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1. 发明授权

US08022721B2 Conveyor-based memory-module tester with elevators distributing moving test motherboards among parallel conveyors for testing 有权
公开(公告)号：US08022721B2
公开(公告)日：2011-09-20
申请号：US13089108
申请日：2011-04-18
申请人： Ramon S. Co , Kevin J. Sun
发明人： Ramon S. Co , Kevin J. Sun
IPC分类号： G01R31/20
CPC分类号： G11C29/56 , B65G47/71 , G11C5/04 , G11C29/56016
摘要： A conveyor-stack test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. A loader-unloader removes tested memory modules from test sockets on the motherboards and inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader-unloader to an elevator. The elevator raises or lowers the motherboards to different levels in a conveyor stack with multiple levels of conveyors each with many test stations. The motherboards move along conveyors in the conveyor stack until reaching test stations. A retractable connector from the test station extends to make contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns.

2. 发明申请

US20110050268A1 Parking Structure Memory-Module Tester that Moves Test Motherboards Along a Highway for Remote Loading/Unloading 有权
公开(公告)号：US20110050268A1
公开(公告)日：2011-03-03
申请号：US12941196
申请日：2010-11-08
申请人： Ramon S. Co , Kevin J. Sun
发明人： Ramon S. Co , Kevin J. Sun
IPC分类号： G01R31/20
CPC分类号： G11C29/56 , G11C29/56016
摘要： A parking-structure test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. An unloader removes tested memory modules from test sockets on the motherboards, and a loader inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader to a parking and testing structure. An elevator raises or lowers the motherboards to different parking levels in the parking and testing structure. The motherboards move from the elevator to test stations on the parking level. A retractable connector from the test station makes contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns via the elevator and conveyors.

3. 发明申请

US20100213027A1 Conveyor-Based Memory-Module Tester with Elevators Distributing Moving Test Motherboards Among Parallel Conveyors For Testing 有权
标题翻译：基于输送机的存储模块测试仪与电梯分布平行输送机中的移动测试主板进行测试
公开(公告)号：US20100213027A1
公开(公告)日：2010-08-26
申请号：US12392387
申请日：2009-02-25
申请人： Ramon S. Co , Kevin J. Sun
发明人： Ramon S. Co , Kevin J. Sun
IPC分类号： B65G37/00 , G06F11/07
CPC分类号： G11C29/56 , B65G47/71 , G11C5/04 , G11C29/56016
摘要： A conveyor-stack test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. A loader-unloader removes tested memory modules from test sockets on the motherboards and inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader-unloader to an elevator. The elevator raises or lowers the motherboards to different levels in a conveyor stack with multiple levels of conveyors each with many test stations. The motherboards move along conveyors in the conveyor stack until reaching test stations. A retractable connector from the test station extends to make contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns.
摘要翻译：输送机堆叠测试系统具有测试内存模块的主板。主板不是静止的，而是位于沿传送带移动的活动托盘内。装载机卸载程序从主板上的测试插槽中删除测试的内存模块，并使用机械臂将未经测试的内存模块插入主板。输送机将主板从装载机卸载机运送到电梯。电梯将主板升高或降低到输送机堆叠中的不同水平，多层输送机各有许多测试站。主板沿着输送机堆栈中的输送机移动，直至到达测试站。来自测试站的可伸缩连接器延伸以与主板连接器接触，以对主板供电，然后测试存储器模块。测试结果从测试台传送到主机控制器，主机控制器指示装载机卸载机在主板返回后对测试的内存模块进行排序。

4. 发明授权

US08581614B2 Parking structure memory-module tester that moves test motherboards along a highway for remote loading/unloading 有权
标题翻译：停车结构记忆模块测试仪，沿着高速公路移动测试主板用于远程加载/卸载
公开(公告)号：US08581614B2
公开(公告)日：2013-11-12
申请号：US13210284
申请日：2011-08-15
申请人： Ramon S. Co , Kevin J. Sun
发明人： Ramon S. Co , Kevin J. Sun
IPC分类号： G01R31/20
CPC分类号： G11C29/56 , G11C29/56016
摘要： A parking-structure test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. An unloader removes tested memory modules from test sockets on the motherboards, and a loader inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader to a parking and testing structure. An elevator raises or lowers the motherboards to different parking levels in the parking and testing structure. The motherboards move from the elevator to test stations on the parking level. A retractable connector from the test station makes contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns via the elevator and conveyors.
摘要翻译：停车结构测试系统具有测试内存模块的主板。主板不是静止的，而是位于沿传送带移动的活动托盘内。卸载器从主板上的测试插槽中删除测试的内存模块，并且加载器使用机械臂将未测试的内存模块插入主板。输送机将主板从装载机运送到停车和测试结构。电梯将主板升高或降低到停车和测试结构中的不同停车位。主板从电梯移动到停车位的测试站。来自测试台的可伸缩连接器与母板连接器接触，为主板供电，然后测试内存模块。测试结果从测试台传送到主机控制器，主机控制器指示装载机卸载机在主板通过电梯和输送机返回后对被测试的存储器模块进行排序。

