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1. 发明授权

US07185427B2 Method for making electrical connections to an element on printed circuit board 失效
标题翻译：用于与印刷电路板上的元件电连接的方法
公开(公告)号：US07185427B2
公开(公告)日：2007-03-06
申请号：US10424615
申请日：2003-04-28
申请人： Stephen Willard , Philip N King
发明人： Stephen Willard , Philip N King
IPC分类号： H01R9/00 , H05K3/00
CPC分类号： H05K1/0292 , H05K1/0268 , H05K1/111 , H05K2201/09381 , H05K2201/09663 , H05K2201/10287 , H05K2203/173 , H05K2203/175 , Y10T29/49126 , Y10T29/4913 , Y10T29/49147 , Y10T29/49162
摘要： The present invention is directed to a method for an electrically conductive structure on a printed circuit board for connecting an element on the printed circuit board with other elements. The electrically conductive structure may include a contact pad on a first side of the printed circuit board and two or more connection pads on the first side of the printed circuit board. The two or more connection pads are in close physical proximity to the contact pad and electrically connected to the contact pad. The element on the printed circuit board is directly connected to one the two or more connection pads electrically. The structure permits various engineering changes to the electrical connections of elements on the printed circuit board by desoldering electrical connections to the two or more connection pad, by severing traces to the connection pads, or by severing the electrical connection between the connection pads and the contact pad.
摘要翻译：本发明涉及一种用于将印刷电路板上的元件与其它元件连接的印刷电路板上的导电结构的方法。导电结构可以包括在印刷电路板的第一侧上的接触焊盘和印刷电路板的第一侧上的两个或更多个连接焊盘。两个或多个连接焊盘与接触焊盘紧密物理接近并电连接到接触焊盘。印刷电路板上的元件直接与两个或更多个连接焊盘电连接。该结构允许通过将连接到两个或更多个连接焊盘的电连接脱开焊接到连接焊盘的迹线，或通过切断连接焊盘和触点之间的电连接来对印刷电路板上元件的电连接进行各种工程改变垫。

2. 发明授权

US5107230A Switched drivers providing backmatch impedance for circuit test systems 失效
标题翻译：为电路测试系统提供反向阻抗的开关驱动器
公开(公告)号：US5107230A
公开(公告)日：1992-04-21
申请号：US692089
申请日：1991-04-26
申请人： Philip N. King
发明人： Philip N. King
IPC分类号： G01R31/319 , H03H11/28
CPC分类号： G01R31/31924 , G01R31/31905 , H03H11/28
摘要： A driver circuit (10) for selecting particular values of backmatch impedance (Z) for a functional or in-circuit test system. The test system (100) generates the backmatch impedance select signals (32A), the control signals (32B), and the drive data (32C). A decode circuit (200) receives the backmatch impedance select signal and the control signals from the test system for activating one or more of a plurality of individual drivers. Each of the plurality of drivers has a three state control input (202A), a data input (212), and an output (214). Each output of the drivers is connected to an impedance (Z). Hence, a plurality of impedances are provided which are commonly tied together and connected to the transmission line (70). The test system connects one or more of the drivers together. When one driver is selected, that particular value of backmatch impedance is connected to the transmission line. When more than one driver is connected, a resultant parallel impedance value is interconnected to the transmission line. Thus, precise value of backmatch impedance can be connected to the transmission line.
摘要翻译：一种驱动电路（10），用于为功能或在线测试系统选择反匹配阻抗（Z）的特定值。测试系统（100）产生回匹配阻抗选择信号（32A），控制信号（32B）和驱动数据（32C）。解码电路（200）接收来自用于激活多个单独驱动器中的一个或多个的测试系统的反向匹配阻抗选择信号和控制信号。多个驱动器中的每一个具有三状态控制输入（202A），数据输入（212）和输出（214）。驱动器的每个输出都连接到阻抗（Z）。因此，提供了多个阻抗，其通常被连接在一起并连接到传输线（70）。测试系统将一个或多个驱动程序连接在一起。当选择一个驱动器时，反向阻抗的特定值连接到传输线。当连接多于一个驱动器时，所得到的并联阻抗值互连到传输线。因此，反向阻抗的精确值可以连接到传输线。

