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1. 发明专利

JP2006207564A Rotary type internal combustion engine 有权
标题翻译：旋转式内燃机
公开(公告)号：JP2006207564A
公开(公告)日：2006-08-10
申请号：JP2005043037
申请日：2005-01-24
申请人： Minoru Sanada , 実真田
发明人： SANADA MINORU
IPC分类号： F02B53/00 , F01C1/46
CPC分类号： Y02T10/17
摘要： PROBLEM TO BE SOLVED: To directly rotate a rotor and a rotary shaft by energy at the time of explosion of air-fuel mixture in an internal combustion engine, and thereby to dispense with complicated delivery of energy in a piston of a conventional reciprocation type engine, and to reduce mechanical loss.
SOLUTION: A combustion chamber is provided in a housing having a center part machined to be a cylindrical shape, the rotor, a cam, a gate and a valve are incorporated, and strokes of intake, compression, explosion and exhaust are performed with the usage of the air-fuel mixture comprising liquid or gas fuel and the air by rotating the rotor three times and operating the gate and the valve. The rotor and the four cams are rotated to the left, and the cam is rotated once while the rotor is rotated three times.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：在内燃机中的空气 - 燃料混合物的爆炸时，通过能量直接旋转转子和旋转轴，由此在常规的活塞的活塞中省去复杂的能量输送往复式发动机，并减少机械损失。解决方案：燃烧室设置在具有加工成圆筒形状的中心部分的壳体中，并入转子，凸轮，闸门和阀，并且进行进气，压缩，爆炸和排气的冲程利用包含液体或气体燃料的空气 - 燃料混合物和空气通过使转子旋转三次并操作闸门和阀。转子和四个凸轮向左旋转，当转子旋转三次时，凸轮旋转一次。版权所有（C）2006，JPO＆NCIPI

2. 发明申请

US20090160472A1 WAFER-LEVEL BURN-IN METHOD AND WAFER-LEVEL BURN-IN APPARATUS 审中-公开
标题翻译：水平碾压方法和水平碾压装置
公开(公告)号：US20090160472A1
公开(公告)日：2009-06-25
申请号：US12064093
申请日：2006-06-26
申请人： Terutsugu Segawa , Minoru Sanada
发明人： Terutsugu Segawa , Minoru Sanada
IPC分类号： G01R31/02
CPC分类号： G01R31/2874 , H01L21/67248
摘要： Temperature control in wafer-level burn-in is performed such that a set temperature used for the temperature control is corrected using a correction value calculated from the generated heat density of a wafer (101). Thus it is possible to eliminate a difference between the temperature of the wafer heated when an electrical load is applied and a control temperature for applying a thermal load, not depending on the distribution of good devices formed on the wafer (101) and the power consumption of the devices. As a result, the wear and burn of a probe can be prevented and highly reliable screening can be achieved.
摘要翻译：进行晶片级老化期间的温度控制，使得使用由晶片（101）的产生的热密度计算的校正值校正用于温度控制的设定温度。因此，可以消除在施加电负载时加热的晶片的温度与施加热负荷的控制温度之间的差异，而不依赖于形成在晶片（101）上的良好器件的分布和功率消耗的设备。结果，可以防止探针的磨损和烧伤，并且可以实现高度可靠的筛选。

3. 发明申请

US20090102499A1 METHOD AND APPARATUS FOR WAFER LEVEL BURN-IN 有权
标题翻译：用于水平燃烧的方法和装置
公开(公告)号：US20090102499A1
公开(公告)日：2009-04-23
申请号：US12063276
申请日：2006-05-29
申请人： Terutsugu Segawa , Minoru Sanada
发明人： Terutsugu Segawa , Minoru Sanada
IPC分类号： G01R31/26
CPC分类号： H01L21/67248 , G01R31/2874 , H01L21/67103 , H01L21/67242 , H01L21/67288
摘要： A temperature regulation plate 106 is divided into at least two areas, a heater 408 for applying a temperature load in correspondence with such areas and its control system are divided and controlled independently to set temperatures, and a cooling source is controlled by comparing the measurements from temperature sensors 409 arranged in respective areas for controlling the heater 408 and switching the measurement for calculating the control output sequentially thus reducing variation in in-plane temperature of a wafer due to heating when an electric load is applied. Since consumption and burning of a probe are prevented, highly reliable wafer level burn-in method and apparatus can be provided.
摘要翻译：温度调节板106被分成至少两个区域，加热器408用于对应于这些区域施加温度负荷，并且其控制系统被独立地分开和控制以设定温度，并且通过将来自温度传感器409布置在用于控制加热器408的各个区域中，并且顺序地切换用于计算控制输出的测量值，从而当施加电负载时，由于加热而减小晶片的面内温度的变化。由于防止了探测器的消耗和燃烧，因此可以提供高度可靠的晶片级老化方法和装置。

