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1. 发明授权

US06359967B1 Method and apparatus for scan charge compensation in a digital detector 失效
标题翻译：数字检测器中扫描电荷补偿的方法和装置
公开(公告)号：US06359967B1
公开(公告)日：2002-03-19
申请号：US09199710
申请日：1998-11-25
申请人： Scott A. Bielski , Scott W. Petrick , Lawrence R. Skrenes
发明人： Scott A. Bielski , Scott W. Petrick , Lawrence R. Skrenes
IPC分类号： H05G164
CPC分类号： H04N5/3658 , H04N5/32 , H04N5/374
摘要： A discrete pixel detector is charge compensated in a plurality of scan modes. In each scan mode a different number of rows of the detector is enabled, and signals produced at discrete pixel locations are read at the detector columns. Charges due to parasitic capacitance between the rows and columns are compensated and balanced by applying a compensation voltage to rows not enabled. The number of rows receiving the compensation voltage varies depending upon the number of enabled rows in each scan mode. A single compensation voltage may be used by applying the compensation voltage to a fixed multiple of the number of enabled rows in each scan mode.
摘要翻译：离散像素检测器以多种扫描模式进行电荷补偿。在每个扫描模式中，启用检测器的不同数量的行，并且在检测器列处读取在离散像素位置产生的信号。由于行和列之间的寄生电容而产生的电荷通过对不使能的行施加补偿电压来补偿和平衡。接收补偿电压的行数根据每个扫描模式中启用的行数而变化。可以通过将补偿电压施加到每个扫描模式中的使能行数的固定倍数来使用单个补偿电压。

2. 发明授权

US5389775A Imager assembly with multiple common electrode contacts 失效
标题翻译：具有多个公共电极触点的成像仪组件
公开(公告)号：US5389775A
公开(公告)日：1995-02-14
申请号：US161030
申请日：1993-12-03
申请人： Robert F. Kwasnick , Scott W. Petrick , Lawrence R. Skrenes
发明人： Robert F. Kwasnick , Scott W. Petrick , Lawrence R. Skrenes
IPC分类号： H01L27/12 , H01L27/146 , H01L27/14
CPC分类号： H01L27/12 , H01L27/146
摘要： An x-y-addressed imager assembly includes a common electrode having more than two electrical contact points disposed at selected intervals along each edge of the common electrode that corresponds to a lateral boundary of the imager assembly. The selected intervals are typically about equal in length and not greater than about 12% of the length of the edge of the common electrode. The multiple electrical contacts along the common electrode provide low impedance and low magnetic loop area for signals passing along the common electrode to readout and drive circuits.
摘要翻译： x-y寻址的成像器组件包括具有多于两个电接触点的公共电极，该电接触点沿着对应于成像器组件的横向边界的公共电极的每个边缘以选定的间隔设置。所选择的间隔通常在长度上相等并且不大于公共电极边缘的长度的约12％。沿着公共电极的多个电触点为沿着公共电极到读出和驱动电路的信号提供低阻抗和低磁环面积。

3. 发明授权

US06329848B1 Sample and hold circuits and methods 有权
标题翻译：采样和保持电路和方法
公开(公告)号：US06329848B1
公开(公告)日：2001-12-11
申请号：US09560652
申请日：2000-04-27
申请人： David Maes , Lawrence R. Skrenes
发明人： David Maes , Lawrence R. Skrenes
IPC分类号： G11C2702
CPC分类号： G11C27/024
摘要： Sample and hold circuits and methods to reduce distortion. A signal to be sampled is connected across a capacitor through a field effect device, which field effect device is turned off when the sample voltage across the capacitor is to be held. When the field effect device coupling the sample voltage to the capacitor is turned on, the body and gate voltages of the field effect device are made to have a fixed voltage relative to the voltage being sampled, so that the characteristics of the field effect device are unaffected by signal variations during sampling or between samples. Exemplary embodiments are disclosed.
摘要翻译：采样保持电路和减少失真的方法。要采样的信号通过场效应器件跨过电容器连接，当要保持电容器两端的采样电压时，该场效应器件被截止。当将采样电压耦合到电容器的场效应装置接通时，使场效应装置的主体和栅极电压相对于被采样的电压具有固定电压，使得场效应装置的特性为不受采样期间或采样之间信号变化的影响。公开了示例性实施例。

