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1. 发明专利

GB2538125B Hard x-ray photoelectron spectroscopy apparatus 未知
公开(公告)号：GB2538125B
公开(公告)日：2017-11-22
申请号：GB201522029
申请日：2015-12-15
申请人： KEISUKE KOBAYASHI , YOSHIKO KOBAYASHI
发明人： KEISUKE KOBAYASHI , YOSHIKO KOBAYASHI
IPC分类号： G01N23/227
摘要： A hard X-ray photoelectron spectroscopy apparatus comprises an X-ray source, an analyzer, a sample manipulator, an analysis chamber, and vacuum evacuation systems, wherein, in a three-dimensional space defined by a XYZ rectangular coordinate axis system, a plate-like sample is arranged to be rotatable around the Z-axis by said sample manipulator (2), wherein said X-ray source comprises an electron gun (3b) which accelerates and focuses electrons, a target which is irradiated with the electrons accelerated and focused by the electron gun to generate an X-ray, monochromater crystal assembly, wherein the monochromater crystal assembly meets the Bragg condition of X-ray diffraction in X-Y plane to diffract/reflect and monochromatize the X-ray generated in said target and extract characteristic X-rays only, and on the other hand, the electron-beam-irradiation position on the target-center of the monochromater crystal assembly-center of the sample is arranged on the Rowland circle to minimize focusing aberration to the sample, the monochromater crystal assembly is located on a circle having a radius twice as large as that of the Rowland circle in a X-Y plane, preferably electron-beam-irradiation position on said target and the center of the sample are located on each of two focuses of an ellipse coming in contact with said Rowland circle in the center of the monochromater crystal assembly, said monochromater crystal assembly has a toroidal surface in Z axial direction acquired by rotating said ellipse coming in contact with said Rowland circle around a straight line connecting the electron-beam-irradiation position on said target and the center of the sample, and, a vacuum vessel for installing these components, wherein the monochromater crystal assembly used for monochromatization with diffraction and reflection of said X-ray source is located on the Rowland circle together with said target and said sample to meet the condition that the dispersed X-ray beam concentrates on the surface of the sample with the minimum aberration, wherein said Rowland circle is located to be orthogonal to the surface of the sample, wherein an optical axis of said analyzer is placed to be perpendicular (in X axial direction) to the incident direction (in Y axial direction) of the X-ray or within a range of ±36 degree angle in a X-Y plane and within a range of ±49 degree angle in a X-Z plane, wherein the sample is such that said X-ray diffracted and reflected by a reflection surface is located on focus positions on the surface of said sample and is obliquely incident on the surface of said sample, so that the spot of said X-ray elongatedly extends along a line in substantially parallel to Y axis (substantially perpendicular to X axis), and wherein an aperture of a slit provided at the entrance of said analyzer is arranged in parallel to a direction where said X-ray spot on the sample surface elongatedly extends.

2. 发明专利

GB2538125A Hard x-ray photoelectron spectroscopy apparatus 未知
公开(公告)号：GB2538125A
公开(公告)日：2016-11-09
申请号：GB201522029
申请日：2015-12-15
申请人： KEISUKE KOBAYASHI , YOSHIKO KOBAYASHI
发明人： KEISUKE KOBAYASHI , YOSHIKO KOBAYASHI
IPC分类号： G01N23/227
摘要： A hard X-ray photoelectron spectroscopy apparatus provides separate source and analysis vacuum chambers to reduce the size of the apparatus, and comprises an X-ray source, an analyzer 6, sample manipulator 2, an analysis chamber 14, and vacuum evacuation systems; wherein a plate-like sample 5 is arranged to be rotatable around one axis by said manipulator; wherein said source comprises an electron gun 3b, a target 7 irradiated with the electrons to generate X-rays 103, monochromator crystal assembly 9 to monochromatise the X-rays and extract characteristic X-rays 105 only, said monochromator has a toroidal surface, and a vacuum vessel for installing these components; wherein the monochromator is located on the Rowland circle with said target and said sample such that the dispersed X-ray beam 105 concentrates on the sample surface 7 with minimum aberration; wherein said Rowland circle is located to be orthogonal to the surface of the sample; wherein an optical axis of said analyzer 6 is placed to be substantially perpendicular to the incident direction of the X-rays 105; wherein the sample is located such that said X-rays are obliquely incident on the surface of said sample.

