专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US06937042B2 Contact probe and probe device 失效
公开(公告)号：US06937042B2
公开(公告)日：2005-08-30
申请号：US10902861
申请日：2004-08-02
申请人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
发明人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/07342
摘要： A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.

2. 外观设计

USD594009S1 Personal computer 有权
标题翻译：个人电脑
公开(公告)号：USD594009S1
公开(公告)日：2009-06-09
申请号：US29325750
申请日：2008-10-06
申请人： Tomomi Nakano , Hirotoshi Muraki , Shiyuuichi Sugiyama , Kazuhiko Aoyama , Naoki Katou
设计人： Tomomi Nakano , Hirotoshi Muraki , Shiyuuichi Sugiyama , Kazuhiko Aoyama , Naoki Katou

3. 发明申请

US20050007130A1 Contact probe and probe device 失效
标题翻译：接触探针和探针装置
公开(公告)号：US20050007130A1
公开(公告)日：2005-01-13
申请号：US10902779
申请日：2004-08-02
申请人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
发明人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/07342
摘要： A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
摘要翻译：一种探针装置，其具有包括膜的接触探针，形成在所述膜上的多个布线图案，每个布线图案具有从所述膜突出以形成接触针的前端部，以及设置在所述膜上的金属层。在一个实施例中，接触探针装置包括彼此连接的第一和第二接触探针，第一接触探针包括第一膜和形成在第一膜上的多个第一布线图案，每个第一布线图案具有前端部分从第一膜突出以形成接触针。第二接触探针包括第二膜和形成在第二膜上的多个第二布线图案。多个第二布线图案连接到多个第一布线图案，并且第二接触探针与第一接触探针分开形成。

4. 发明授权

US06917211B2 Contact probe and probe device 失效
公开(公告)号：US06917211B2
公开(公告)日：2005-07-12
申请号：US10903012
申请日：2004-08-02
申请人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
发明人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/07342
摘要： A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.

5. 发明申请

US20050001644A1 Contact probe and probe device 失效
公开(公告)号：US20050001644A1
公开(公告)日：2005-01-06
申请号：US10903012
申请日：2004-08-02
申请人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
发明人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/07342
摘要： A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.

6. 发明授权

US07172018B2 Vehicle air-conditioning system 失效
标题翻译：车用空调系统
公开(公告)号：US07172018B2
公开(公告)日：2007-02-06
申请号：US10643666
申请日：2003-08-19
申请人： Naoki Katou , Shinichi Yoshida , Makoto Mimoto
发明人： Naoki Katou , Shinichi Yoshida , Makoto Mimoto
IPC分类号： F25B29/00 , B60H1/00 , B60H3/00
CPC分类号： B60H1/00842
摘要： A vehicle air-conditioning system improves a passenger's sensation of cooling by preventing air blown from a foot opening when a cooling load is low, creating a comfortable temperature distribution along the passenger's body. The vehicle air-conditioning system automatically selects a face mode when a target air temperature (TAO) is between a first predetermined temperature and a second predetermined temperature, which is higher than the first predetermined temperature, a bi-level mode when the TAO is higher than the first predetermined temperature and an evaporator air temperature is higher than a predetermined temperature, or a face mode when the TAO is lower than the first predetermined temperature and the evaporator air temperature is lower than the predetermined temperature.
摘要翻译：车辆空调系统通过在冷负荷低时防止从脚踏开口吹出的空气来提高乘客的冷却感，沿乘客身体产生舒适的温度分布。当目标空气温度（TAO）在高于第一预定温度的第一预定温度和第二预定温度之间时，车辆空调系统自动选择面部模式，当TAO较高时的双电平模式比第一预定温度和蒸发器空气温度高于预定温度，或当TAO低于第一预定温度且蒸发器空气温度低于预定温度时的面模式。

7. 发明授权

US06903563B2 Contact probe and probe device 失效
公开(公告)号：US06903563B2
公开(公告)日：2005-06-07
申请号：US10902860
申请日：2004-08-02
申请人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
发明人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/07342
摘要： A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.

8. 发明授权

US06900647B2 Contact probe and probe device 失效
公开(公告)号：US06900647B2
公开(公告)日：2005-05-31
申请号：US10776326
申请日：2004-02-12
申请人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
发明人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/07342
摘要： A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.

9. 发明授权

US06710608B2 Contact probe and probe device 失效
标题翻译：接触探针和探针装置
公开(公告)号：US06710608B2
公开(公告)日：2004-03-23
申请号：US10076508
申请日：2002-02-19
申请人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
发明人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
IPC分类号： G01R3102
CPC分类号： G01R1/07342
摘要： A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.
摘要翻译：一种探针装置，其具有包括膜的接触探针，形成在所述膜上的多个布线图案，每个布线图案具有从所述膜突出以形成接触针的前端部，以及设置在所述膜上的金属层。在一个实施例中，接触探针装置包括彼此连接的第一和第二接触探针，第一接触探针包括第一膜和形成在第一膜上的多个第一布线图案，每个第一布线图案具有前端部分从第一膜突出以形成接触针。第二接触探针包括第二膜和形成在第二膜上的多个第二布线图案。多个第二布线图案连接到多个第一布线图案，并且第二接触探针与第一接触探针分开形成。

10. 发明授权

US07015710B2 Contact probe and probe device 失效
公开(公告)号：US07015710B2
公开(公告)日：2006-03-21
申请号：US10902779
申请日：2004-08-02
申请人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
发明人： Hideaki Yoshida , Toshinori Ishii , Atushi Matsuda , Mituyoshi Ueki , Noriyoshi Tachikawa , Tadashi Nakamura , Naoki Katou , Shou Tai , Hayato Sasaki , Naohumi Iwamoto , Akihumi Mishima , Toshiharu Hiji , Akihiro Masuda
IPC分类号： G01R31/02
CPC分类号： G01R1/07342
摘要： A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式