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    • 2. 发明授权
    • Displacement measuring device
    • 位移测量装置
    • US06513262B1
    • 2003-02-04
    • US09659804
    • 2000-09-11
    • Lucien BorgognonMarco CardilloRoland Duteil
    • Lucien BorgognonMarco CardilloRoland Duteil
    • G01B322
    • G01B3/22
    • A comparator measures and compares linear or angular dimensions. The comparator includes a metallic casing (2), and two bearings (23,24) such that a sensing probe (3), going through said casing (2) and worked directly into the casing (2), can be accommodated. Two sockets (8,9) of the comparator are firmly attached to the casing (2). A measuring system of the comparator includes a mobile portion (33) driven by the sensing probe and a fixed portion (27) firmly attached to the casing (2). A housing (10) of the comparator completely covers the outer sides (25) of the casing (2) and is held by the two sockets (8,9).
    • 比较器测量并比较直线或角度尺寸。 比较器包括金属壳体(2)和两个轴承(23,24),使得穿过所述壳体(2)并直接加工到壳体(2)中的感测探头(3)可以被容纳。 比较器的两个插座(8,9)牢​​固地附接到壳体(2)上。 比较器的测量系统包括由感测探头驱动的移动部分(33)和牢固地附接到壳体(2)的固定部分(27)。 比较器的壳体(10)完全覆盖壳体(2)的外侧(25)并被两个插座(8,9)保持。
    • 5. 发明授权
    • Opto-electronic system
    • 光电系统
    • US06794636B1
    • 2004-09-21
    • US09713435
    • 2000-11-15
    • Marco CardilloRoland Duteil
    • Marco CardilloRoland Duteil
    • G01D534
    • G01D5/34715
    • The opto-electronic system for dimension-measuring device comprises a transparent rule (30) comprising at least one portion provided with a succession of opaque graduations (31), a photo-emitter (20), a photo-detector (21), an integrated optical bloc (1) capable of concentrating the light beam generated by the photo-emitter (20) on the rule portion, and of concentrating the light beam having crossed said rule (30) on said photo-detector (21). The optical bloc (1), the photo-emitter (20) and said at least one photo-detector (21) are mounted on the same printed circuit board (2). The rule (30) occupies a plane perpendicular to said printed circuit board (2). The optical bloc comprises optical surfaces disposed opposite each side of said rule (30).
    • 用于尺寸测量装置的光电系统包括透明规则(30),该规则包括至少一部分设置有一系列不透明渐变(31),光发射器(20),光电检测器(21), 能够将由光电发射器(20)产生的光束集中在规则部分上的集成光学块(1),并将已经与规则(30)交叉的光束聚集在所述光检测器(21)上。 光学块(1),光发射器(20)和所述至少一个光电检测器(21)安装在同一印刷电路板(2)上。 规则(30)占据垂直于所述印刷电路板(2)的平面。 光学组件包括与所述规则(30)的每一侧相对设置的光学表面。