3. 发明专利

JP2007020670A Assembly puzzle 有权
标题翻译：组装式PUZZLE
公开(公告)号：JP2007020670A
公开(公告)日：2007-02-01
申请号：JP2005203829
申请日：2005-07-13
申请人： Goshu Keiki Kogyo Kk , Shigeru Jinno , Keisuke Kobayashi , 啓佑小林 , 江州計器工業株式会社 , 茂神野
发明人： JINNO SHIGERU , KOBAYASHI KEISUKE , FUJIMOTO KOJI , NAKAYAMA TAKAO
IPC分类号： A63F9/12 , A63F9/08
CPC分类号： A63F9/12
摘要： PROBLEM TO BE SOLVED: To enhance the enjoyment of an assembly puzzle by creating the assembly puzzle and its production method which enables an assembler to identify how it is assembled without looking at an instruction manual.
SOLUTION: An assembly puzzle 10 is a puzzle of combining five assembling pieces V, C, F, D and Q to assemble a complete body 12 as a cube (fixed form), the five assembling pieces V, C, F, D and Q of the five assembling pieces V, C, F, D and Q have through holes q1, v1, d1, etc., and are assembled into the complete body 12 to form an identification hole 14 made up of the connected through holes. The assembling pieces having the through holes forming the identification holes 14 of the complete body 12 and positioned on the surface side of the complete body 12 are given the numbers (identification marks) corresponding to the identification holes 14.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：通过创建组装拼图及其生产方法来增强组装拼图的享受，使组装人员能够在不查看使用说明书的情况下识别组装方式。解决方案：组装拼图10是组合五个组装件V，C，F，D和Q以将整体12作为立方体（固定形式）组装的难题，五个组装件V，C，F，五个组装件V，C，F，D和Q中的D和Q具有通孔q1，v1，d1等，并组装成整体12，以形成由连接的通孔。具有形成完整主体12的识别孔14并定位在完整主体12的表面侧上的通孔的组装件被给予与识别孔14相对应的数字（识别标记）。版权所有（C））2007，JPO＆INPIT

4. 发明申请

US20150116235A1 INFORMATION APPARATUS 审中-公开
标题翻译：信息设备
公开(公告)号：US20150116235A1
公开(公告)日：2015-04-30
申请号：US14403086
申请日：2012-09-04
申请人： Hiroki Fujisawa , Mitsuo Shimotani , Masakazu Shoji , Keisuke Kobayashi , Yuji Nobe
发明人： Hiroki Fujisawa , Mitsuo Shimotani , Masakazu Shoji , Keisuke Kobayashi , Yuji Nobe
IPC分类号： G06F3/041
CPC分类号： G06F3/041 , G01C21/20
摘要： An information apparatus includes a liquid crystal display unit 6; a touch panel 3 that is mounted on the display surface of the liquid crystal display unit 6, that has a touch operation area wider than the display area of the liquid crystal display unit 6, and that has a specific operation handling section 3b which is formed on an area corresponding to an extra-display area of the touch operation area and which accepts an operation for a specific operation item of an information apparatus 1; a controller 7 that carries out control in a manner that causes the specific operation handling section 3b to accept an operation corresponding to a specific operation item of external equipment 2.
摘要翻译：信息装置包括：液晶显示单元6; 安装在液晶显示单元6的显示表面上的触摸面板3具有比液晶显示单元6的显示区域宽的触摸操作区域，并且具有形成的特定操作处理部分3b 在对应于触摸操作区域的超显示区域并且接受信息装置1的特定操作项目的操作的区域上; 以使特定操作处理部3b接受与外部设备2的特定操作项目相对应的操作的方式进行控制的控制器7。

