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    • 1. 发明授权
    • Optical measurement system and sample optical property management method
    • 光学测量系统和样品光学性能管理方法
    • US07549586B2
    • 2009-06-23
    • US11166883
    • 2005-06-24
    • Koji WatanabeToru KobayashiMasao NakamuroNaoki Sagisaka
    • Koji WatanabeToru KobayashiMasao NakamuroNaoki Sagisaka
    • G06K7/10
    • G06K17/00G01J3/02G01J3/0264G01J3/0272G01N21/25G01N21/85G06K2017/0077
    • An optical measurement system which manages whether an optical property of a sample falls within a predetermined management range. The optical measurement system has a measuring device for measuring the optical property value of the inspected sample, a reader for reading an attribute identification information of an identification tag attached to the sample, and a storage section for storing optical property management information concerning a plurality of kinds of samples each in a manner corresponding to attribute identification information of each sample. A controller in the optical measurement system reads out from the storage section the optical property management information corresponding to the attribute identification information of the sample read by said reader, and compares the optical property management information with the optical property value of the sample, and then determines whether the optical property value falls within an allowable range in the optical property management information.
    • 一种光学测量系统,其管理样品的光学性质是否在预定的管理范围内。 光学测量系统具有用于测量检查样品的光学特性值的测量装置,用于读取附于样品的识别标签的属性识别信息的读取器,以及用于存储关于多个 各种样品各自以与每个样品的属性识别信息相对应的方式。 光学测量系统中的控制器从存储部分读出与所述读取器读取的样品的属性识别信息相对应的光学性质管理信息,并将光学性质管理信息与样品的光学性质值进行比较,然后 确定光学特性值是否在光学性质管理信息的容许范围内。
    • 3. 发明授权
    • Reflection characteristic measuring apparatus
    • 反射特性测量装置
    • US6088117A
    • 2000-07-11
    • US141727
    • 1998-08-27
    • Kenji ImuraMasayuki MakinoWataru YamaguchiHiroshi KohsakaNaoki Sagisaka
    • Kenji ImuraMasayuki MakinoWataru YamaguchiHiroshi KohsakaNaoki Sagisaka
    • G01J3/50G01J1/00G01J1/42G01N21/25
    • G01N21/255G01J3/0254G01N21/474G01N2201/065
    • A reflection characteristic of a sample is measured using an integrating sphere by: measuring an apparent reflectance of a reference sample by using integrating sphere, the reference sample having a known true reflectance under a given illumination condition; calculating coefficients for rendering a linear combination of a measured apparent reflectance of the reference sample and N-th power (N is 2 or more integer) of the measured apparent reflectance closer to the known true reflectance of the reference sample; storing calculated coefficients in a storage medium as coefficients for the given illumination condition; measuring an apparent reflectance of a desired sample by using the integrating sphere; calculating a true reflectance of the desired sample under the given illumination condition by multiplying the terms of the linear combination of an measured apparent reflectance of the desired sample and N-th power of the measured apparent reflectance of the desired sample by the coefficients stored in the storage medium, respectively.
    • 使用积分球来测量样品的反射特性:通过使用积分球来测量参考样品的表观反射率,参考样品在给定照明条件下具有已知的真实反射率; 计算用于渲染参考样本的测量的表观反射率和近似于参考样品的已知真实反射率的测量的表观反射率的N次方(N是2或更大整数)的线性组合的系数; 将计算的系数存储在存储介质中作为给定照明条件的系数; 使用积分球测量所需样品的表观反射率; 通过将所需样品的测量的表观反射率和所需样品的测量的表观反射率的N次方的线性组合的项乘以存储在所需样品中的系数,将所需样品的真实反射率乘以给定照明条件 存储介质。