4. 发明授权

US06426672B1 Means of selecting low noise performance or low power dissipation in the analog front end of a custom integrated circuit 失效
标题翻译：在定制集成电路的模拟前端选择低噪声性能或低功耗的手段
公开(公告)号：US06426672B1
公开(公告)日：2002-07-30
申请号：US08919936
申请日：1997-08-28
申请人： Scott W. Petrick , Lawrence R. Skrenes , Douglas E. Sease , Richard D. Baertsch
发明人： Scott W. Petrick , Lawrence R. Skrenes , Douglas E. Sease , Richard D. Baertsch
IPC分类号： H03K190948
CPC分类号： H03F1/26 , H03F3/45183 , H03F3/72 , H03F2200/372 , H03F2203/45506 , H03F2203/45726
摘要： A signal processing circuit can be used to select between a high bias current and good noise performance or a low bias current and poorer noise performance. The circuit comprises an input device having high impedance and low noise characteristics. A first current source provides a minimal current level through the input device. Additional current sources provide additional current through the input device to improve noise performance of the circuit. The additional current sources can be switched into the circuit when improved noise performance is required, and switched out of the circuit to conserve power when improved noise performance is not required.
摘要翻译：信号处理电路可用于选择高偏置电流和良好的噪声性能或低偏置电流和较差的噪声性能。该电路包括具有高阻抗和低噪声特性的输入装置。第一个电流源通过输入设备提供最小的电流电平。额外的电流源通过输入设备提供额外的电流，以改善电路的噪声性能。当需要改进的噪声性能时，额外的电流源可以切换到电路中，并且在不需要改进的噪声性能时从电路切换以节省功率。

5. 发明授权

US06407770B1 Apparatus and method for detecting defects in a discrete picture element detector circuit 失效
标题翻译：用于检测离散像元检测器电路中的缺陷的装置和方法
公开(公告)号：US06407770B1
公开(公告)日：2002-06-18
申请号：US09377515
申请日：1999-08-19
申请人： Scott A. Bielski , Lawrence R. Skrenes , Yusuf A. Haque
发明人： Scott A. Bielski , Lawrence R. Skrenes , Yusuf A. Haque
IPC分类号： H04N1700
CPC分类号： H04N5/367 , G01R31/2829 , H04N17/002
摘要： A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system. The technique employs test circuits associated with each row driver of the detector. The test circuits are enabled by a test enable signal, and the row driver sequentially enables the rows of the detector, along with the individual test circuits. In a test sequence, output signals from the row test circuits are monitored to identify whether a defect, such as a short circuit, is likely to exist in the row or row driver. The test circuitry adds only minimal area and complexity to the row driver function, providing a high degree of test coverage at a low cost, with minimal likelihood of test circuitry-induced failures.
摘要翻译：描述了一种用于检测诸如数字X射线系统中使用的离散像素检测器等设备中的短路的缺陷的技术。该技术采用与检测器的每行驱动器相关联的测试电路。测试电路通过测试使能信号使能，并且行驱动器依次使能检测器的行以及各个测试电路。在测试序列中，监视来自行测试电路的输出信号，以识别行或行驱动器中是否存在诸如短路的缺陷。测试电路只对行驱动器功能增加了最小的面积和复杂性，从而以低成本提供了高度的测试覆盖率，并且测试电路引起的故障的可能性很小。

6. 发明授权

US5604347A Method and means for compensating for row variable offsets in a large area solid state x-ray detector 失效
标题翻译：用于补偿大面积固态X射线检测器中的行可变偏移的方法和装置
公开(公告)号：US5604347A
公开(公告)日：1997-02-18
申请号：US501800
申请日：1995-07-13
申请人： Scott W. Petrick , Lawrence R. Skrenes , Jean C. Morvan , Paul R. Granfors
发明人： Scott W. Petrick , Lawrence R. Skrenes , Jean C. Morvan , Paul R. Granfors
IPC分类号： G01T1/20 , A61B6/00 , H04N5/32 , H05G1/26 , H05G1/64 , H04N5/35
CPC分类号： H04N5/3658 , H04N5/32 , H05G1/26 , H05G1/64
摘要： Row variable offsets in a large area solid state x-ray detector are compensated for. Initially, a calibration is performed to determine the row variable offsets. The calibration is achieved by measuring the average offset of each row. During normal operation, this offset is compensated for in a converting circuit. The required signal range of the converting circuit is consequently reduced.
摘要翻译：在大面积固态X射线检测器中的行可变偏移被补偿。最初，执行校准以确定行变量偏移。校准通过测量每一行的平均偏移来实现。在正常操作期间，在转换电路中补偿该偏移。因此，转换电路的所需信号范围减小。

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