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    • 7. 发明授权
    • System and method using eddy currents to acquire positional data
relating to fibers in a composite
    • 使用涡流的系统和方法来获取与复合材料中的纤维有关的位置数据
    • US5717332A
    • 1998-02-10
    • US787650
    • 1997-01-23
    • Kristina Helena Valborg HedengrenRichard Oscar McCary
    • Kristina Helena Valborg HedengrenRichard Oscar McCary
    • G01B7/26G01N27/90G01N27/72
    • G01N27/9046G01B7/105G01B7/26
    • A system and method for determining fiber-depth of at least one layer of reinforcing fibers within an electrically conductive workpiece is provided. The system comprises an eddy current probe having one or more eddy current elements for generating a respective electrical signal indicative of a spacing with respect to a predetermined section of the reinforcing fibers. A signal processor is connected to the eddy current probe to receive and to process each spacing-indication electrical signal so as to generate data indicative of fiber-depth of the predetermined section relative to a workpiece surface. A display device may be connected to the signal processor to provide visual indicia representative of the fiber depth. Further a controller may be connected to receive and store the fiber-depth data which can be used by a machining device for selectively removing material from the workpiece surface, in accordance with the stored fiber-depth data. The eddy current elements may form a substantially colinear row of eddy current elements each cooperating to determine the actual fiber axis orientation of reinforcing fibers within the workpiece.
    • 提供了一种用于确定导电工件内至少一层增强纤维的纤维深度的系统和方法。 该系统包括具有一个或多个涡流元件的涡流探针,用于产生指示相对于增强纤维的预定部分的间隔的相应电信号。 信号处理器连接到涡流探头以接收和处理每个间隔指示电信号,以产生指示预定部分相对于工件表面的纤维深度的数据。 显示设备可以连接到信号处理器以提供表示光纤深度的视觉标记。 此外,控制器可以被连接以接收和存储可以由加工装置使用的光纤深度数据,用于根据存储的光纤深度数据选择性地从工件表面去除材料。 涡流元件可以形成基本上共线的涡流元件,每个涡流元件配合以确定加工纤维在工件内的实际纤维轴取向。
    • 8. 发明授权
    • System and method for normalizing and calibrating a sensor array
    • 传感器阵列的归一化和校准的系统和方法
    • US06252393B1
    • 2001-06-26
    • US09330108
    • 1999-06-10
    • Kristina Helena Valborg Hedengren
    • Kristina Helena Valborg Hedengren
    • G01R3500
    • G01N27/9086G01B21/042
    • The invention provides a system and method for normalizing and calibrating a sensor array. The sensor array can comprise differential element sensors, such as for example eddy current sensors, or absolute sensors. A single test specimen is used to normalize and calibrate the sensor array using one or more scans of the test specimen. Notably, only one alignment of the sensor array to the test specimen is required. The test specimen is preferably made of the same or similar type of material as the part to be tested and is of a similar geometric shape that can have a simple flat surface or a more complex surface. A linear feature and several notches are machined into the surface of the specimen by using, for example, electro-discharge machining methods, to provide the necessary signals when scanned by the sensor array. Signals from the linear feature on the test specimen are used to remove any bias and to normalize the dynamic ranges of all of the sensors in the array. Signals from the notches are used to establish the gain settings for the sensors in the array.
    • 本发明提供了一种用于归一化和校准传感器阵列的系统和方法。 传感器阵列可以包括差分元件传感器,例如涡流传感器或绝对传感器。 使用单个测试样本使用测试样本的一次或多次扫描对传感器阵列进行归一化和校准。 值得注意的是,只需要将传感器阵列对准测试样本。 试样优选由与被测试部件相同或相似类型的材料制成,并且具有类似的几何形状,其可以具有简单的平坦表面或更复杂的表面。 通过使用例如放电加工方法将线性特征和多个凹口加工到样品的表面中,以在通过传感器阵列扫描时提供必要的信号。 来自测试样本上的线性特征的信号用于消除任何偏差并使阵列中所有传感器的动态范围归一化。 来自凹口的信号用于建立阵列中传感器的增益设置。