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    • 2. 发明授权
    • Multi-level memory circuit with regulated writing voltage
    • 具有稳压写电压的多电平存储电路
    • US6097628A
    • 2000-08-01
    • US202656
    • 1999-06-07
    • Paolo Rolandi
    • Paolo Rolandi
    • G11C16/02G11C11/56G11C11/34
    • G11C11/5621G11C11/5628G11C16/30G11C5/145
    • A multi-level memory circuit for binary information includes a plurality of memory cells each adapted to store more than one item of binary information, and each memory cell includes at least one floating gate MOS transistor. The information stored therein corresponds to the level of the cell threshold voltage. A write signal generating circuit is adapted to an input supply voltage and provides a write voltage to the memory cells. The write signal generating circuit generates internally at least one write voltage having a selectable or selected value from a number of discrete regulated values corresponding to the number of the discrete levels provided.
    • PCT No.PCT / IT96 / 00199 Sec。 371日期1999年6月7日 102(e)1999年6月7日PCT PCT 1996年10月30日PCT公布。 第WO97 / 49088号公报 日期1997年12月24日用于二进制信息的多级存储器电路包括多个存储单元,每个存储单元适于存储多于一个二进制信息项,并且每个存储单元包括至少一个浮置栅极MOS晶体管。 存储在其中的信息对应于单元阈值电压的电平。 写入信号发生电路适于输入电源电压并向存储器单元提供写入电压。 写入信号发生电路在内部产生至少一个写入电压,该写入电压具有与所提供的离散电平的数量相对应的多个离散调节值的可选择或选择的值。
    • 4. 发明授权
    • Row decoder circuit and related system and method
    • 行解码电路及相关系统及方法
    • US07525851B2
    • 2009-04-28
    • US11434564
    • 2006-05-15
    • Luigi PascucciPaolo Rolandi
    • Luigi PascucciPaolo Rolandi
    • G11C5/14
    • G11C8/10G11C16/08
    • A row decoder circuit is described of the type comprising at least one input stage connected to a first supply voltage reference and to an output stage connected to a second supply voltage reference, the output stage having at least one output terminal connected to a word line of a memory matrix. The row decoder circuit further comprises a biasing device, connected to a third supply voltage reference and comprising at least one generator of a negative voltage connected to a divider, in turn connected to a first biasing terminal of the biasing device. In particular, the first biasing terminal is connected to at least one input stage in correspondence with bulk terminals of MOS transistors comprised in the input stage and it is suitable for supplying it with a first negative voltage.
    • 描述了包括连接到第一电源电压基准的至少一个输入级和连接到第二电源电压基准的输出级的类型的行解码器电路,所述输出级具有至少一个输出端子连接到字线 一个记忆矩阵 行解码器电路还包括偏置装置,其连接到第三电源参考电压并且包括连接到分压器的负电压的至少一个发生器,该发电机又连接到偏置装置的第一偏置端子。 特别地,第一偏置端子与至少一个输入级连接,对应于包含在输入级中的MOS晶体管的体积端子,并且适合于向第一偏置端子提供第一负电压。
    • 6. 发明授权
    • Method and system for refreshing a memory device during reading thereof
    • 读取时刷新存储器件的方法和系统
    • US07417900B2
    • 2008-08-26
    • US11695552
    • 2007-04-02
    • Paolo RolandiLuigi Pascucci
    • Paolo RolandiLuigi Pascucci
    • G11C16/06
    • G11C16/3431G11C11/5628G11C16/3418
    • A refresh circuit for refreshing a memory device is proposed. The refresh circuit includes: reading means for reading a set of memory cells, the reading means including means for applying a biasing voltage having a substantially monotone time pattern to the memory cells and to a set of reference cells each one having a reference threshold voltage, means for detecting the reaching of a comparison current by a cell current of each memory cell and by a reference current of each reference cell, and means for determining a condition of each memory cell according to a temporal relation of the reaching of the comparison current by the corresponding cell current and the reference currents, and writing means for applying a writing voltage to at least one selected of the memory cells; the refresh circuit further includes control means for enabling the writing means during at least part of the application of the biasing voltage after the determination of the condition of each selected memory cell.
    • 提出了刷新存储器件的刷新电路。 刷新电路包括:用于读取一组存储单元的读取装置,所述读取装置包括用于向存储单元施加具有基本上单调的时间模式的偏置电压的装置和具有参考阈值电压的一组参考单元, 用于通过每个存储单元的单元电流和每个参考单元的参考电流来检测比较电流达到的装置,以及用于根据达到比较电流的时间关系确定每个存储单元的状态的装置 对应的单元电流和参考电流;以及写入装置,用于向至少一个选择的存储单元施加写入电压; 刷新电路还包括控制装置,用于在确定每个所选择的存储单元的状态之后,在施加偏置电压的至少一部分期间使写入装置能够使能。
    • 9. 发明申请
    • INTEGRATED ELECTRONIC NON VOLATILE MEMORY DEVICE HAVING NAND STRUCTURE
    • 具有NAND结构的集成电子非易失性存储器件
    • US20060227610A1
    • 2006-10-12
    • US11279384
    • 2006-04-11
    • Luigi PascucciPaolo Rolandi
    • Luigi PascucciPaolo Rolandi
    • G11C16/04
    • G11C16/08G11C16/0408G11C16/0483G11C16/12G11C16/24Y10T29/49002
    • A non-volatile memory electronic device is integrated on a semiconductor and is of the Flash EEPROM type with an architecture of the NAND type including at least one memory matrix divided into sectors being singularly erasable and organized in rows or word lines and columns or bit lines of memory cells. Advantageously, the matrix may include logic sectors wherein pairs of rows or word lines are electrically short-circuited and refer to a single biasing terminal, source terminals of the associated cells of each pair of rows associated with a same source select line referring to a corresponding biasing terminal, and at least one pair of independent drain select lines, each of the rows and of the lines being provided with metallization shunts to by-pass groups of bit lines and/or to speed up the propagation times of the biasing in the corresponding logic sector.
    • 非易失性存储器电子器件集成在半导体上,并且是具有NAND型结构的闪存EEPROM类型,包括被划分成扇区的至少一个存储器矩阵,其被单独地擦除并且被组织成行或字线和列或位线 的记忆细胞。 有利地,矩阵可以包括其中行或字线对被电短路并且指代单个偏置端子的逻辑扇区,每对行的相关联的单元的源极端子与相应的源选择线相关联,其指向相应的 偏置端子以及至少一对独立的漏极选择线,行和行中的每一行被设置有金属化分流器以逐行排列组和/或加速相应的偏置的传播时间 逻辑部门。