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    • 1. 发明专利
    • Diaper and excretion detector
    • DIAPER和EXCRETION检测器
    • JP2005245695A
    • 2005-09-15
    • JP2004059264
    • 2004-03-03
    • Masanobu Kato昌伸 加藤
    • KATO MASANOBU
    • A61F13/42A61F5/44A61F13/15A61F13/49
    • PROBLEM TO BE SOLVED: To provide a diaper with an excretion detecting function capable of taking a measure against a diaper rash and easily confirming the presence / absence of excretion even in the case that a person wearing the diaper has clothes on.
      SOLUTION: A substance which absorbs moisture and discharges gases is made to absorb the moisture of feces and urine and discharge the gas and the skin is quickly dried. Also, by utilizing the gas and inflating an air bag equipped on the diaper, the excretion is visually and tactilely detected. By mounting a a whistle on the air bag, the excretion can be detected auditorily as well.
      COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:为了提供一种具有排尿检测功能的尿布,其能够对尿布疹进行测量,并且即使在穿着尿布的人有衣服的情况下也容易确认排泄物的存在/不存在。

      解决方案:吸收水分和排出气体的物质被吸收粪便和尿液的水分,排出气体,皮肤迅速干燥。 此外,通过利用气体并对装在尿布上的气囊进行充气,可以视觉和触觉地检测排泄物。 通过在气囊上安装口哨,也可以听觉地检测排泄物。 版权所有(C)2005,JPO&NCIPI

    • 4. 发明授权
    • Semiconductor photodetector, method for manufacturing semiconductor photodetector and photodetector module
    • 半导体光电检测器,半导体光电检测器和光电检测器模块的制造方法
    • US06396117B1
    • 2002-05-28
    • US09246143
    • 1999-02-08
    • Ryozo FurukawaMasanobu Kato
    • Ryozo FurukawaMasanobu Kato
    • H01L3100
    • H01L31/101G02B6/4204H01L31/02161H01L31/02162
    • Light on the longer wavelength side can be photoelectrically converted and output reliably, whilst improving the structural and operational reliability of a photodetector, by means of a simple manufacturing process and inexpensive manufacturing costs. A first light-absorbing layer, a buffer layer of a second conductivity type, a second light-absorbing layer of a second conductivity type and a window layer of a second conductivity type are laminated in this order onto the first principal surface of a substrate of a first conductivity type. The first light-absorbing layer contains a region of the first conductivity type and a region of the second conductivity type, and a diffused region of the first conductivity type having a depth extending from the upper face of the window layer to the interface between the window layer and the second light-absorbing layer is provided in a portion of the window layer. A main electrode of a first conductivity type is provided on the diffused region, whilst a main electrode of a second conductivity type is provided on the window layer in the vicinity of the diffused region. The energy gap wavelength of the second light-absorbing layer is longer than the energy gap wavelength of the first light-absorbing layer, whilst the energy gap wavelength of the first light-absorbing layer is longer than the respective energy gap wavelengths of the substrate, buffer layer and window layer.
    • 较长波长侧的光可以通过简单的制造工艺和廉价的制造成本在可改善光电检测器的结构和操作可靠性的同时光电转换和输出。 将第一光吸收层,第二导电类型的缓冲层,第二导电类型的第二光吸收层和第二导电类型的窗口层依次层叠到基板的第一主表面上 第一导电类型。 第一光吸收层包含第一导电类型的区域和第二导电类型的区域,并且第一导电类型的扩散区域具有从窗口层的上表面延伸到窗口之间的界面的深度 并且第二光吸收层设置在窗口层的一部分中。 第一导电类型的主电极设置在扩散区域上,而第二导电类型的主电极设置在扩散区域附近的窗口层上。 第二光吸收层的能隙波长比第一光吸收层的能隙波长长,而第一光吸收层的能隙波长比衬底的各能隙波长长, 缓冲层和窗口层。
    • 9. 发明授权
    • Semiconductor photodetector
    • 半导体光电探测器
    • US06246097B1
    • 2001-06-12
    • US09187001
    • 1998-11-06
    • Masanobu KatoRyozo Furukawa
    • Masanobu KatoRyozo Furukawa
    • H01L310232
    • H01L27/14643H01L27/14685
    • At a semiconductor photodetector 100, a photodetection portion 120 is formed on a first substrate surface 110a of a substrate 110. In addition, a recess 110d is formed at a second substrate surface 110b of the substrate 110 which faces opposite the first substrate surface 110a. This recessed portion 110d is formed as a wedge-type V-shaped groove with a forward mesa surface formed at a front surface thereof, and is formed approximately parallel to a side photodetection surface 110c of the substrate 110 which is approximately perpendicular to the second substrate surface 110b. A total reflection film is coated on the front surface of the recess 110d. In the semiconductor photodetector 100 structured as described above, an incoming light P1 entering through the side photodetection surface 110c is reflected at the recess 110d to enter the photodetection portion 120 from the side where the substrate 110 is provided. As a result, the incoming light P1 is sensed at the photodetection portion 120.
    • 在半导体光电检测器100处,在基板110的第一基板表面110a上形成光电检测部分120.此外,在基板110的与第一基板表面110a相对的第二基板表面110b处形成凹槽110d。 该凹部110d形成为在其前表面形成有前台面的楔形V形槽,并且大致平行于基板110的与第二基板垂直的侧面光检测面110c 表面110b。 全反射膜涂覆在凹槽110d的前表面上。 在如上所述构成的半导体光检测器100中,通过侧光检测面110c入射的入射光P1在凹部110d处被反射,从设置有基板110的一侧进入光检测部120。 结果,入射光P1在光电检测部分120处被感测。