3. 发明授权

US06894479B2 Connector cable and method for probing vacuum-sealable electronic nodes of an electrical testing device 失效
标题翻译：用于探测电气测试装置的真空密封电子节点的连接器电缆和方法
公开(公告)号：US06894479B2
公开(公告)日：2005-05-17
申请号：US10228026
申请日：2002-08-26
申请人： John E. Siefers , Philip N. King
发明人： John E. Siefers , Philip N. King
IPC分类号： G01R1/04 , G01R1/073 , G01R31/02
CPC分类号： G01R1/0416 , G01R1/07328
摘要： A novel thin wire connector cable and method for connecting an electrical test instrument to an electrical node of interest sealable within a vacuum chamber of an electrical testing device is presented. The thin wire connector cable includes a thin wire cable with a first end connectable to the test instrument and a second end comprising a connector electrically connectable to the electrical node of interest that lies within the vacuum-sealable chamber. The thin wire cable is routed from the vacuum-sealable chamber to the test instrument in between a flexible vacuum seal and an opening to the vacuum-sealable chamber such that when the vacuum is actuated, the thin wire cable is wedged between the seal and testing device. The thin wire cable is substantially thin enough so as to prevent more than a negligible amount of leakage between the thin wire cable and the flexible vacuum seal, which allows a vacuum to be generated and maintained.
摘要翻译：提出了一种新颖的细线连接器电缆和用于将电测试仪器连接到电气测试装置的真空室内可密封的感兴趣的电节点的方法。细线连接器电缆包括具有可连接到测试仪器的第一端的细线电缆，以及包括可连接到位于真空密封室内的感兴趣的电节点的连接器的第二端。细线电缆从可真空密封的腔室引导到测试仪器之间，在柔性真空密封件和真空密封腔室的开口之间，使得当真空被致动时，细线电缆楔入密封件和测试件之间设备。细线电缆基本上足够薄，以便防止细线电缆和柔性真空密封件之间的可忽略的泄漏量，这允许产生和保持真空。

4. 发明授权

US06825679B2 Electrically conductive structure and method for implementing circuit changes on printed circuit boards 失效
标题翻译：用于在印刷电路板上实现电路变化的导电结构和方法
公开(公告)号：US06825679B2
公开(公告)日：2004-11-30
申请号：US10199142
申请日：2002-07-19
申请人： Philip N King , Stephen Willard
发明人： Philip N King , Stephen Willard
IPC分类号： G01R3102
CPC分类号： H05K3/103 , H05K3/225 , H05K3/4685 , H05K2201/1028
摘要： An electrically conductive structure and method for making circuit changes on a printed circuit board involves the use of electrically conductive tape to connect two previously unconnected points on the board. One or more sections of the tape may be used to form a low-profile contiguous path between two previously unconnected points on the board.
摘要翻译：用于在印刷电路板上进行电路改变的导电结构和方法涉及使用导电带来连接板上的两个先前未连接的点。磁带的一个或多个部分可用于在电路板上的两个先前未连接的点之间形成一个低调的连续路径。

5. 发明授权

US5283518A Method for the control of ground bounce below an internal ground plane in a short-wire board test fixture 失效
标题翻译：用于在短线板测试夹具内控制内部地平面以下的地面反弹的方法
公开(公告)号：US5283518A
公开(公告)日：1994-02-01
申请号：US43621
申请日：1993-04-07
申请人： Philip N. King , T. Risselle Richert
发明人： Philip N. King , T. Risselle Richert
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/07314 , G01R1/07328
摘要： Algorithms are set forth for positioning critical test signal pins in a short-wire board test fixture so as to efficiently minimize ground bounce. The board test fixture interfaces a test system to a circuit board under test. Critical signals are those signals susceptible to ground bounce. The test signal pins connect a ground plane in the board test fixture to pin cards interfaced to the board test system. Each pin card has a first column of test signal pins and a set of first ground pins. Moreover, each pin card has a second column comprising a set of second ground pins. In order to minimize ground bounce, no more than fifteen second ground pins per pin card are inactive. No more than two consecutive second ground pins per pin card are inactive. Any critical test signals are assigned within three pins of an exclusive first ground pin. Finally, any ordinary test signals are assigned more than four pins from any critical test signals.
摘要翻译：提出了将关键测试信号引脚定位在短线板测试夹具中的算法，以便有效地最小化地面反弹。电路板测试夹具将测试系统连接到被测电路板。关键信号是易受地面反弹影响的信号。测试信号引脚将板测试夹具中的接地平面连接到与板测试系统连接的引脚卡。每个针卡都有一列测试信号引脚和一组第一个接地引脚。此外，每个针卡具有包括一组第二接地引脚的第二列。为了最大限度地减少接地反弹，每个插针卡不能超过十五秒。每个针卡不超过两个连续的第二个接地引脚是无效的。任何关键测试信号都分配在专用第一个接地引脚的三个引脚内。最后，任何普通测试信号都可以从任何关键测试信号中分配多于四个引脚。

