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1. 发明授权

US4510573A Method for X-ray fluorescence spectroscopy 失效
标题翻译： X射线荧光光谱法
公开(公告)号：US4510573A
公开(公告)日：1985-04-09
申请号：US260984
申请日：1981-05-06
申请人： William C. Boyce , Warren D. Wittekind , Leroy C. Howard , Thomas E. Hall , Wayne M. Lechelt
发明人： William C. Boyce , Warren D. Wittekind , Leroy C. Howard , Thomas E. Hall , Wayne M. Lechelt
IPC分类号： G01N23/223 , G01V5/12 , G06F15/46 , G01N23/00
CPC分类号： G01V5/12
摘要： A method and apparatus are described for performing X-ray fluorescence analysis where the physical relationship between the source/detector and the object being examined is not controlled. This technique and apparatus is particularly advantageous in performing an in situ analysis of the concentration of one or more elements present in a matrix of a material such as rock. In accordance with this aspect of our invention, such a mineral assay is performed by drilling a borehole into the matrix, inserting into the borehole a probe containing a suitable XRF source/detector, irradiating the matrix, detecting the spectrum of radiation that is produced and analyzing this spectrum. Preferably, the concentration of the assayed element is determined from the following formula: ##EQU1## where S is the number of photons counted having energies in a signal range where the X-ray spectral line of the assayed element is observed, C is the number of photons counted in a range where a radiation peak is observed, B is the number of photons counted in a background range, E is the number of photons counted in a range adjacent that where said radiation peak is observed, and K.sub.1 through K.sub.6 are empirically determined constants relating to the performance of the probe.
摘要翻译：描述了用于进行X射线荧光分析的方法和装置，其中源/检测器和被检查物体之间的物理关系不被控制。这种技术和设备在对诸如岩石的材料的基质中存在的一种或多种元素的浓度进行原位分析是特别有利的。根据本发明的这个方面，这种矿物测定是通过将钻孔钻入基质中，将含有适合的XRF源/检测器的探针插入钻孔中，照射基质，检测产生的辐射光谱，分析这个频谱。优选地，所测定的元素的浓度由下式确定：其中S是在观测到测定元素的X射线谱线的信号范围内具有能量的光子数，C是数目在观察到辐射峰的范围内计数的光子，B是在背景范围内计数的光子数，E是在与观察到所述辐射峰的范围相邻的范围内计数的光子数，K1至K6是经验性的确定与探头性能有关的常数。

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