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    • 1. 发明申请
    • Optical encoder
    • 光学编码器
    • US20050007598A1
    • 2005-01-13
    • US10915348
    • 2004-08-11
    • Kou Ishizuka
    • Kou Ishizuka
    • G01D5/38G02B5/18G02B5/30G01B9/02
    • G01D5/38
    • A light beam emitted from a semiconductor-laser light source is projected onto a diffraction-grating scale after passing through a collimator lens, a beam splitter and a central portion of an annular reflection grating. Two diffracted light beams reflected from the diffraction-grating scale are projected onto the annular reflection grating. The annular reflection grating diffracts the light beams projected onto all portions thereon to a substantially original direction to be projected onto and diffracted from the same position on the diffraction-grating scale. The diffracted light beams are superposed and the resultant light beam is returned to the beam splitter. The light beam is guided by the beam splitter in a direction different from the semiconductor-laser light source, and is detected by a photosensor as an interference light beam. Even if the oscillation wavelength of the semiconductor-laser light source changes, for example, due to a change in the temperature environment, to change the diffraction angles of the diffracted light beams, the light beams are diffracted with original diffraction angles by the annular reflection grating, the position of rediffraction by the diffraction-grating scale and the state of emitted light beams are invariable. Hence, the state of interference is stable.
    • 从半导体激光光源射出的光束经过准直透镜,分束器和环形反射光栅的中心部分投影到衍射光栅刻度上。 从衍射光栅标尺反射的两个衍射光束被投射到环形反射光栅上。 环形反射光栅将投影到其上的所有部分上的光束衍射到基本上原始的方向,以投影到衍射光栅标尺上的相同位置并衍射。 衍射光束被重叠,所得到的光束返回到分束器。 光束由分束器沿与半导体激光光源不同的方向引导,并被光电传感器检测为干涉光束。 即使半导体激光光源的振荡波长例如由于温度环境的变化而变化,为了改变衍射光束的衍射角,光束以原始的衍射角被环形反射衍射 光栅,通过衍射光栅标度的再衍射位置和发射光束的状态是不变的。 因此,干扰状态是稳定的。
    • 3. 发明授权
    • Rotation detector and controller for detecting rotation information
using a grating interference system
    • 旋转检测器和控制器,用于使用光栅干涉系统检测旋转信息
    • US5917182A
    • 1999-06-29
    • US597102
    • 1996-02-06
    • Kou Ishizuka
    • Kou Ishizuka
    • G01B11/26G01D5/38G01B11/14
    • G01D5/38
    • In an apparatus for detecting information on the rotation of an object using a grating interference system, the present invention provides a rotation detecting apparatus, which can be sufficiently miniaturized even when using another rotation information detecting section at the same time, and an apparatus for controlling the rotation using the same. The apparatus has a first detecting device for detecting by making the diffracted light from the diffraction grating interfere to detect rotation information of the object, a second detecting device for detecting the light from the predetermined data recording section to detect rotation information of the object, and a light beam illuminating device common to the first and second detecting means for illuminating the diffraction grating and the predetermined data recording section together.
    • 在使用光栅干涉系统检测物体的旋转信息的装置中,本发明提供一种旋转检测装置,即使在同时使用其他旋转信息检测部的情况下也能够充分地小型化, 旋转使用相同。 该装置具有用于通过使来自衍射光栅的衍射光干涉来检测物体的旋转信息进行检测的第一检测装置,用于检测来自预定数据记录部分的光以检测物体的旋转信息的第二检测装置,以及 第一和第二检测装置共用的光束照明装置,用于将衍射光栅和预定数据记录部分一起照射。
    • 4. 发明授权
    • Optical displacement measuring apparatus including a light-emitting
element and an adjacent ball lens
    • 光学位移测量装置包括发光元件和相邻的球透镜
    • US5880839A
    • 1999-03-09
    • US949193
    • 1997-10-14
    • Kou IshizukaYasushi Kaneda
    • Kou IshizukaYasushi Kaneda
    • G01D5/38G01B11/00G01D5/36G01B9/02
    • G01D5/38
    • An optical displacement detecting apparatus is provided for detecting information on a relative displacement with respect to an object having a diffraction grating. The apparatus includes a light-emitting element for emitting a diverging light beam, a ball lens for converting the diverging light beam from the light-emitting element into a nearly collimated beam, a grating interference optical system for using the light beam from the ball lens to finally form interference light in such a form that two diffracted light beams from the diffraction grating are coupled, and a light detecting element for detecting the interference light from the grating interference optical system, wherein the relative displacement information with respect to the object is attained from a periodic signal from the light detecting element.
    • 提供一种光学位移检测装置,用于检测关于具有衍射光栅的物体的相对位移的信息。 该装置包括用于发射发散光束的发光元件,用于将发光元件的发散光束转换成几乎准直的光束的球透镜,用于使用来自球透镜的光束的光栅干涉光学系统 最终以衍射光栅的两个衍射光束耦合的形式形成干涉光,以及用于检测来自光栅干涉光学系统的干涉光的光检测元件,其中获得相对于物体的相对位移信息 来自光检测元件的周期信号。
    • 5. 发明授权
    • Optical encoder
    • 光学编码器
    • US06999179B2
    • 2006-02-14
    • US10915348
    • 2004-08-11
    • Kou Ishizuka
    • Kou Ishizuka
    • G01B9/02G01D5/34
    • G01D5/38
    • A light beam emitted from a semiconductor-laser light source is projected onto a diffraction-grating scale after passing through a collimator lens, a beam splitter and a central portion of an annular reflection grating. Two diffracted light beams reflected from the diffraction-grating scale are projected onto the annular reflection grating. The annular reflection grating diffracts the light beams projected onto all portions thereon to a substantially original direction to be projected onto and diffracted from the same position on the diffraction-grating scale. The diffracted light beams are superposed and the resultant light beam is returned to the beam splitter. The light beam is guided by the beam splitter in a direction different from the semiconductor-laser light source, and is detected by a photosensor as an interference light beam. Even if the oscillation wavelength of the semiconductor-laser light source changes, for example, due to a change in the temperature environment, to change the diffraction angles of the diffracted light beams, the light beams are diffracted with original diffraction angles by the annular reflection grating, the position of rediffraction by the diffraction-grating scale and the state of emitted light beams are invariable. Hence, the state of interference is stable.