6. 发明授权

US4998026A Driver circuit for in-circuit overdrive/functional tester 失效
标题翻译：用于在线过载/功能测试仪的驱动电路
公开(公告)号：US4998026A
公开(公告)日：1991-03-05
申请号：US340346
申请日：1989-04-19
申请人： Philip N. King
发明人： Philip N. King
IPC分类号： G01R31/28 , H03K17/66
CPC分类号： H03K17/667 , G01R31/2806
摘要： A driver circuit for use in a circuit board tester which tester can perform both functional and in-circuit tests on a given device under test (DUT). The tester provides a test signal representative of a command for the driver circuit to provide logic high or logic low signals to a given device under test (DUT). The driver includes an output stage for providing desired logic high and logic low signals in response to the test signal; and switch circuitry, connected between the tester and the output stage, for preventing the test signal from reaching the output stage in response to a second control signal. The driver circuit is also shown to include an amplifier which, during operation of the driver circuit, receives feedback from the output stage. In addition, the driver circuit includes another output stage which provides a feedback signal when the driver circuit is in tri-state (deactivated). The driver circuit provides a low output impedance when logic high and logic low signals are being provided and a high output impedance when the driver circuit is in tri-state.
摘要翻译：用于电路板测试仪的驱动器电路，测试仪可以在给定的被测器件（DUT）上执行功能和在线测试。测试仪提供代表驱动电路的命令的测试信号，以向给定的待测器件（DUT）提供逻辑高或逻辑低电平信号。驱动器包括用于响应于测试信号提供期望的逻辑高和逻辑低信号的输出级; 以及连接在测试器和输出级之间的开关电路，用于防止测试信号响应于第二控制信号到达输出级。驱动器电路还被示为包括放大器，其在驱动器电路的操作期间从输出级接收反馈。此外，驱动器电路包括另一个输出级，当驱动器电路处于三态（停用）时提供反馈信号。当提供逻辑高电平和逻辑低电平信号时，驱动电路提供低输出阻抗，当驱动电路处于三态时，驱动电路提供高输出阻抗。

7. 发明授权

US5389874A Method for control of ground bounce above an internal ground plane in a short-wire board test fixture 失效
标题翻译：用于控制短线板测试夹具内部地平面以上的地面反弹的方法
公开(公告)号：US5389874A
公开(公告)日：1995-02-14
申请号：US31092
申请日：1993-03-15
申请人： Philip N. King , Carroll E. Morris, Jr.
发明人： Philip N. King , Carroll E. Morris, Jr.
IPC分类号： G01R1/073 , G01R31/28
CPC分类号： G01R31/2851 , G01R1/07328 , G01R1/07378
摘要： An algorithm selects probe locations for both test signal probes and ground probes in a short-wire board test fixture. The board test fixture connects a test system to a circuit board under test. The algorithm minimizes ground bounce. The algorithm envisions first superimposing an imaginary grid of squares over the circuit board. Then, ground probe locations are derived so that no more than five test signal probes for each ground probe reside within each of the imaginary squares and so that each critical test signal probe is associated within a preselected distance of a ground probe. In the preferred embodiment, the imaginary square measure 1.4 inches on a side, and the preselected distance is approximately one inch.
摘要翻译：一种算法在短线板测试夹具中选择测试信号探头和接地探头的探头位置。电路板测试夹具将测试系统连接到被测电路板。该算法使地面反弹最小化。该算法设想首先在电路板上叠加虚构的正方形网格。然后，导出接地探针位置，使得每个接地探针不超过五个测试信号探针驻留在每个虚拟正方形内，并且使得每个临界测试信号探针与接地探针的预选距离相关联。在优选实施例中，一侧的假想平方度为1.4英寸，预选距离约为1英寸。