5. 发明申请

US20110298486A1 Parking Structure Memory-Module Tester that Moves Test Motherboards Along a Highway for Remote Loading/Unloading 有权
标题翻译：停车结构记忆模块测试仪，沿高速公路移动测试主板用于远程装载/卸载
公开(公告)号：US20110298486A1
公开(公告)日：2011-12-08
申请号：US13210284
申请日：2011-08-15
申请人： Ramon S. Co , Kevin J. Sun
发明人： Ramon S. Co , Kevin J. Sun
IPC分类号： G01R31/20
CPC分类号： G11C29/56 , G11C29/56016
摘要： A parking-structure test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. An unloader removes tested memory modules from test sockets on the motherboards, and a loader inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader to a parking and testing structure. An elevator raises or lowers the motherboards to different parking levels in the parking and testing structure. The motherboards move from the elevator to test stations on the parking level. A retractable connector from the test station makes contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns via the elevator and conveyors.
摘要翻译：停车结构测试系统具有测试内存模块的主板。主板不是静止的，而是位于沿传送带移动的活动托盘内。卸载器从主板上的测试插槽中删除测试的内存模块，并且加载器使用机械臂将未测试的内存模块插入主板。输送机将主板从装载机运送到停车和测试结构。电梯将主板升高或降低到停车和测试结构中的不同停车位。主板从电梯移动到停车位的测试站。来自测试台的可伸缩连接器与母板连接器接触，为主板供电，然后测试内存模块。测试结果从测试台传送到主机控制器，主机控制器指示装载机卸载机在主板通过电梯和输送机返回后对被测试的存储器模块进行排序。

6. 发明申请

US20110193585A1 CONVEYOR-BASED MEMORY-MODULE TESTER WITH ELEVATORS DISTRIBUTING MOVING TEST MOTHERBOARDS AMONG PARALLEL CONVEYORS FOR TESTING 有权
标题翻译：基于输送机的记忆模块测试仪与电梯分布运动测试母机并行输送机进行测试
公开(公告)号：US20110193585A1
公开(公告)日：2011-08-11
申请号：US13089108
申请日：2011-04-18
申请人： Ramon S. Co , Kevin J. Sun
发明人： Ramon S. Co , Kevin J. Sun
IPC分类号： G01R31/00
CPC分类号： G11C29/56 , B65G47/71 , G11C5/04 , G11C29/56016
摘要： A conveyor-stack test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. A loader-unloader removes tested memory modules from test sockets on the motherboards and inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader-unloader to an elevator. The elevator raises or lowers the motherboards to different levels in a conveyor stack with multiple levels of conveyors each with many test stations. The motherboards move along conveyors in the conveyor stack until reaching test stations. A retractable connector from the test station extends to make contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns.
摘要翻译：输送机堆叠测试系统具有测试内存模块的主板。主板不是静止的，而是位于沿传送带移动的活动托盘内。装载机卸载程序从主板上的测试插槽中删除测试的内存模块，并使用机械臂将未测试的内存模块插入主板。输送机将主板从装载机卸载机运送到电梯。电梯将主板升高或降低到输送机堆叠中的不同水平，多层输送机各有许多测试站。主板沿着输送机堆栈中的输送机移动，直至到达测试站。来自测试台的可伸缩连接器延伸以与母板连接器接触，以对主板供电，然后测试存储器模块。测试结果从测试台传送到主机控制器，主机控制器指示装载机卸载机在主板返回后对测试的内存模块进行排序。

7. 发明授权

US07960992B2 Conveyor-based memory-module tester with elevators distributing moving test motherboards among parallel conveyors for testing 有权
标题翻译：基于输送机的记忆模块测试仪，用于在平行输送机中分配移动测试母板的电梯进行测试
公开(公告)号：US07960992B2
公开(公告)日：2011-06-14
申请号：US12392387
申请日：2009-02-25
申请人： Ramon S. Co , Kevin J. Sun
发明人： Ramon S. Co , Kevin J. Sun
IPC分类号： G01R31/20
CPC分类号： G11C29/56 , B65G47/71 , G11C5/04 , G11C29/56016
摘要： A conveyor-stack test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. A loader-unloader removes tested memory modules from test sockets on the motherboards and inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader-unloader to an elevator. The elevator raises or lowers the motherboards to different levels in a conveyor stack with multiple levels of conveyors each with many test stations. The motherboards move along conveyors in the conveyor stack until reaching test stations. A retractable connector from the test station extends to make contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns.
摘要翻译：输送机堆叠测试系统具有测试内存模块的主板。主板不是静止的，而是位于沿传送带移动的活动托盘内。装载机卸载程序从主板上的测试插槽中删除测试的内存模块，并使用机械臂将未测试的内存模块插入主板。输送机将主板从装载机卸载机运送到电梯。电梯将主板升高或降低到输送机堆叠中的不同水平，多层输送机各有许多测试站。主板沿着输送机堆栈中的输送机移动，直至到达测试站。来自测试台的可伸缩连接器延伸以与母板连接器接触，以对主板供电，然后测试存储器模块。测试结果从测试台传送到主机控制器，主机控制器指示装载机卸载机在主板返回后对测试的内存模块进行排序。

