B2
公开(公告)日：2010-04-20
申请号：US11688697
申请日：2007-03-20
申请人： Thomas M. Yonushonis , Randall J. Stafford , Edgar Lara-Curzio , Amit Shyam
发明人： Thomas M. Yonushonis , Randall J. Stafford , Edgar Lara-Curzio , Amit Shyam
IPC分类号： G01R27/08 , G01R31/08
CPC分类号： B01D46/0086 , B01D2273/18
摘要： An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.
摘要翻译：公开了用于检测颗粒过滤器中的裂纹的装置，系统和方法。该方法可以包括提供一种包括具有基板和基板表面的后处理装置的装置，形成结合到基板表面的导电路径的导电材料以及被配置为允许传导路径的电阻测量的接入点。该方法可以包括测量导电路径的电阻，并且基于电阻测量来确定衬底表面上是否发生了一个或多个裂纹。该方法可以进一步包括基于指定的裂纹量标记后处理装置的劣化水平，并且在服务事件之后，基于劣化水平，用等效的后处理装置替换后处理装置。

3. 发明授权

US07572054B2 Apparatus, system, and method for determining a time-temperature history of an aftertreatment device 有权
标题翻译：用于确定后处理装置的时间 - 温度历史的装置，系统和方法
公开(公告)号：US07572054B2
公开(公告)日：2009-08-11
申请号：US11780332
申请日：2007-07-19
申请人： Thomas M. Yonushonis , Randall J. Stafford , Conrad J. Simon, III , Bryan E. Blackwell , Kevin Westerson
发明人： Thomas M. Yonushonis , Randall J. Stafford , Conrad J. Simon, III , Bryan E. Blackwell , Kevin Westerson
IPC分类号： F01N3/10
CPC分类号： G01K3/14 , F01N3/021 , F01N11/002 , F01N2550/00 , F01N2560/06 , F01N2560/12 , G01K1/022 , G01K2205/04 , Y02T10/20 , Y02T10/47
摘要： An apparatus, system, and method are disclosed for determining a time-temperature history of an aftertreatment device. The apparatus includes an aftertreatment device comprising a substrate, and at least one thermal monitoring member (TMM) in thermal contact with the substrate. The TMMs may comprise a material that exhibits an electrical resistivity change at temperature over time. The apparatus may include a controller configured to measure the electrical resistivity of at least a portion of the TMMs, and to determine a thermal history based on the electrical resistivity measures.
摘要翻译：公开了用于确定后处理装置的时间 - 温度历史的装置，系统和方法。该装置包括一个后处理装置，该处理装置包括一个基板和至少一个与该基板热接触的热监测构件（TMM）。 TMM可以包括在温度随时间呈现电阻率变化的材料。该装置可以包括被配置为测量至少一部分TMM的电阻率并且基于电阻率测量来确定热历史的控制器。

4. 发明申请

US20090097528A1 APPARATUS, SYSTEM, AND METHOD FOR DETECTING TEMPERATURE THRESHOLD EVENTS IN AN AFTERTREATMENT DEVICE 有权
标题翻译：用于检测后处理装置中的温度阈值事件的装置，系统和方法
公开(公告)号：US20090097528A1
公开(公告)日：2009-04-16
申请号：US11871037
申请日：2007-10-11
申请人： Conrad J. Simon, III , Randall J. Stafford
发明人： Conrad J. Simon, III , Randall J. Stafford
IPC分类号： G01K11/06 , G01K7/16
CPC分类号： F01N11/002 , F01N2560/12 , G01K11/06 , H01H37/006 , H01H37/761 , H01H2037/768 , Y02T10/47
摘要： An apparatus, system, and method are disclosed for detecting temperature threshold events in an aftertreatment device. The system may include an aftertreatment device configured to treat an exhaust gas of an internal combustion engine and a temperature responder disposed within a region of interest of the aftertreatment device. The temperature responder is configured to melt at a threshold temperature. The system may further include two access points electrically coupled to the temperature responder and an observation module configured to measure an electrical resistance value across the two access points. The observation module detects the melting of the temperature responder based on the electrical resistance value measured across the access points. In alternate embodiments the observation module is included within an engine control module (ECM) or a service tool.
摘要翻译：公开了用于检测后处理装置中的温度阈值事件的装置，系统和方法。该系统可以包括配置成处理内燃机的废气和设置在后处理装置的感兴趣区域内的温度响应器的后处理装置。温度响应器被配置为在阈值温度下熔化。该系统还可以包括电耦合到温度响应器的两个接入点和被配置成测量跨越两个接入点的电阻值的观测模块。观察模块基于在接入点上测量的电阻值来检测温度响应器的熔化。在替代实施例中，观察模块包括在发动机控制模块（ECM）或服务工具内。