5. 发明申请

US20150097785A1 DISPLAY DEVICE 审中-公开
标题翻译：显示设备
公开(公告)号：US20150097785A1
公开(公告)日：2015-04-09
申请号：US14391221
申请日：2012-06-14
申请人： Masakazu Shoji , Mitsuo Shimotani , Hiroki Fujisawa , Keisuke Kobayashi , Yuji Nobe
发明人： Masakazu Shoji , Mitsuo Shimotani , Hiroki Fujisawa , Keisuke Kobayashi , Yuji Nobe
IPC分类号： G06F3/01
CPC分类号： G06F3/016 , G06F1/1684 , H01H2215/028 , H01H2215/046
摘要： A display device includes a touch panel 3 that has a touch operation area wider than an image display area, an operation member formed in an area 3b, other than the image display area, in the touch operation area, and an operation feeling generator 7 that provides an operation feeling for a pointing object which has operated the operation member.
摘要翻译：显示装置包括具有比图像显示区域宽的触摸操作区域的触摸面板3，形成在触摸操作区域中的图像显示区域以外的区域3b中的操作构件和操作感觉发生器7，为操作操作构件的指示物提供操作感。

6. 发明授权

US5001110A Organometallic solutions for forming oxide superconducting films 失效
标题翻译：用于形成氧化物超导膜的有机金属溶液
公开(公告)号：US5001110A
公开(公告)日：1991-03-19
申请号：US379972
申请日：1989-07-14
申请人： Toshihisa Nonaka , Keisuke Kobayashi , Hiroyuki Igaki , Michiyasu Matsuki
发明人： Toshihisa Nonaka , Keisuke Kobayashi , Hiroyuki Igaki , Michiyasu Matsuki
IPC分类号： C03C17/25 , C04B35/45 , C04B41/50 , C04B41/87 , H01L39/24
CPC分类号： C04B41/009 , C03C17/25 , C04B35/4504 , C04B41/5025 , C04B41/87 , H01L39/2425 , C03C2217/229 , C03C2217/23 , C03C2218/11 , C03C2218/113 , Y10S505/734 , Y10S505/735
摘要： A solution for forming a superconductive thin film prepared by dissolving a mol of a compound selected from group A consisting of alkoxides and alkoxyalkoxides of a rare earth metal element; b mol of a compound selected from group B consisting of alkoxides and alkoxyalkoxides of Ba, Sr and Ca; and c mol of a compound selected from group C consisting of alkoxides and alkoxyalkoxides of Cu in e liter of a compound selected from group E, a solvent selected from alcohols together with d mol of a compound selected from group D for inhibiting hydrolysis action such as an amine, a ketone and a glycol, such that the following relationships:0.1.times.(a+b+c).ltoreq.d.ltoreq.3.times.(a+b+c)and0.01.ltoreq.[(a+b+c)/e].ltoreq.3can be satisfied.

7. 发明申请

US20160327499A1 Hard X-Ray Photoelectron Spectroscopy Apparatus 审中-公开
公开(公告)号：US20160327499A1
公开(公告)日：2016-11-10
申请号：US14970182
申请日：2015-12-15
申请人： Keisuke Kobayashi , Yoshiko Kobayashi
发明人： Keisuke Kobayashi , Yoshiko Kobayashi
IPC分类号： G01N23/227
CPC分类号： G01N23/2273
摘要： [Problem]The present invention aims to solve the problems that size of X-ray monochromater crystal assembly is restricted and the vacuum of the X-ray source and the vacuum of the analysis chamber cannot be separated.[Solution]A hard X-ray photoelectron spectroscopy apparatus comprises an X-ray source, an analyzer, a sample manipulator, an analysis chamber, and vacuum evacuation systems, wherein, in a three-dimensional space defined by a XYZ rectangular coordinate axis system, a plate-like sample is arranged to be rotatable around the Z-axis by said sample manipulator (2), wherein said X-ray source comprises an electron gun (3b) which accelerates and focuses electrons, a target which is irradiated with the electrons accelerated and focused by the electron gun to generate an X-ray, monochromater crystal assembly, wherein the monochromater crystal assembly meets the Bragg condition of X-ray diffraction in X-Y plane to diffract/reflect and monochromatize the X-ray generated in said target and extract characteristic X-rays only, and on the other hand, the electron-beam-irradiation position on the target-center of the monochromater crystal assembly-center of the sample is arranged on the Rowland circle to minimize focusing aberration to the sample, the monochromater crystal assembly is located on a circle having a radius twice as large as that of the Rowland circle in a X-Y plane, preferably electron-beam-irradiation position on said target and the center of the sample are located on each of two focuses of an ellipse coming in contact with said Rowland circle in the center of the monochromater crystal assembly, said monochromater crystal assembly has a toroidal surface in Z axial direction acquired by rotating said ellipse coming in contact with said Rowland circle around a straight line connecting the electron-beam-irradiation position on said target and the center of the sample, and, a vacuum vessel for installing these components, wherein the monochromater crystal assembly used for monochromatization with diffraction and reflection of said X-ray source is located on the Rowland circle together with said target and said sample to meet the condition that the dispersed X-ray beam concentrates on the surface of the sample with the minimum aberration, wherein said Rowland circle is located to be orthogonal to the surface of the sample, wherein an optical axis of said analyzer is placed to be perpendicular (in X axial direction) to the incident direction (in Y axial direction) of the X-ray or within a range of ±36 degree angle in a X-Y plane and within a range of ±49 degree angle in a X-Z plane, wherein the sample is such that said X-ray diffracted and reflected by a reflection surface is located on focus positions on the surface of said sample and is obliquely incident on the surface of said sample, so that the spot of said X-ray elongatedly extends along a line in substantially parallel to Y axis (substantially perpendicular to X axis), and wherein an aperture of a slit provided at the entrance of said analyzer is arranged in parallel to a direction where said X-ray spot on the sample surface elongatedly extends.

