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    • 3. 发明申请
    • Frequency and phase correction in a phase-locked loop (PLL)
    • 锁相环(PLL)中的频率和相位校正
    • US20050117680A1
    • 2005-06-02
    • US10725763
    • 2003-12-02
    • Prasun RahaT. ViswanathanRichard Jennings
    • Prasun RahaT. ViswanathanRichard Jennings
    • H03L7/089H03L7/093H03L7/099H03L7/107H03D3/24
    • H03L7/107H03L7/0893H03L7/093H03L7/0995H03L7/1072
    • In one embodiment, a system for frequency and phase correction in a phase-locked loop (PLL) includes a phase frequency detector, first and second charge pumps respectively generating a first current and a voltage, a voltage-to-current (V2I) converter, a current summer, and a current-controlled oscillator (CCO). The phase frequency detector detects a frequency difference and a phase difference between a clock signal and a comparison signal, communicates the frequency difference to a first charge pump generating a first current, and communicates the phase difference to a second charge pump generating a voltage. The comparison signal is derived from an output signal of the PLL. The first charge pump modifies the first current according to the frequency difference and communicates the first current to the current summer. The second charge pump modifies the voltage according to the phase difference and communicates the voltage to the V2I converter. The V2I converter generates a second current corresponding to the voltage and communicates the second current to the current summer. The current summer combines the first and second currents with each other to generate a control current for the CCO and communicates the control current to the CCO. The CCO generates one or more oscillating signals according to the first and second currents. A frequency of an oscillating signal from the CCO changes in response to the modification of the first current, and a phase of the oscillating signal changes in response to the modification of the second current.
    • 在一个实施例中,用于锁相环(PLL)中的频率和相位校正的系统包括相位频率检测器,分别产生第一电流和电压的第一和第二电荷泵,电压 - 电流(V2I)转换器 ,当前夏天和电流控制振荡器(CCO)。 相位频率检测器检测时钟信号和比较信号之间的频率差和相位差,将频差传送到产生第一电流的第一电荷泵,并将相位差传送到产生电压的第二电荷泵。 比较信号从PLL的输出信号导出。 第一个电荷泵根据频差改变第一个电流,并将第一个电流传送到当前夏天。 第二个电荷泵根据相位差修改电压,并将电压传递给V2I转换器。 V2I转换器产生对应于电压的第二电流,并将第二电流传送到当前夏天。 当前的夏天将第一和第二电流彼此相结合,以产生CCO的控制电流,并将控制电流传递给CCO。 CCO根据第一和第二电流产生一个或多个振荡信号。 来自CCO的振荡信号的频率响应于第一电流的修改而改变,并且振荡信号的相位响应于第二电流的修改而改变。
    • 6. 发明申请
    • Versatile system for accelerated stress characterization of semiconductor device structures
    • 用于半导体器件结构加速应力表征的多功能系统
    • US20050280477A1
    • 2005-12-22
    • US10871932
    • 2004-06-18
    • Vijay ReddyPrasun Raha
    • Vijay ReddyPrasun Raha
    • G01R31/27G01R31/28H03K3/03
    • G01R31/2884G01R31/275G01R31/2856
    • The present invention provides a system (200) for performing accelerated stress characterization of a given transistor (204). Inverter circuits, formed from the given transistor, are disposed in series with one another (202). A plurality of signal taps is operatively associated with each gap between adjacent inverter circuits. Selective circuitry is operatively coupled to the plurality of signal taps, and adapted to output (206) data from a first and a second of the plurality of signal taps. A controlled voltage component (212) is operatively coupled the plurality of inverter circuits, and adapted to supply a desired supply voltage. A controlled signal component (210) is operatively coupled the plurality of inverter circuits, and adapted to supply a signal of a desired frequency thereto. An evaluation component (208) receives signal data from the first and second signal taps for evaluation or processing.
    • 本发明提供一种用于执行给定晶体管(204)的加速应力表征的系统(200)。 由给定晶体管形成的逆变器电路彼此串联设置(202)。 多个信号抽头可操作地与相邻逆变器电路之间的每个间隙相关联。 选择性电路可操作地耦合到多个信号抽头,并且适于从多个信号抽头中的第一和第二信号抽头输出(206)数据。 受控电压分量(212)可操作地耦合多个逆变器电路,并且适于提供期望的电源电压。 受控信号分量(210)可操作地耦合多个逆变器电路,并且适于向其提供期望频率的信号。 评估组件(208)从第一和第二信号抽头接收用于评估或处理的信号数据。
    • 7. 发明授权
    • Versatile system for accelerated stress characterization of semiconductor device structures
    • 用于半导体器件结构加速应力表征的多功能系统
    • US07026838B2
    • 2006-04-11
    • US10871932
    • 2004-06-18
    • Vijay Kumar ReddyPrasun Raha
    • Vijay Kumar ReddyPrasun Raha
    • G01R31/26
    • G01R31/2884G01R31/275G01R31/2856
    • The present invention provides a system (200) for performing accelerated stress characterization of a given transistor (204). Inverter circuits, formed from the given transistor, are disposed in series with one another (202). A plurality of signal taps is operatively associated with each gap between adjacent inverter circuits. Selective circuitry is operatively coupled to the plurality of signal taps, and adapted to output (206) data from a first and a second of the plurality of signal taps. A controlled voltage component (212) is operatively coupled the plurality of inverter circuits, and adapted to supply a desired supply voltage. A controlled signal component (210) is operatively coupled the plurality of inverter circuits, and adapted to supply a signal of a desired frequency thereto. An evaluation component (208) receives signal data from the first and second signal taps for evaluation or processing.
    • 本发明提供一种用于执行给定晶体管(204)的加速应力表征的系统(200)。 由给定晶体管形成的逆变器电路彼此串联设置(202)。 多个信号抽头可操作地与相邻逆变器电路之间的每个间隙相关联。 选择性电路可操作地耦合到多个信号抽头,并且适于从多个信号抽头中的第一和第二信号抽头输出(206)数据。 受控电压分量(212)可操作地耦合多个逆变器电路,并且适于提供期望的电源电压。 受控信号分量(210)可操作地耦合多个逆变器电路,并且适于向其提供期望频率的信号。 评估组件(208)从第一和第二信号抽头接收用于评估或处理的信号数据。