8. 发明授权

US5184029A Driver circuit for circuit tester 失效
标题翻译：电路测试仪驱动电路
公开(公告)号：US5184029A
公开(公告)日：1993-02-02
申请号：US776108
申请日：1991-10-15
申请人： Philip N. King
发明人： Philip N. King
IPC分类号： G01R31/319 , H03K17/66
CPC分类号： G01R31/31924 , H03K17/667
摘要： A driver circuit for use in a circuit board tester performs both functional and in-circuit tests on a given device under test (DUT). The tester provides a control signal representative of a command for the driver circuit to provide test signals to the DUT. The driver circuit incorporates two stages: a pre-driver stage and a driver stage. The pre-driver stage consists of an amplifier connected to fast switching transistors with the ability to move in and out of saturation rapidly. The amplifier receives control signals and the switching transistors provide actuation signals to the driver stage. The driver stage comprises two emitter follower transistors that operate exclusively in an unsaturated state. The driver stage provides test signals to the DUT in response to the actuation signals from the two switching transistors of the pre-driver stage. Additionally, the driver circuit may be programmed to change the output voltage amplitudes of the test signals.
摘要翻译：用于电路板测试仪的驱动电路对被测设备（DUT）进行功能和在线测试。测试仪提供一个控制信号，代表一个命令，供驱动电路向DUT提供测试信号。驱动电路包括两个阶段：前驱动器阶段和驱动阶段。预驱动器级由连接到快速开关晶体管的放大器组成，具有快速移入和移出饱和度的能力。放大器接收控制信号，开关晶体管向驱动级提供致动信号。驱动器级包括仅在不饱和状态下工作的两个射极跟随器晶体管。响应于来自前驱动器级的两个开关晶体管的致动信号，驱动器级向DUT提供测试信号。此外，驱动器电路可以被编程以改变测试信号的输出电压幅度。

9. 发明授权

US06169395A Test for determining polarity of electrolytic capacitors within electronic assemblies 失效
标题翻译：测试电子组件中电解电容器的极性
公开(公告)号：US06169395A
公开(公告)日：2001-01-02
申请号：US08903321
申请日：1997-07-16
申请人： Philip N. King
发明人： Philip N. King
IPC分类号： G01R2908
CPC分类号： G01R31/312 , G01R31/016 , G01R31/046 , G01R31/2813
摘要： A method of determining whether an electrolytic capacitor is properly connected or reversed in an electronic assembly. In a first embodiment, a non-contacting probe is placed near but not touching the body of the device under test (DUT). One terminal of the DUT is driven by a stimulus (voltage source or current source) while the other terminal is connected to a reference voltage. A voltage is measured at the probe relative to the reference voltage and the device is properly oriented if the measured voltage exceeds a predetermined threshold. In a second embodiment, current through the probe is measured instead of voltage at the probe. In a third embodiment, a non-contacting probe is placed near but not touching both leads of the DUT. Each DUT lead is alternately driven by a stimulus and alternately connected to a reference voltage. For each of the two lead test configurations, a voltage at each DUT lead is measured and current through the non-contacting probe is measured. Two algebraic electromagnetic coupling coefficients are computed from the four voltage measurements and the two current measurements. The relative size of the electromagnetic coupling coefficients determines the measured polarity of the DUT. An alternative configuration for any of the embodiments is to drive the probe instead of a terminal of the DUT.
摘要翻译：一种在电子组件中确定电解电容器是否正确连接或反向的方法。在第一实施例中，非接触式探针被放置在接近但不接触被测器件（DUT）的主体的位置。 DUT的一个端子由刺激（电压源或电流源）驱动，而另一个端子连接到参考电压。在探针处相对于参考电压测量电压，并且如果测量的电压超过预定阈值，则器件被正确定向。在第二实施例中，测量通过探针的电流而不是探针处的电压。在第三实施例中，非接触探针放置在DUT的两个引线附近但不接触。每个DUT引线交替地被激励驱动并交替地连接到参考电压。对于两个引线测试配置中的每一个，测量每个DUT引线处的电压，并测量通过非接触式探头的电流。从四个电压测量和两个电流测量计算两个代数电磁耦合系数。电磁耦合系数的相对大小决定了DUT的测量极性。任何实施例的替代配置是驱动探针而不是DUT的终端。

10. 发明授权

US4947113A Driver circuit for providing pulses having clean edges 失效
标题翻译：用于提供干净边缘的脉冲的驱动电路
公开(公告)号：US4947113A
公开(公告)日：1990-08-07
申请号：US332243
申请日：1989-03-31
申请人： Wayne R. Chism , Philip N. King
发明人： Wayne R. Chism , Philip N. King
IPC分类号： G01R31/3183 , G01R31/319 , H03K5/12
CPC分类号： G01R31/31924 , H03K5/12
摘要： A method and apparatus for providing pulse signals from a driver circuit in an in-circuit overdrive/functional tester to a probe, which tester provides a control signal representative of a command for the driver circuit to provide logic signals, includes adjusting the transition time of the logic signals so that the transition time is equal to twice the time it takes the pulse signal to travel from the driver circuit to the end of the probe and back. The method or apparatus for adjusting the rise time of the control signal can include adjusting the slew rate of the control signal. Pulse signals produced by such a method or apparatus have clean edges, have slew rates which are twice as fast as the slew rates of the driver signals and have zero propagation delay when measured at the fifty percent point.

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