4. 发明申请

US20070009240A1 Semiconductor test device 审中-公开
标题翻译：半导体测试装置
公开(公告)号：US20070009240A1
公开(公告)日：2007-01-11
申请号：US11480485
申请日：2006-07-05
申请人： Naomi Miyake , Minoru Sanada
发明人： Naomi Miyake , Minoru Sanada
IPC分类号： A21B2/00 , F26B19/00
CPC分类号： H01L21/67248 , G01R31/2856 , G01R31/2874
摘要： A semiconductor test device comprises a substrate having a opposed-wafer surface on which a semiconductor wafer with a plurality of the embedded semiconductor devices is placing opposite when a burn-in test is implemented, a wiring layer provided on the substrate, and a temperature sensor for measuring a temperature of the semiconductor wafer in the state here the semiconductor wafer is placing opposite on the substrate, wherein the wiring layer includes a wiring which is connected to the semiconductor wafer in the state where the semiconductor wafer is placing opposite on the substrate, and supplies a signal and a voltage for the burn-in test to the semiconductor wafer, and the temperature sensor is provided on the substrate in vicinity of the opposed-wafer surface.
摘要翻译：半导体测试装置包括具有相对晶片表面的基板，在实现老化测试的同时，具有多个嵌入式半导体器件的半导体晶片在其上相对放置，设置在基板上的布线层和温度传感器用于在半导体晶片在基板上相对放置的状态下测量半导体晶片的温度，其中布线层包括在半导体晶片相对于基板放置的状态下连接到半导体晶片的布线，并且向半导体晶片提供用于老化测试的信号和电压，并且在相对晶片表面附近的基板上设置温度传感器。

5. 发明授权

US07940064B2 Method and apparatus for wafer level burn-in 有权
标题翻译：晶圆级老化的方法和装置
公开(公告)号：US07940064B2
公开(公告)日：2011-05-10
申请号：US12063276
申请日：2006-05-29
申请人： Terutsugu Segawa , Minoru Sanada
发明人： Terutsugu Segawa , Minoru Sanada
IPC分类号： G01R31/00
CPC分类号： H01L21/67248 , G01R31/2874 , H01L21/67103 , H01L21/67242 , H01L21/67288
摘要： A temperature regulation plate 106 is divided into at least two areas, a heater 408 for applying a temperature load in correspondence with such areas and its control system are divided and controlled independently to set temperatures, and a cooling source is controlled by comparing the measurements from temperature sensors 409 arranged in respective areas for controlling the heater 408 and switching the measurement for calculating the control output sequentially thus reducing variation in in-plane temperature of a wafer due to heating when an electric load is applied. Since consumption and burning of a probe are prevented, highly reliable wafer level burn-in method and apparatus can be provided.
摘要翻译：温度调节板106被分成至少两个区域，加热器408用于对应于这些区域施加温度负荷，并且其控制系统被独立地分开和控制以设定温度，并且通过将来自温度传感器409布置在用于控制加热器408的各个区域中，并且顺序地切换用于计算控制输出的测量值，从而当施加电负载时，由于加热而减小晶片的面内温度的变化。由于防止了探测器的消耗和燃烧，因此可以提供高度可靠的晶片级老化方法和装置。

6. 发明授权

US6049147A Motor, structure of stator of the motor and assembly method of the stator 失效
标题翻译：电机，电机定子结构和定子装配方法
公开(公告)号：US6049147A
公开(公告)日：2000-04-11
申请号：US156168
申请日：1998-09-17
申请人： Minoru Sanada , Isamu Hashimoto
发明人： Minoru Sanada , Isamu Hashimoto
IPC分类号： H02K5/00 , H02K5/16 , H02K5/22 , H02K11/00 , H02K15/00 , H02K29/08 , H05K3/00 , H05K3/40 , H02K15/02
CPC分类号： H05K3/0061 , H02K11/01 , H02K15/00 , H02K29/08 , H02K5/163 , H05K3/4084 , Y10S310/06 , Y10T29/49009
摘要： The present invention provides a motor and a stator structure of the motor and an assembly method of the stator structure and a method of installing the motor. The stator structure of the motor contains a stator substrate having a double-layer structure of a printed circuit board and a magnetic plate jointed together at a plurality of calking sections, wherein a centroid is determined with respect to the plurality of calking sections on the printed circuit board, and a vacant area having no electric parts provided is determined nearby the centroid on the printed circuit board to allow the vacant area to be supported by a retainer of a calking jig.
摘要翻译：本发明提供电动机的电动机和定子结构以及定子结构的组装方法和安装电动机的方法。电机的定子结构包括具有印刷电路板的双层结构的定子基板和在多个铆接部分处接合在一起的磁性板，其中相对于印刷的多个铆接部分确定重心电路板，并且在印刷电路板上的质心附近确定没有设置电气部件的空闲区域，以允许空隙区域由夹具夹具的保持器支撑。

