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    • 3. 发明申请
    • Integrated Circuit on a Semiconductor Chip with a Phase Shift Circuit and a Method for Digital Phase Shifting
    • 具有相移电路的半导体芯片上的集成电路和用于数字相移的方法
    • US20080272817A1
    • 2008-11-06
    • US12103782
    • 2008-04-16
    • Niels Fricke
    • Niels Fricke
    • H03H11/26
    • H03K5/135H03K5/133H03K2005/00286
    • The present invention relates to an integrated circuit on a semiconductor chip with at least one phase shift circuit (56), at least one data input terminal (70) and at least one clock input terminal (38; 68), wherein the phase shift circuit (56) comprises at least two delay chains (10; 20) of the same kind, the delay chain (10; 20) comprises a plurality of inverting elements (12; 22), the phase shift circuit (56) comprises at least one digital control circuit (30), the delay chain (10; 20) is provided to delay a digital signal in a functional mode, the delay chain (10; 20) is provided to operate in a calibration mode, and at least two delay chains (10; 20) are provided to operate alternating between the functional mode and the calibration mode. The present invention relates further to a method for digital phase shifting of a signal (38; 68) within an integrated circuit, wherein the signal (38; 68) is delayed in a delay chain (10; 20) by a predetermined value in an operation mode, while another delay chain (10; 20) of the same kind is calibrated in a calibration mode, and wherein at least two delay chains (10; 20) operate alternating between the functional mode and the calibration mode.
    • 本发明涉及具有至少一个相移电路(56),至少一个数据输入端(70)和至少一个时钟输入端(38; 68)的半导体芯片上的集成电路,其中相移电路 (56)包括相同类型的至少两个延迟链(10; 20),所述延迟链(10; 20)包括多个反相元件(12; 22),所述相移电路(56)包括至少一个 提供数字控制电路(30),延迟链(10; 20)用于在功能模式下延迟数字信号,延迟链(10; 20)被提供为在校准模式下操作,并且至少两个延迟链 (10; 20)被设置为在功能模式和校准模式之间交替工作。 本发明还涉及一种用于集成电路内的信号(38; 68)的数字相移的方法,其中信号(38; 68)在延迟链(10; 20)中被延迟预定值 而在相同类型的另一个延迟链(10; 20)在校准模式下被校准,并且其中至少两个延迟链(10; 20)在功能模式和校准模式之间交替工作。