    • 从半导体激光光源射出的光束经过准直透镜,分束器和环形反射光栅的中心部分投影到衍射光栅刻度上。 从衍射光栅标尺反射的两个衍射光束被投射到环形反射光栅上。 环形反射光栅将投影到其上的所有部分上的光束衍射到基本上原始的方向上,以投射到衍射光栅标尺上的相同位置并衍射。 衍射光束被重叠,所得到的光束返回到分束器。 光束由分束器沿与半导体激光光源不同的方向引导,并被光电传感器检测为干涉光束。 即使半导体激光光源的振荡波长例如由于温度环境的变化而变化,为了改变衍射光束的衍射角,光束以原始的衍射角被环形反射衍射 光栅,通过衍射光栅标度的再衍射位置和发射光束的状态是不变的。 因此,干扰状态是稳定的。
    • 7. 发明授权
    • Displacement information detection apparatus, scale used in the
apparatus, and drive apparatus using the apparatus
    • 位移信息检测装置,装置中使用的标尺,以及使用该装置的驱动装置
    • US5663794A
    • 1997-09-02
    • US601694
    • 1996-02-15
    • Kou Ishizuka
    • Kou Ishizuka
    • F02B75/02G01B11/00G01D5/36G01D5/38G61B9/02
    • G01D5/38F02B2075/027
    • An apparatus for detecting displacement information is disclosed. The apparatus is provided with a scale arranged on the side of an object of which relative displacement information is to be detected, a periodic signal generation diffraction grating formed at a predetermined pitch, and a predetermined data recording portion formed independently of the periodic signal generation and diffraction grating for detecting displacement information, a first detection system for irradiating a light beam onto the periodic signal generation diffraction grating to generate diffracted light, the first detection system forming a periodic signal corresponding to a displacement relative to the scale by detecting interference light of the diffracted light generated by the periodic signal generation diffraction grating, and a second detection system for optically detecting the predetermined data recording portion. The predetermined data recording portion also has a diffraction grating.
    • 公开了一种用于检测位移信息的装置。 该装置设置有布置在要检测相对位移信息的对象侧的刻度,以预定间距形成的周期性信号生成衍射光栅和独立于周期性信号产生形成的预定数据记录部分,以及 用于检测位移信息的衍射光栅,用于将光束照射到周期性信号产生衍射光栅上以产生衍射光的第一检测系统,所述第一检测系统通过检测所述衍射光的干涉光来形成对应于相对于标尺的位移的周期信号 由周期信号产生衍射光栅产生的衍射光,以及用于光学检测预定数据记录部分的第二检测系统。 预定数据记录部分也具有衍射光栅。
    • 10. 发明授权
    • Optical encoder
    • 光学编码器
    • US06831267B2
    • 2004-12-14
    • US09780433
    • 2001-02-12
    • Kou Ishizuka
    • Kou Ishizuka
    • H01J314
    • G01D5/38
    • A light beam emitted from a semiconductor-laser light source is projected onto a diffraction-grating scale after passing through a collimator lens, a beam splitter and a central portion of an annular reflection grating. Two diffracted light beams reflected from the diffraction-grating scale are projected onto the annular reflection grating. The annular reflection grating diffracts the light beams projected onto all portions thereon to a substantially original direction to be projected onto and diffracted from the same position on the diffraction-grating scale. The diffracted light beams are superposed and the resultant light beam is returned to the beam splitter. The light beam is guided by the beam splitter in a direction different from the semiconductor-laser light source, and is detected by a photosensor as an interference light beam. Even if the oscillation wavelength of the semiconductor-laser light source changes, for example, due to a change in the temperature environment, to change the diffraction angles of the diffracted light beams, the light beams are diffracted with original diffraction angles by the annular reflection grating, the position of rediffraction by the diffraction-grating scale and the state of emitted light beams are invariable. Hence, the state of interference is stable.
    • 从半导体激光光源射出的光束经过准直透镜,分束器和环形反射光栅的中心部分投影到衍射光栅刻度上。 从衍射光栅标尺反射的两个衍射光束被投射到环形反射光栅上。 环形反射光栅将投影到其上的所有部分上的光束衍射到基本上原始的方向上,以投影到衍射光栅标尺上的相同位置并衍射。 衍射光束被重叠,所得到的光束返回到分束器。 光束由分束器沿与半导体激光光源不同的方向引导,并被光电传感器检测为干涉光束。 即使半导体激光光源的振荡波长例如由于温度环境的变化而变化,为了改变衍射光束的衍射角,光束以原始的衍射角被环形反射衍射 光栅,通过衍射光栅标度的再衍射位置和发射光束的状态是不变的。 因此,干扰状态是稳定的。