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    • 1. 发明专利
    • Temperature distribution simulation device and method
    • 温度分布模拟装置及方法
    • JP2007080177A
    • 2007-03-29
    • JP2005270288
    • 2005-09-16
    • Daiwa Can Co LtdOsamu HashimotoShinya Watanabe大和製罐株式会社橋本 修慎也 渡邊
    • HASHIMOTO OSAMUWATANABE SHINYATAKATOMI TETSUYAIJUIN TAICHINAKAMURA KOJI
    • G06F17/50
    • PROBLEM TO BE SOLVED: To simulate a radio wave absorber and the temperature distribution of its periphery by taking into consideration heat radiation. SOLUTION: An FDTD method processing part 13 calculates the absorption electric power distribution per unit volume in a steady state of an electromagnetic field by using an FDTD method. Next, an MR method processing part 14 determines a self-absorption rate αs of the heat radiation and a rate (a READ value) Rd of absorbing from the other wall surface element by using a Monte Carlo read method. A SIMPLE method processing part 15 also determines an analytical value of a speed field and a pressure field by continuously solving an equation of continuity and an equation of motion by using a SIMPLE method. Radiation energy and absorption energy in the respective wall surface elements are finally calculated by using the αs and the Rd determined by a Monte Carlo read method. These energy quantity is substituted in an equation of energy together with absorption electric power provided by the FDTD method, and an analytical value of a temperature field is determined. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:通过考虑热辐射来模拟无线电波吸收体及其周边的温度分布。 解决方案:FDTD方法处理部分13通过使用FDTD方法计算电磁场的稳定状态下的每单位体积的吸收功率分布。 接下来,MR方法处理部分14通过使用蒙特卡罗读取方法确定热辐射的自吸收率αs和从另一壁表面元件吸收的速率(READ值)Rd。 SIMPLE方法处理部分15还通过使用SIMPLE方法连续求解连续性方程和运动方程式来确定速度场和压力场的分析值。 最终通过使用通过蒙特卡洛读取方法确定的αs和Rd来计算相应壁表面元件中的辐射能和吸收能。 这些能量在能量方程式中与FDTD方法提供的吸收电力代替,并且确定温度场的分析值。 版权所有(C)2007,JPO&INPIT
    • 2. 发明专利
    • Method and apparatus for simulating electromagnetic wave shielding effect
    • 用于模拟电磁波屏蔽效应的方法和装置
    • JP2005093429A
    • 2005-04-07
    • JP2004258774
    • 2004-09-06
    • Osamu HashimotoSharp Corpシャープ株式会社橋本 修
    • MAKITA MINORUHASHIMOTO OSAMU
    • H05B6/76F24C7/02
    • PROBLEM TO BE SOLVED: To provide a radio frequency heating apparatus with a door made thinner and a method for simulating a shielding effect against electromagnetic wave leakage of the apparatus.
      SOLUTION: There are provided a simulation method to determine electromagnetic wave leakage from a space between a main body and a door of a microwave oven by numerical calculation with a computer, and a technique of modeling a choke groove. Models of the choke groove are formulated with various sizes using the analysis method, and the shielding effects are analyzed. As a result, there has been found a structure that exhibits a shielding effect equivalent to that of a conventional structure while the depth of the groove is reduced by about one half (11 mm). Six combinations of the resultant sizes (L1 and L2) are provided, for example, (12.0, 7.0), (12.5, 6.5), (13.0, 5.5), (13.5, 4.5), (14.0, 3.0), and (14.5, 2.0), which are adopted as design values.
      COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:提供一种具有较薄门的射频加热装置和用于模拟防止装置的电磁波泄漏的屏蔽效果的方法。 解决方案:提供了一种利用计算机通过数值计算确定微波炉主体和门之间的空间的电磁波泄漏的模拟方法以及对扼流槽进行建模的技术。 采用分析方法对各种尺寸的扼流槽型号进行了分析,并对屏蔽效果进行了分析。 结果,已经发现了具有与常规结构相当的屏蔽效果的结构,同时凹槽的深度减小了约一半(11mm)。 提供所得尺寸(L1和L2)的六种组合,例如(12.0,7.0),(12.5,6.5),(13.0,5.5),(13.5,4.5),(14.0,3.0)和(14.5 ,2.0),被用作设计值。 版权所有(C)2005,JPO&NCIPI
    • 5. 发明专利
    • Method for inspecting sealing portion of container using terahertz wave
    • 使用TERAHERTZ波检查集装箱密封部分的方法
    • JP2010204035A
    • 2010-09-16
    • JP2009052380
    • 2009-03-05
    • Daiwa Can Co LtdOsamu Hashimoto大和製罐株式会社橋本 修
    • HASHIMOTO OSAMUIJUIN TAICHITAKATOMI TETSUYAYAMAUCHI TOMIO
    • G01N21/892G01N21/35G01N21/3563G01N21/3581
    • G01N21/3581
    • PROBLEM TO BE SOLVED: To enable the reliable inspection of the presence of impurities from transmittance of a terahertz wave by irradiating to a sealed portion of a container with a terahertz wave with a suitable frequency and transmitting with respect to an inspecting method for inspecting whether impurities is engaged in the sealed portion of the container. SOLUTION: The method for inspecting a sealing portion includes the steps of selectively using a terahertz wave in the range of a frequency from 0.8 to 3.0 THz when a sealed portion of a container is made of an olefin resin, when a terahertz wave is irradiated to a sealed portion of a container to transmit through it and inspect the presence of impurities from the transmittance of a terahertz wave, selectively using a terahertz wave in the range of a frequency of 1.3 THz when a sealed portion of a container is made of a polyester resin, and determining that impurities is engaged in the sealed portion when the transmittance of the terahertz wave is reduced. COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:为了通过以适合的频率照射具有太赫兹波的容器的密封部分,能够对太赫兹波的透射率存在杂质的可靠性进行检查,并且相对于检查方法 检查杂质是否与容器的密封部分接合。 解决方案:用于检查密封部分的方法包括以下步骤:当容器的密封部分由烯烃树脂制成时,在频率为0.8至3.0THz的范围内选择性地使用太赫兹波,当太赫兹波 照射到容器的密封部分以透过它,并且当制造容器的密封部分时,选择性地使用频率在1.3THz范围内的太赫兹波,从太赫兹波的透射率检查杂质的存在 的聚酯树脂,并且当太赫兹波的透射率降低时,确定杂质接合在密封部分中。 版权所有(C)2010,JPO&INPIT
