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1. 发明申请

US20140281765A1 MEMORY CARD 审中-公开
标题翻译：存储卡
公开(公告)号：US20140281765A1
公开(公告)日：2014-09-18
申请号：US14289078
申请日：2014-05-28
申请人： Yun-Bo Yang , Young-Jae Jung , Kui-Hyun Ro , Sung-Eun Yun
发明人： Yun-Bo Yang , Young-Jae Jung , Kui-Hyun Ro , Sung-Eun Yun
IPC分类号： G11C29/12
CPC分类号： G11C29/12 , G06F11/27 , G11C29/16 , G11C29/48 , G11C2029/0401
摘要： A memory card includes a memory cell, a connector, a controller, and firmware. The memory cell can switch between a plurality of states. The connector can be connected to an external device and exchange signals including commands and data with the external device. The controller exchanges signals with the connector, analyzes a received signal, and accesses the memory cell to record, retrieve or modify data based on the analysis result. The firmware is located within the controller, controls the operation of the controller, and can be set to a test mode or a user mode. When the firmware receives a test command from the external device and the firmware is set to the test mode, the firmware performs a defect test on the memory cell and transmits the result of the defect test to the external device through the connector.
摘要翻译：存储卡包括存储单元，连接器，控制器和固件。存储单元可以在多个状态之间切换。连接器可以连接到外部设备，并与外部设备交换包括命令和数据的信号。控制器与连接器交换信号，分析接收到的信号，并根据分析结果访问存储单元记录，检索或修改数据。固件位于控制器内，控制控制器的操作，并可设置为测试模式或用户模式。当固件从外部设备接收到测试命令并将固件设置为测试模式时，固件对存储单元进行缺陷测试，并通过连接器将缺陷测试结果发送到外部设备。

2. 发明申请

US20120146673A1 METHOD AND EQUIPMENT FOR TESTING SEMICONDUCTOR APPARATUSES SIMULTANEOUSLY AND CONTINUOUSLY 有权
标题翻译：同时并连续测试半导体器件的方法和设备
公开(公告)号：US20120146673A1
公开(公告)日：2012-06-14
申请号：US13240528
申请日：2011-09-22
申请人： Eun-Sik Kim , Kil-yeon Kim , Yun-bo Yang , Kui-hyun Ro , Heon-gwon Lee , Young-jae Jung
发明人： Eun-Sik Kim , Kil-yeon Kim , Yun-bo Yang , Kui-hyun Ro , Heon-gwon Lee , Young-jae Jung
IPC分类号： G01R31/3187
CPC分类号： G01R31/2851 , G01R31/2607 , G01R31/2855 , G01R31/3187
摘要： A method for testing a plurality of semiconductor apparatuses, the method including mounting a plurality of semiconductor apparatuses on a first test board, wherein the plurality of semiconductor apparatuses include test circuits, loading test software into the test circuits, performing, by using the test circuits, self-tests on the plurality of semiconductor apparatuses based on the test software, and removing the plurality of semiconductor apparatuses, which have completed the self-tests, from the first test board. Upon completion of the loading of the test software, the test software is loaded into test circuits of a plurality of semiconductor apparatuses on a second test board, while the self-tests are performed on the plurality of semiconductor apparatuses on the first test board.
摘要翻译：一种用于测试多个半导体器件的方法，所述方法包括在第一测试板上安装多个半导体器件，其中所述多个半导体器件包括测试电路，将测试软件加载到测试电路中，通过使用测试电路基于测试软件对多个半导体装置进行自检，并且从第一测试板去除完成了自检的多个半导体装置。在完成测试软件的加载之后，在第一测试板上对多个半导体设备执行自检，将测试软件加载到第二测试板上的多个半导体设备的测试电路中。

