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    • 2. 发明授权
    • Magnetic random access memory device
    • 磁性随机存取存储器件
    • US08953366B2
    • 2015-02-10
    • US13697092
    • 2011-05-11
    • Stuart A. WolfJiwei LuMircea R. Stan
    • Stuart A. WolfJiwei LuMircea R. Stan
    • G11C11/00G11C11/14
    • G11C11/14G11C11/161G11C11/1675Y10T29/49069
    • The present invention proposes an electronic memory device comprising a memory line including a memory domain. The memory line may contain a number of memory domains and a number of fixed domains, wherein each memory domain stores a single binary bit value. A multiferroic element may be disposed proximate to each memory domain allowing the magnetization of the memory domain to be changed using a spin torque current, and ensuring the stability of the magnetization of the domain when it is not being written. The domain boundary between the memory domain and one of its adjacent fixed domains may thereby be moved. An antiferromagnetic element may be disposed proximate to each fixed domain to ensure the stability of the magnetization of these. The value of each memory domain may be read by applying a voltage to a magnetic tunnel junction comprising the memory domain and measuring the current flowing through it.
    • 本发明提出了一种包括存储器线的电子存储器件,该存储器线包括存储器域。 存储器线可以包含多个存储器域和多个固定域,其中每个存储器域存储单个二进制位值。 可以将多层元件设置在每个存储器域附近,从而允许使用自旋转矩电流来改变存储器域的磁化,并且当未写入时确保该域的磁化的稳定性。 因此,可以移动存储器域与其一个相邻固定域之间的域边界。 反铁磁元件可以设置在每个固定结构域附近,以确保这些磁化的稳定性。 可以通过将电压施加到包括存储器域的磁性隧道结并测量流过它的电流来读取每个存储器域的值。
    • 4. 发明申请
    • MAGNETIC RANDOM ACCESS MEMORY DEVICE
    • 磁性随机访问存储器件
    • US20130058157A1
    • 2013-03-07
    • US13697092
    • 2011-05-11
    • Stuart A. WolfJiwei LuMircea R. Stan
    • Stuart A. WolfJiwei LuMircea R. Stan
    • G11C11/16G11C99/00
    • G11C11/14G11C11/161G11C11/1675Y10T29/49069
    • The present invention proposes an electronic memory device comprising a memory line including a memory domain. The memory line may contain a number of memory domains and a number of fixed domains, wherein each memory domain stores a single binary bit value. A multiferroic element may be disposed proximate to each memory domain allowing the magnetization of the memory domain to be changed using a spin torque current, and ensuring the stability of the magnetization of the domain when it is not being written. The domain boundary between the memory domain and one of its adjacent fixed domains may thereby be moved. An antiferromagnetic element may be disposed proximate to each fixed domain to ensure the stability of the magnetization of these. The value of each memory domain may be read by applying a voltage to a magnetic tunnel junction comprising the memory domain and measuring the current flowing through it.
    • 本发明提出了一种包括存储器线的电子存储器件,该存储器线包括存储器域。 存储器线可以包含多个存储器域和多个固定域,其中每个存储器域存储单个二进制位值。 可以将多层元件设置在每个存储器域附近,从而允许使用自旋转矩电流来改变存储器域的磁化,并且当未写入时确保该域的磁化的稳定性。 因此,可以移动存储器域与其一个相邻固定域之间的域边界。 反铁磁元件可以设置在每个固定结构域附近,以确保这些磁化的稳定性。 可以通过将电压施加到包括存储器域的磁性隧道结并测量流过它的电流来读取每个存储器域的值。
    • 7. 发明授权
    • Temperature dependent regulation of threshold voltage
    • 温度依赖调节阈值电压
    • US06917237B1
    • 2005-07-12
    • US10792262
    • 2004-03-02
    • James W. TschanzMircea R. StanSiva G. NarendraVivek K. De
    • James W. TschanzMircea R. StanSiva G. NarendraVivek K. De
    • G05F3/20G05F3/26H03K3/01
    • G05F3/262G05F3/205
    • Embodiments circuits provide a transistor body bias voltage so that the ratio of ION to IOFF is constant over a range of temperature, where ION is a transistor current when ON and IOFF is a (leakage) transistor current when OFF. In one embodiment, a nFET is biased to provide ION to a current mirror that sources a current AION to a node, a nFET is biased to provide IOFF to a current mirror that sinks a current BIOFF from the node, and an amplifier provides feedback from the node to the body terminals of the nFETs so that at steady state AION=BIOFF, where A and B are constants independent over a range of temperature. In this way, the ratio ION/IOFF is maintained at B/A for some range of temperatures. Other embodiments are described and claimed.
    • 实施例电路提供晶体管体偏置电压,使得I ON / OFF与I OFF之间的比率在温度范围内是恒定的,其中I < 是ON时的晶体管电流,当OFF时,I 是晶体管电流(泄漏)。 在一个实施例中,nFET被偏置以将电流镜提供给电流反射镜,该电流镜将节点的当前AI导通,nFET被偏置以提供I < OFF 到从节点吸收当前BI OFF的电流镜,并且放大器从节点向nFET的体式终端提供反馈,使得在稳态AI ​​< ON = BI ,其中A和B在温度范围内是常数独立的。 以这种方式,在一些温度范围内,比率I ON / OFF / OFF保持在B / A。 描述和要求保护其他实施例。
    • 9. 发明授权
    • Dynamic CMOS circuits with individually adjustable noise immunity
    • 动态CMOS电路具有独立可调的抗噪声能力
    • US06518796B1
    • 2003-02-11
    • US09607495
    • 2000-06-30
    • Mircea R. StanVivek K. De
    • Mircea R. StanVivek K. De
    • H03K19096
    • H03K19/0963
    • A system of individually adjusting noise immunity of each input of a dynamic circuit including parallel or series-parallel pull-down network comprises identifying precharge nodes of the dynamic circuit requiring a reduction of noise. Then further identifying NMOS transistor drains connected to the respective precharge nodes, then creating a pull-up network of PMOS transistors for the precharge nodes, respectively. After creating a pull-up network of PMOS transistors, the system further includes arranging the order of the PMOS transistors corresponding to the respective precharge nodes to improve the noise immunity and performance of the dynamic circuit. After completing the arranging of the order of the PMOS transistors, the system can further include sizing the PMOS transistors to achieve the required reduction of noise for the precharge nodes, respectively.
    • 包括并行或串联并联下拉网络的动态电路的每个输入的单独调节噪声抗扰度的系统包括识别要求降低噪声的动态电路的预充电节点。 然后进一步识别连接到各个预充电节点的NMOS晶体管漏极,然后分别为预充电节点创建PMOS晶体管的上拉网络。 在创建PMOS晶体管的上拉网络之后,该系统还包括布置与各个预充电节点相对应的PMOS晶体管的阶数,以提高动态电路的抗噪声性能和性能。 在完成了PMOS晶体管的顺序排列之后,系统还可以包括分别对PMOS晶体管进行尺寸调整以实现预充电节点所需的噪声减小。