8. 发明授权

US07884631B2 Parking structure memory-module tester that moves test motherboards along a highway for remote loading/unloading 有权
标题翻译：停车结构记忆模块测试仪，沿着高速公路移动测试主板用于远程加载/卸载
公开(公告)号：US07884631B2
公开(公告)日：2011-02-08
申请号：US12392401
申请日：2009-02-25
申请人： Ramon S. Co , Kevin J. Sun
发明人： Ramon S. Co , Kevin J. Sun
IPC分类号： G01R31/02
CPC分类号： G11C29/56 , G11C29/56016
摘要： A parking-structure test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. An unloader removes tested memory modules from test sockets on the motherboards, and a loader inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader to a parking and testing structure. An elevator raises or lowers the motherboards to different parking levels in the parking and testing structure. The motherboards move from the elevator to test stations on the parking level. A retractable connector from the test station makes contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns via the elevator and conveyors.
摘要翻译：停车结构测试系统具有测试内存模块的主板。主板不是静止的，而是位于沿传送带移动的活动托盘内。卸载器从主板上的测试插槽中删除测试的内存模块，并且加载器使用机械臂将未测试的内存模块插入主板。输送机将主板从装载机运送到停车和测试结构。电梯将主板升高或降低到停车和测试结构中的不同停车位。主板从电梯移动到停车位的测试站。来自测试台的可伸缩连接器与母板连接器接触，为主板供电，然后测试内存模块。测试结果从测试台传送到主机控制器，主机控制器指示装载机卸载机在主板通过电梯和输送机返回后对被测试的存储器模块进行排序。

9. 发明申请

US20100218050A1 Parking Structure Memory-Module Tester that Moves Test Motherboards Along a Highway for Remote Loading/Unloading 有权
标题翻译：停车结构记忆模块测试仪，沿高速公路移动测试主板用于远程装载/卸载
公开(公告)号：US20100218050A1
公开(公告)日：2010-08-26
申请号：US12392401
申请日：2009-02-25
申请人： Ramon S. Co , Kevin J. Sun
发明人： Ramon S. Co , Kevin J. Sun
IPC分类号： G06F11/273
CPC分类号： G11C29/56 , G11C29/56016
摘要： A parking-structure test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. An unloader removes tested memory modules from test sockets on the motherboards, and a loader inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader to a parking and testing structure. An elevator raises or lowers the motherboards to different parking levels in the parking and testing structure. The motherboards move from the elevator to test stations on the parking level. A retractable connector from the test station makes contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns via the elevator and conveyors.
摘要翻译：停车结构测试系统具有测试内存模块的主板。主板不是静止的，而是位于沿传送带移动的活动托盘内。卸载器从主板上的测试插槽中删除测试的内存模块，并且加载器使用机械臂将未测试的内存模块插入主板。输送机将主板从装载机运送到停车和测试结构。电梯将主板升高或降低到停车和测试结构中的不同停车位。主板从电梯移动到停车位的测试站。来自测试台的可伸缩连接器与母板连接器接触，为主板供电，然后测试内存模块。测试结果从测试台传送到主机控制器，主机控制器指示装载机卸载机在主板通过电梯和输送机返回后对被测试的存储器模块进行排序。

10. 发明授权

US08022720B2 Parking structure memory-module tester that moves test motherboards along a highway for remote loading/unloading 有权
公开(公告)号：US08022720B2
公开(公告)日：2011-09-20
申请号：US12941196
申请日：2010-11-08
申请人： Ramon S. Co , Kevin J. Sun
发明人： Ramon S. Co , Kevin J. Sun
IPC分类号： G01R31/02
CPC分类号： G11C29/56 , G11C29/56016
摘要： A parking-structure test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. An unloader removes tested memory modules from test sockets on the motherboards, and a loader inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader to a parking and testing structure. An elevator raises or lowers the motherboards to different parking levels in the parking and testing structure. The motherboards move from the elevator to test stations on the parking level. A retractable connector from the test station makes contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns via the elevator and conveyors.

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