3. 发明授权

US09000789B2 Method and equipment for testing semiconductor apparatuses simultaneously and continuously 有权
标题翻译：同时连续测试半导体设备的方法和设备
公开(公告)号：US09000789B2
公开(公告)日：2015-04-07
申请号：US13240528
申请日：2011-09-22
申请人： Eun-sik Kim , Kil-yeon Kim , Yun-bo Yang , Kui-hyun Ro , Heon-gwon Lee , Young-jae Jung
发明人： Eun-sik Kim , Kil-yeon Kim , Yun-bo Yang , Kui-hyun Ro , Heon-gwon Lee , Young-jae Jung
IPC分类号： G01R31/3187
CPC分类号： G01R31/2851 , G01R31/2607 , G01R31/2855 , G01R31/3187
摘要： A method for testing a plurality of semiconductor apparatuses, the method including mounting a plurality of semiconductor apparatuses on a first test board, wherein the plurality of semiconductor apparatuses include test circuits, loading test software into the test circuits, performing, by using the test circuits, self-tests on the plurality of semiconductor apparatuses based on the test software, and removing the plurality of semiconductor apparatuses, which have completed the self-tests, from the first test board. Upon completion of the loading of the test software, the test software is loaded into test circuits of a plurality of semiconductor apparatuses on a second test board, while the self-tests are performed on the plurality of semiconductor apparatuses on the first test board.
摘要翻译：一种用于测试多个半导体器件的方法，所述方法包括在第一测试板上安装多个半导体器件，其中所述多个半导体器件包括测试电路，将测试软件加载到测试电路中，通过使用测试电路基于测试软件对多个半导体装置进行自检，并且从第一测试板去除完成了自检的多个半导体装置。在完成测试软件的加载之后，在第一测试板上对多个半导体设备执行自检，将测试软件加载到第二测试板上的多个半导体设备的测试电路中。

4. 发明申请

US20120117430A1 MEMORY CARD 有权
标题翻译：存储卡
公开(公告)号：US20120117430A1
公开(公告)日：2012-05-10
申请号：US13227004
申请日：2011-09-07
申请人： Yun-Bo YANG , Young-Jae JUNG , Kui-Hyun RO , Sung-Eun YUN
发明人： Yun-Bo YANG , Young-Jae JUNG , Kui-Hyun RO , Sung-Eun YUN
IPC分类号： G11C29/12 , G06F11/28
CPC分类号： G11C29/12 , G06F11/27 , G11C29/16 , G11C29/48 , G11C2029/0401
摘要： A memory card includes a memory cell, a connector, a controller, and firmware. The memory cell can switch between a plurality of states. The connector can be connected to an external device and exchange signals including commands and data with the external device. The controller exchanges signals with the connector, analyzes a received signal, and accesses the memory cell to record, retrieve or modify data based on the analysis result. The firmware is located within the controller, controls the operation of the controller, and can be set to a test mode or a user mode. When the firmware receives a test command from the external device and the firmware is set to the test mode, the firmware performs a defect test on the memory cell and transmits the result of the defect test to the external device through the connector.
摘要翻译：存储卡包括存储单元，连接器，控制器和固件。存储单元可以在多个状态之间切换。连接器可以连接到外部设备，并与外部设备交换包括命令和数据的信号。控制器与连接器交换信号，分析接收到的信号，并根据分析结果访问存储单元记录，检索或修改数据。固件位于控制器内，控制控制器的操作，并可设置为测试模式或用户模式。当固件从外部设备接收到测试命令并将固件设置为测试模式时，固件对存储单元进行缺陷测试，并通过连接器将缺陷测试结果发送到外部设备。

5. 发明授权

US08769353B2 Memory card 有权
标题翻译：存储卡
公开(公告)号：US08769353B2
公开(公告)日：2014-07-01
申请号：US13227004
申请日：2011-09-07
申请人： Yun-Bo Yang , Young-Jae Jung , Kui-Hyun Ro , Sung-Eun Yun
发明人： Yun-Bo Yang , Young-Jae Jung , Kui-Hyun Ro , Sung-Eun Yun
IPC分类号： G11C29/00 , G11C29/48 , G11C29/16 , G06F11/27 , G11C29/04
CPC分类号： G11C29/12 , G06F11/27 , G11C29/16 , G11C29/48 , G11C2029/0401
摘要： A memory card includes a memory cell, a connector, a controller, and firmware. The memory cell can switch between a plurality of states. The connector can be connected to an external device and exchange signals including commands and data with the external device. The controller exchanges signals with the connector, analyzes a received signal, and accesses the memory cell to record, retrieve or modify data based on the analysis result. The firmware is located within the controller, controls the operation of the controller, and can be set to a test mode or a user mode. When the firmware receives a test command from the external device and the firmware is set to the test mode, the firmware performs a defect test on the memory cell and transmits the result of the defect test to the external device through the connector.
摘要翻译：存储卡包括存储单元，连接器，控制器和固件。存储单元可以在多个状态之间切换。连接器可以连接到外部设备，并与外部设备交换包括命令和数据的信号。控制器与连接器交换信号，分析接收到的信号，并根据分析结果访问存储单元记录，检索或修改数据。固件位于控制器内，控制控制器的操作，并可设置为测试模式或用户模式。当固件从外部设备接收到测试命令并将固件设置为测试模式时，固件对存储单元进行缺陷测试，并通过连接器将缺陷测试结果发送到外部设备。

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