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1. 发明授权

US5822218A Systems, methods and computer program products for prediction of defect-related failures in integrated circuits 失效
标题翻译：用于预测集成电路中缺陷相关故障的系统，方法和计算机程序产品
公开(公告)号：US5822218A
公开(公告)日：1998-10-13
申请号：US703518
申请日：1996-08-27
申请人： Mohamed S. Moosa , Kelvin F. Poole
发明人： Mohamed S. Moosa , Kelvin F. Poole
IPC分类号： G01R31/3183 , G06F17/50
CPC分类号： G01R31/31835
摘要： Systems, methods and computer program products for predicting defect-related failures in integrated circuits produced by an integrated circuit fabrication process identify objects in a circuit layout for the integrated circuit design, each object having a location in the circuit layout and a reliability connectivity in the integrated circuit design. Sample object defects are generated for the identified objects, each sample object defect representing a defect produced in an object by the integrated circuit fabrication process and having a defect magnitude associated therewith. An accelerated life defect influence model is identified for each sample object defect, relating the lifetime of an object to the defect magnitude of a defect in the object. Sample object lifetimes are generated from the defect magnitudes associated with the sample object defects according to the corresponding identified accelerated life defect influence models. A prediction of the reliability of integrated circuits is generated from the sample object lifetimes according to the reliability connectivity of the associated objects in the integrated circuit design. Preferably, the accelerated life defect influence models include log-linear regression models, which may include deterministic object lifetime functions, each relating the defect magnitude of the at least one sample object defect to one object lifetime value, and log-linear object lifetime distributions, each relating the defect magnitude of a sample object defect to a plurality of object lifetime values.
摘要翻译：用于预测由集成电路制造过程产生的集成电路中的缺陷相关故障的系统，方法和计算机程序产品识别用于集成电路设计的电路布局中的对象，每个对象在电路布局中具有位置，并且在集成电路设计。针对所识别的对象产生样本对象缺陷，每个样本对象缺陷表示通过集成电路制造工艺在对象中产生的缺陷并且具有与其相关联的缺陷量级。针对每个样本对象缺陷，识别加速生命缺陷影响模型，将对象的生命周期与对象缺陷的缺陷大小相关联。根据相应的识别的加速寿命缺陷影响模型，从与样本对象缺陷相关的缺陷量产生样本对象的生命周期。根据集成电路设计中的相关对象的可靠性连接性，从采样对象的寿命产生集成电路的可靠性的预测。优选地，加速寿命缺陷影响模型包括对数线性回归模型，其可以包括确定性对象寿命函数，每个函数将至少一个样本对象缺陷的缺陷大小与一个对象寿命值相关联，以及对数线性对象寿命分布，每个将样本对象缺陷的缺陷大小与多个对象寿命值相关联。

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