会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 9. 发明授权
    • Multi-layer circuit having a via matrix interlayer connection
    • 具有通孔矩阵层间连接的多层电路
    • US5753976A
    • 1998-05-19
    • US663626
    • 1996-06-14
    • Paul Marlan Harvey
    • Paul Marlan Harvey
    • H01L23/12H05K1/11H05K3/40H05K3/42H05K3/46H05K1/00
    • H05K1/115H05K3/42H05K2201/09781H05K2201/0979
    • An interlayer connection for electrically connecting first and second conductive elements and reducing interlayer registration requirements is disclosed. The interlayer connection includes a first layer including a first electrically conductive element, a second layer including a second electrically conductive element, and a third layer disposed between the first layer and the second layer. The third layer includes an electrically insulative portion having a matrix of immediately adjacent vias therethrough. A selected plurality of immediately adjacent vias within the matrix are disposed between the first and the second electrically conductive elements and contain electrically conductive material forming a conductive path between the first and the second electrically conductive elements.
    • 公开了用于电连接第一和第二导电元件并减少层间配准要求的层间连接。 层间连接包括包括第一导电元件的第一层,包括第二导电元件的第二层和设置在第一层和第二层之间的第三层。 第三层包括具有通过其直接相邻的通孔的矩阵的电绝缘部分。 矩阵内的所选择的多个紧邻的通孔设置在第一和第二导电元件之间,并且包含在第一和第二导电元件之间形成导电路径的导电材料。
    • 10. 发明授权
    • Impedane measurement of chip, package, and board power supply system using pseudo impulse response
    • 使用伪冲击响应的芯片,封装和板电源系统的Impedane测量
    • US07203608B1
    • 2007-04-10
    • US11424613
    • 2006-06-16
    • Makoto AikawaSang Hoo DhongBrian FlachsPaul Marlan HarveyBrad William MichaelYaping Zhou
    • Makoto AikawaSang Hoo DhongBrian FlachsPaul Marlan HarveyBrad William MichaelYaping Zhou
    • G01R27/28
    • G01R27/16G01R27/205G01R31/3008
    • A method for measuring impedance of a microprocessor chip, electronic packaging, and circuit board power supply system by generating a pseudo-impulse current having a width size in the time domain not larger than the inversion of a maximum frequency of interest and obtaining a voltage measurement in a frequency domain of the pseudo-impulse current. The mechanism of the present invention then predicts the normalized Fourier transformation of the current in the frequency domain, wherein the normalized Fourier transformation depends upon a switching charge of the pseudo-impulse current, measures the switching charge of the pseudo-impulse current, obtains a first current measurement at zero frequency using the measured switching charge, and obtains a second current measurement at a frequency of interest using the first current measurement. The mechanism of the present invention then calculates the impedance of the chip/package/board power supply system using the voltage measurement and the second current measurement.
    • 一种用于测量微处理器芯片,电子封装和电路板电源系统的阻抗的方法,其通过产生具有不大于感兴趣的最大频率的反转的时域中的宽度尺寸的伪脉冲电流并获得电压测量 在伪脉冲电流的频域中。 然后,本发明的机构预测频域中的电流的归一化傅里叶变换,其中归一化傅里叶变换取决于伪脉冲电流的切换电荷,测量伪脉冲电流的开关电荷,获得 使用测量的开关电荷在零频率下的第一电流测量,并且使用第一电流测量获得感兴趣频率的第二电流测量。 然后,本发明的机构使用电压测量和第二电流测量来计算芯片/封装/板电源系统的阻抗。