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    • 3. 发明申请
    • LIGHT SOURCE
    • 光源
    • US20130038202A1
    • 2013-02-14
    • US13643570
    • 2011-04-26
    • Maurice Alexander Hugo Donners
    • Maurice Alexander Hugo Donners
    • F21V9/00H01J61/44
    • H01K1/32F21Y2105/10F21Y2105/12F21Y2113/13F21Y2115/10H01J61/40
    • The invention relates to a light source for generating light having a spectral emittance in at least a part of the range of 380 nm to 680 nm. The light has a spectral power distribution E(λ) as a function of the wave-length λ over a first range of 600 nm =0.08, A third ratio of the integral power distribution over said third range to that of a range of 380 nm =0.03 or Ps>=0.015 if Pl>=0.75l A respective radiation emission peak in each of the first, second and third wavelength range has a full width half maximum (=FWHM) of at least 12 nm.
    • 本发明涉及一种在380nm至680nm的范围的至少一部分中产生具有光谱发射率的光的光源。 光在600nm <=λ<= 680nm的第一范围,505nm <=λ<= 600nm的第二范围内具有作为波长λ的函数的光谱功率分布E(λ),以及 380nm的第三范围<=λ<= 505nm。 通过以下关系给出在所述第一范围内的积分功率分布与380nm <=λ<= 680nm范围内的积分功率分布的第一比率,其中0.65 <= P1 <= 0.95,第二比率 所述第二范围内的积分功率分布与380nm <=λ<= 680nm范围内的积分功率分布由以下关系式给出:式(II)其中Pm> = 0.08,第三比例的积分功率分布 范围为380nm <=λ<= 680nm范围的范围由以下关系给出:其中如果P1> = 0.75I,Ps> = 0.03或Ps> = 0.015,则式(III)各自的辐射发射峰 第一,第二和第三波长范围具有至少12nm的全宽度半值(= FWHM)。
    • 8. 发明授权
    • Integrated device for testing contacts
    • 用于测试联系人的集成设备
    • US06731124B2
    • 2004-05-04
    • US09965453
    • 2001-09-27
    • Maurice Alexander Hugo Donners
    • Maurice Alexander Hugo Donners
    • G01R3102
    • G01R31/048G01R31/2812
    • The invention relates to a device (10) for testing a series of contacts (Cij), which are provided with connection conductors (G, H) for supplying electric current to the contacts (Cij). The known device is less suitable for testing large numbers of contacts (Cij), at least because it is expensive and the testing operation is tedious. A device (10) according to the invention includes a (semiconductor) body (1) on which the contacts (Cij) are present in the form of an array (A) , connection conductors (G, H) which are provided with a selection device. (S) enabling maximally two contacts (C11, C11′) to be selected, the connection conductors (G, H) being formed within maximally two separate metal layers (2, 3). Such a device (10) is inexpensive and easy to manufacture, and it also enables a large number of contacts (Cij) to be (semi-) quantitatively tested at a high speed. In one embodiment, the selection devices (S) are formed by diodes (D) in a matrix of a limited number of connection conductors (G, H) , enabling only one pair of contacts (C11, C11′) to be tested. In another embodiment, the selection means (S) are formed by series-connected capacitors Zij and inductors Lij, enabling each contact (C11) to be individually tested within a network N.
    • 本发明涉及一种用于测试一系列触点(Cij)的装置(10),它们具有用于向触点(Cij)提供电流的连接导体(G,H)。 已知的设备不太适用于测试大量的触点(Cij),至少因为它是昂贵的,并且测试操作是繁琐的。 根据本发明的装置(10)包括(半导体)主体(1),触点(Cij)以阵列(A)的形式存在于其上,连接导体(G,H)设置有选择 设备。 (S)能够最大限度地选择两个触点(C11,C11'),连接导体(G,H)形成在最多两个分离的金属层(2,3)内。 这种装置(10)便宜且易于制造,并且还能够以高速定量测试大量的触点(Cij)。 在一个实施例中,选择装置(S)由有限数量的连接导体(G,H)的矩阵中的二极管(D)形成,从而只能测试一对触点(C11,C11')。 在另一个实施例中,选择装置(S)由串联连接的电容器Zij和电感器Lij形成,使得每个触点(C11)能够在网络N内单独测试。