    • 6. 发明专利
    • Electromagnetic field distribution simulation device and method
    • 电磁场分布仿真器件及方法
    • JP2007078634A
    • 2007-03-29
    • JP2005270287
    • 2005-09-16
    • Daiwa Can Co LtdOsamu HashimotoShinya Watanabe大和製罐株式会社橋本 修慎也 渡邊
    • HASHIMOTO OSAMUWATANABE SHINYATAKATOMI TETSUYAIJUIN TAICHINAKAMURA KOJI
    • G01R29/08G06F17/11G06F19/00
    • PROBLEM TO BE SOLVED: To simulate electromagnetic field distribution in an environment accompanied by lost dielectric or lost magnetic substance at high accuracy and low calculation cost. SOLUTION: A parameter such as a boundary condition is input by an input section 11. An electromagnetic field equation is divided into an advective term and a non-advective term and is processed by applying a segregation-by-time method. A CIP method and characteristic curve method are applied to the advective term of the electromagnetic field equation and numerical solution of the mean value of time variation is obtained by an advective term processing section 13. A non-advective term processing section 14 substitutes the numerical solution of the advective term processing section 13 for a discrete equation of a secondary central difference method, and obtains numerical solution advanced by one time step. The time step is repeated until it becomes a desired time. When it becomes the desired time, a numerical analysis result is displayed or printed using an output section 15. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:在高精度和低计算成本的情况下模拟伴有电介质或磁性物质损失的环境中的电磁场分布。 解决方案:诸如边界条件的参数由输入部分11输入。电磁场方程被分为平流项和非平流项,并且通过应用隔离方法进行处理。 电磁场方程的平流项应用CIP方法和特征曲线法,平流项处理部分13获得时间变化平均值的数值解。非平流项处理部分14代替数值解 对于二次中心差分方法的离散方程的平流项处理部分13,并获得一次提前的数值解。 重复时间步骤,直到它变成期望的时间。 当成为期望的时间时,使用输出部分15显示或打印数字分析结果。版权所有:(C)2007,JPO&INPIT
    • 7. 发明专利
    • Electromagnetic wave absorber and manufacturing method of the electromagnetic wave absorber
    • 电磁波吸收器的电磁波吸收器和制造方法
    • JP2008218790A
    • 2008-09-18
    • JP2007055518
    • 2007-03-06
    • Osamu HashimotoKumagai Gumi Co Ltd株式会社熊谷組橋本 修
    • HASHIMOTO OSAMUSUZUKI HIROKAZU
    • H05K9/00
    • PROBLEM TO BE SOLVED: To provide an electromagnetic wave absorber in which a resistance sheet is provided between one face and one face which face each other in two spacers, thereby absorbing electromagnetic waves of two frequency bands, and a variation of a frequency absorbing characteristic is small.
      SOLUTION: The electromagnetic wave absorber comprises a resistance part 4 between one face and one face which face each other in two spacers 2, 3 having a flat plate shape, and further comprises a reflection part 5 on the other face of the one spacer 3. The resistance part 4 is formed by overlapping two resistance sheets 8, 8 of a face resistance value 380±60 Ω square.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:提供一种电磁波吸收体,其中在两个间隔物之间​​在彼此面对的一个面和一个面之间设置有电阻片,从而吸收两个频带的电磁波,并且频率的变化 吸收特性小。 解决方案:电磁波吸收体包括在具有平板形状的两个间隔物2,3中彼此面对的一个面和一个面之间的电阻部分4,并且还包括在该一个的另一个面上的反射部分5 电阻部分4通过将面电阻值为380±60Ω正方形的两个电阻片8,8重叠而形成。 版权所有(C)2008,JPO&INPIT
    • 10. 发明授权
    • Burn-in apparatus having average voltage calculating circuit
    • 具有平均电压计算电路的老化装置
    • US06703854B2
    • 2004-03-09
    • US10225306
    • 2002-08-22
    • Osamu Hashimoto
    • Osamu Hashimoto
    • G01R3102
    • G01R31/2849G01R19/003
    • A function test circuit inside a burn-in apparatus is mounted on a burn-in board and specifies a plurality of checked devices which operate normally. An average voltage calculating circuit calculates average voltage for test voltage applied to a plurality of checked devices specified on a mounting section. A voltage correction circuit receives the average voltage and outputs a control signal to control set voltage output from a device power supply generation circuit. Therefore, this burn-in apparatus can set the test voltage applied to the checked devices readily with high accuracy.
    • 老化装置内部的功能测试电路安装在老化板上,并指定多个正常工作的检查装置。 平均电压计算电路计算施加到在安装部分上指定的多个检查装置的试验电压的平均电压。 电压校正电路接收平均电压并输出控制信号以控制从设备电源产生电路输出的设定电压。 因此,该老化装置可以高精度地容易地设定被检查装置的检测电压。