5. 发明授权

US07815370B2 Apparatus, system, and method for detecting temperature threshold events in an aftertreatment device 有权
标题翻译：用于检测后处理装置中的温度阈值事件的装置，系统和方法
公开(公告)号：US07815370B2
公开(公告)日：2010-10-19
申请号：US11871037
申请日：2007-10-11
申请人： Conrad J. Simon, III , Randall J. Stafford
发明人： Conrad J. Simon, III , Randall J. Stafford
IPC分类号： G01K7/00 , G01K11/00 , G01K1/02
CPC分类号： F01N11/002 , F01N2560/12 , G01K11/06 , H01H37/006 , H01H37/761 , H01H2037/768 , Y02T10/47
摘要： An apparatus, system, and method are disclosed for detecting temperature threshold events in an aftertreatment device. The system may include an aftertreatment device configured to treat an exhaust gas of an internal combustion engine and a temperature responder disposed within a region of interest of the aftertreatment device. The temperature responder is configured to melt at a threshold temperature. The system may further include two access points electrically coupled to the temperature responder and an observation module configured to measure an electrical resistance value across the two access points. The observation module detects the melting of the temperature responder based on the electrical resistance value measured across the access points. In alternate embodiments the observation module is included within an engine control module (ECM) or a service tool.
摘要翻译：公开了用于检测后处理装置中的温度阈值事件的装置，系统和方法。该系统可以包括配置成处理内燃机的废气和设置在后处理装置的感兴趣区域内的温度响应器的后处理装置。温度响应器被配置为在阈值温度下熔化。该系统还可以包括电耦合到温度响应器的两个接入点和被配置成测量跨越两个接入点的电阻值的观测模块。观察模块基于在接入点上测量的电阻值来检测温度响应器的熔化。在替代实施例中，观察模块包括在发动机控制模块（ECM）或服务工具内。

6. 发明申请

US20090019833A1 APPARATUS, SYSTEM, AND METHOD FOR DETERMINING A TIME-TEMPERATURE HISTORY OF AN AFTERTREATMENT DEVICE 有权
标题翻译：用于确定后处理装置的时间温度历史的装置，系统和方法
公开(公告)号：US20090019833A1
公开(公告)日：2009-01-22
申请号：US11780332
申请日：2007-07-19
申请人： Thomas M. Yonushonis , Randall J. Stafford , Conrad J. Simon, III , Bryan E. Blackwell , Kevin Westerson
发明人： Thomas M. Yonushonis , Randall J. Stafford , Conrad J. Simon, III , Bryan E. Blackwell , Kevin Westerson
IPC分类号： F01N3/10 , G01K3/04 , G06F19/00
CPC分类号： G01K3/14 , F01N3/021 , F01N11/002 , F01N2550/00 , F01N2560/06 , F01N2560/12 , G01K1/022 , G01K2205/04 , Y02T10/20 , Y02T10/47
摘要： An apparatus, system, and method are disclosed for determining a time-temperature history of an aftertreatment device. The apparatus includes an aftertreatment device comprising a substrate, and at least one thermal monitoring member (TMM) in thermal contact with the substrate. The TMMs may comprise a material that exhibits an electrical resistivity change at temperature over time. The apparatus may include a controller configured to measure the electrical resistivity of at least a portion of the TMMs, and to determine a thermal history based on the electrical resistivity measures.
摘要翻译：公开了用于确定后处理装置的时间 - 温度历史的装置，系统和方法。该装置包括一个后处理装置，该处理装置包括一个基板和至少一个与该基板热接触的热监测构件（TMM）。 TMM可以包括在温度随时间呈现电阻率变化的材料。该装置可以包括被配置为测量至少一部分TMM的电阻率并且基于电阻率测量来确定热历史的控制器。

7. 发明授权

US07008177B2 Centrifugal pump with self cooling and flushing features 失效
标题翻译：离心泵具有自冷和冲洗功能
公开(公告)号：US07008177B2
公开(公告)日：2006-03-07
申请号：US10705207
申请日：2003-11-10
申请人： Timothy D. Britt , Randall J. Stafford , Donald W. Stanton
发明人： Timothy D. Britt , Randall J. Stafford , Donald W. Stanton
IPC分类号： F04D29/58
CPC分类号： F01D1/02 , F04D29/128
摘要： A fluid pump including provisions for cooling and/or flushing in the vicinity of a static seal. In one embodiment, the invention includes an open channel fluid passageway defined on a generally flat surface of a pump housing. A centrifugal rotor with a generally flat backplate rotates proximate a surface of the housing. The fluid passageways are adapted and configured to have a pathway that includes a directional component parallel to the direction of rotation, such that fluid drag from the rotating backplate induces flow within the passageway. The passages of the exit can be positioned such that flow exiting the passageway is at least partly tangential to the seal and/or the seal housing.
摘要翻译：流体泵包括在静态密封件附近进行冷却和/或冲洗的设备。在一个实施例中，本发明包括限定在泵壳体的大致平坦表面上的开放通道流体通道。具有大致平坦的背板的离心转子靠近壳体的表面旋转。流体通道适于和构造成具有包括平行于旋转方向的方向分量的路径，使得来自旋转背板的流体阻力在通道内引起流动。出口的通道可以被定位成使得离开通道的流至少部分地与密封件和/或密封壳体相切。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式