7. 发明授权

US4742053A 3-Isoquinoliniomethyl cephalosporin derivatives 失效
标题翻译： 3-异喹啉甲基头孢菌素衍生物
公开(公告)号：US4742053A
公开(公告)日：1988-05-03
申请号：US796187
申请日：1985-11-08
申请人： Susumu Nakagawa , Ryosuke Ushijima , Eiichi Mano , Norikazu Ban , Minoru Sanada
发明人： Susumu Nakagawa , Ryosuke Ushijima , Eiichi Mano , Norikazu Ban , Minoru Sanada
IPC分类号： A61K31/545 , C07D501/04 , C07D501/20 , C07D501/46 , C07D501/56 , C07D501/59
CPC分类号： C07D501/46
摘要： The invention relates to an antibiotic comprising a compound having the formula: ##STR1## wherein R.sup.1 is a straight chain, branched chain, or cyclic lower alkyl group which may be substituted by a carboxyl group, and R.sup.2 designates vicinal dihydroxyl groups or diacetoxy groups; or a pharmaceutically acceptable salt, physiologically hydrolyzable ester or solvate thereof.
摘要翻译：本发明涉及一种抗生素，其包含具有下式的化合物：其中R1是可被羧基取代的直链，支链或环状低级烷基，R2表示连位二羟基或二乙酰氧基; 或其药学上可接受的盐，生理上可水解的酯或其溶剂合物。

8. 发明授权

US07768285B2 Probe card for semiconductor IC test and method of manufacturing the same 有权
标题翻译：半导体IC测试用探针卡及其制造方法
公开(公告)号：US07768285B2
公开(公告)日：2010-08-03
申请号：US11812463
申请日：2007-06-19
申请人： Minoru Sanada , Yoshirou Nakata
发明人： Minoru Sanada , Yoshirou Nakata
IPC分类号： G01R31/02 , G01R31/26
CPC分类号： G01R1/07314 , G01R1/44 , G01R31/2863 , Y10T29/49117
摘要： Provided is a probe card for semiconductor IC test on one principal surface of which are formed a plurality of probe electrodes, such as bump electrodes (5), and which has, in a peripheral portion thereof, a thin film sheet (9) fixed to a support, such as a ceramics ring (7). A local tension-changed portion (12) is formed in the thin film sheet (9) fixed to the ceramics ring (7) so that a tensile strain is generated, and the plurality of bump electrodes (5) are arranged in prescribed positions that connect electrically to electrodes of each semiconductor IC element of the semiconductor wafer. The tensile strain of the thin film sheet (9) is changed positively and in a sustained manner, whereby the bump electrodes (5) are rearranged in desired positions.
摘要翻译：提供一种用于半导体IC测试的探针卡，其一个主表面上形成有诸如凸起电极（5）的多个探针电极，并且其周边部分具有固定到诸如陶瓷环（7）的支撑件。在固定在陶瓷环（7）上的薄膜片（9）上形成局部张力变化部（12），产生拉伸应变，多个突起电极（5）配置在规定位置电连接到半导体晶片的每个半导体IC元件的电极。薄膜片（9）的拉伸应变以持续的方式正向变化，由此将凸起电极（5）重新布置在期望的位置。

9. 发明申请

US20080150563A1 Probe card for semiconductor IC test and method of manufacturing the same 有权
标题翻译：半导体IC测试用探针卡及其制造方法
公开(公告)号：US20080150563A1
公开(公告)日：2008-06-26
申请号：US11812463
申请日：2007-06-19
申请人： Minoru Sanada , Yoshirou Nakata
发明人： Minoru Sanada , Yoshirou Nakata
IPC分类号： G01R1/073 , G01R3/00
CPC分类号： G01R1/07314 , G01R1/44 , G01R31/2863 , Y10T29/49117
摘要： Provided is a probe card for semiconductor IC test on one principal surface of which are formed a plurality of probe electrodes, such as bump electrodes (5), and which has, in a peripheral portion thereof, a thin film sheet (9) fixed to a support, such as a ceramics ring (7). A local tension-changed portion (12) is formed in the thin film sheet (9) fixed to the ceramics ring (7) so that a tensile strain is generated, and the plurality of bump electrodes (5) are arranged in prescribed positions that connect electrically to electrodes of each semiconductor IC element of the semiconductor wafer. The tensile strain of the thin film sheet (9) is changed positively and in a sustained manner, whereby the bump electrodes (5) are rearranged in desired positions.
摘要翻译：提供一种用于半导体IC测试的探针卡，其一个主表面上形成有诸如凸起电极（5）的多个探针电极，并且其周边部分具有固定到诸如陶瓷环（7）的支撑件。在固定在陶瓷环（7）上的薄膜片（9）上形成局部张力变化部（12），产生拉伸应变，多个突起电极（5）配置在规定位置电连接到半导体晶片的每个半导体IC元件的电极。薄膜片（9）的拉伸应变以持续的方式正向变化，由此将凸起电极（5）重新布置在期望的位置。

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