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    • 1. 发明授权
    • Development of positive-working photoresist compositions
    • 正性光致抗蚀剂组合物的开发
    • US4711836A
    • 1987-12-08
    • US895628
    • 1986-08-11
    • Lawrence Ferreira
    • Lawrence Ferreira
    • G03F7/32G03C5/00G03F7/26
    • G03F7/322
    • Disclosed is an aqueous developing solution containing a quaternary ammonium hydroxide developing agent, and as an additive an effective amount of a select compound which is either 1,3,5-trihydroxy benzene, 4-methylesculetin or a novolak-type resin. The aqueous developing solution is particularly useful in developing an imagewise-exposed layer of a positive-working photoresist composition containing a novolak-type resin and a photosensitive agent. In such application, it has been found that the developing solution more effectively removes the exposed portions of the photoresist composition without leaving a residue of exposed photoresist composition at the interface of the edges of the unexposed portions of the photoresist composition and the oxidized silicon substrate.
    • 公开了含有季铵氢氧化物显影剂的水性显影液,作为添加剂,作为添加剂,可以使用有效量的选自1,3,5-三羟基苯,4-甲基鞘氨醇或酚醛清漆型树脂的化合物。 含水显影液特别可用于显影含有酚醛清漆型树脂和感光剂的正性光致抗蚀剂组合物的成像曝光层。 在这种应用中,已经发现显影溶液更有效地除去光致抗蚀剂组合物的暴露部分,而不在光致抗蚀剂组合物的未曝光部分的边缘与氧化的硅衬底之间的界面处留下曝光的光致抗蚀剂组合物残留物。
    • 10. 发明授权
    • Method of purifying photoacid generators for use in photoresist compositions
    • 光致抗蚀剂组合物中使用的光酸发生剂的纯化方法
    • US06200480B1
    • 2001-03-13
    • US09006409
    • 1998-01-13
    • Lawrence FerreiraSanjay Malik
    • Lawrence FerreiraSanjay Malik
    • B01D1504
    • G03F7/0045B01J41/07B01J45/00
    • The present invention is directed to a process of removing trace acidic impurities from an impure solution of photoacid generating compounds in a solvent, comprising contacting an impure solution of at least one photoacid generating compound containing trace amounts of acidic impurities with an amine-containing ion exchange resin for a sufficient amount of time to remove substantially all of the acidic impurities from the impure solution, thereby producing a pure solution of at least one photoacid generating compounds substantially free of trace acidic impurities. The invention is also directed to a solution of at least one photoacid generating compound substantially free of trace acidic impurities made by the above process.
    • 本发明涉及一种从溶剂中产生光致酸化合物的不纯溶液中除去痕量酸性杂质的方法,包括使含至少一种含有微量酸性杂质的光产酸化合物的不纯溶液与含胺离子交换 树脂足够的时间以从不纯的溶液中除去基本上所有的酸性杂质,从而产生至少一种基本上不含痕量酸性杂质的光产酸化合物的纯溶液。 本发明还涉及至少一种基于上述方法制备的基本上不含微量酸性杂质的光产酸化合物的溶液。