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    • 2. 发明授权
    • Apparatus and a method to configure a programmable device
    • 用于配置可编程设备的装置和方法
    • US08327154B1
    • 2012-12-04
    • US13097918
    • 2011-04-29
    • Dirk A. ReesePaul B. Ekas
    • Dirk A. ReesePaul B. Ekas
    • G06F11/30H03K19/177
    • G06F21/572G06F21/76G06F2221/0704G06F2221/0706H03K19/17768
    • A method to configure a programmable device is disclosed. The method includes receiving a scrambled configuration data at the programmable device. A bit sequence of a device tag that is stored in the programmable device is verified by determining whether the bit sequence of the device tag stored in the programmable device matches a bit sequence of a device tag within the scrambled configuration data. If the bit sequences match, the scrambled configuration data is transferred to a data re-formatter for descrambling. The descrambled configuration data is then transferred to a configuration memory of the programmable device. Circuitry that enables the method is also disclosed.
    • 公开了一种配置可编程设备的方法。 该方法包括在可编程设备处接收加扰的配置数据。 存储在可编程设备中的设备标签的位序列通过确定存储在可编程设备中的设备标签的位序列是否与加扰配置数据内的设备标签的位序列匹配来验证。 如果比特序列匹配,则将加扰的配置数据传送到数据重新格式化器以进行解扰。 然后将解扰的配置数据传送到可编程设备的配置存储器。 还公开了实现该方法的电路。
    • 4. 发明申请
    • ERROR DETECTION AND CORRECTION CIRCUITRY
    • 错误检测和校正电路
    • US20120221919A1
    • 2012-08-30
    • US13035826
    • 2011-02-25
    • Paul B. EkasDavid Lewis
    • Paul B. EkasDavid Lewis
    • H03M13/29G06F11/10
    • G06F11/1076G06F11/10G06F11/1048G11C11/412G11C29/52G11C2029/0411H03K19/17768
    • Integrated circuits with memory circuitry may include error detection circuitry and error correction circuitry. The error detection circuitry may be used to detect soft errors in the memory circuitry. The error detection circuitry may include logic gates that are used to perform parity checking. The error detection circuitry may have an interleaved structure to provide interleaved data bit processing, may have a tree structure to reduce logic gate delays, and may be pipelined to optimize performance. The memory circuitry may be loaded with interleaved parity check bits in conjunction with the interleaved structure to provide multi-bit error detection capability. The parity check bits may be precomputed using design tools or computed during device configuration. In response to detection of a memory error, the error correction circuitry may be used to scan desired portions of the memory circuitry and to correct the memory error.
    • 具有存储器电路的集成电路可以包括错误检测电路和纠错电路。 误差检测电路可用于检测存储器电路中的软错误。 错误检测电路可以包括用于执行奇偶校验的逻辑门。 错误检测电路可以具有交织结构以提供交错数据位处理,可以具有减少逻辑门延迟的树结构,并且可以被流水线化以优化性能。 存储器电路可以与交错结构一起加载交错奇偶校验位以提供多位错误检测能力。 奇偶校验位可以使用设计工具预先计算或在设备配置期间计算。 响应于存储器错误的检测,错误校正电路可用于扫描存储器电路的期望部分并校正存储器错误。
    • 5. 发明授权
    • Error detection and correction circuitry
    • 错误检测和校正电路
    • US08984367B2
    • 2015-03-17
    • US13035826
    • 2011-02-25
    • Paul B. EkasDavid Lewis
    • Paul B. EkasDavid Lewis
    • G11C29/00G11C29/52G06F11/10H03K19/177G11C11/412G11C29/04
    • G06F11/1076G06F11/10G06F11/1048G11C11/412G11C29/52G11C2029/0411H03K19/17768
    • Integrated circuits with memory circuitry may include error detection circuitry and error correction circuitry. The error detection circuitry may be used to detect soft errors in the memory circuitry. The error detection circuitry may include logic gates that are used to perform parity checking. The error detection circuitry may have an interleaved structure to provide interleaved data bit processing, may have a tree structure to reduce logic gate delays, and may be pipelined to optimize performance. The memory circuitry may be loaded with interleaved parity check bits in conjunction with the interleaved structure to provide multi-bit error detection capability. The parity check bits may be precomputed using design tools or computed during device configuration. In response to detection of a memory error, the error correction circuitry may be used to scan desired portions of the memory circuitry and to correct the memory error.
    • 具有存储器电路的集成电路可以包括错误检测电路和纠错电路。 误差检测电路可用于检测存储器电路中的软错误。 错误检测电路可以包括用于执行奇偶校验的逻辑门。 错误检测电路可以具有交织结构以提供交错数据位处理,可以具有减少逻辑门延迟的树结构,并且可以被流水线化以优化性能。 存储器电路可以与交错结构一起加载交错奇偶校验位以提供多位错误检测能力。 奇偶校验位可以使用设计工具预先计算或在设备配置期间计算。 响应于存储器错误的检测,错误校正电路可用于扫描存储器电路的期望部分并校正存储器错误。