8. 发明申请

US20130016813A1 X-RAY IRRADIATION DEVICE AND ANALYSIS DEVICE 有权
标题翻译： X射线辐射装置和分析装置
公开(公告)号：US20130016813A1
公开(公告)日：2013-01-17
申请号：US13638197
申请日：2011-03-30
申请人： Hiromichi Yamazui , Keisuke Kobayashi , Hideo Iwai , Masaaki Kobata
发明人： Hiromichi Yamazui , Keisuke Kobayashi , Hideo Iwai , Masaaki Kobata
IPC分类号： G21K5/04 , G21K1/06 , H01J35/08
CPC分类号： G01N23/2273 , G01N2223/204 , G01N2223/206 , G21K1/06 , G21K7/00 , H01J35/28 , H01J35/30 , H01J2235/081 , H01J2235/086 , H01J2235/163
摘要： [Object] The present invention provides an X-ray irradiation device capable of adjusting the energy of X-rays in a wide range, and an analysis device equipped with the X-ray irradiation device.[Solving Means] An X-ray irradiation device according to an embodiment of the present invention focuses X-rays emitted from an X-ray generation mechanism to a predetermined focal position by a focusing mechanism. The X-ray generation mechanism has a structure which generates a plurality of X-rays having different wavelengths. The focusing mechanism has a structure in which the plurality of X-rays are focused to the same focal position by focusing elements having diffraction characteristics suitable for the wavelengths of the respective X-rays generated by the X-ray generation mechanism.
摘要翻译：本发明提供能够在宽范围内调整X射线能量的X射线照射装置以及配备有X射线照射装置的分析装置。本发明的实施方式的X射线照射装置通过聚焦机构将从X射线产生机构发射的X射线聚焦到预定的焦点位置。 X射线产生机构具有产生具有不同波长的多个X射线的结构。聚焦机构具有通过具有适合于由X射线产生机构产生的各X射线的波长的衍射特性的聚焦元件将多个X射线聚焦到同一焦点位置的结构。

9. 发明授权

US3704457A Driving technique for thin film memory elements 失效
标题翻译：薄膜记忆元件的驱动技术
公开(公告)号：US3704457A
公开(公告)日：1972-11-28
申请号：US3704457D
申请日：1970-01-19
申请人： HISAAKI MAEDA , TAKASHI SAKUMA , KEISUKE KOBAYASHI , TOKO INC
发明人： MAEDA HISAO
IPC分类号： G11C11/04 , G11C11/14
CPC分类号： G11C11/04
摘要： A method of driving a memory device having a matrix memory consisting of information wires provided respectively with magnetic thin film and to be applied with information pulse currents and word conductor wires crossing perpendicularly with said information wires and to be applied with word pulse currents; in which both of writing-in of informations ''''1'''' and ''''0'''' are carried out, respectively, by first and second bipolar information pulse currents which are different in only their polarities.
摘要翻译：一种驱动存储器件的方法，该存储器件具有由分别设置有磁性薄膜的信息线构成的矩阵存储器，并且施加有与所述信息线垂直交叉的信息脉冲电流和字线，并施加字脉冲电流; 其中信息“1”和“0”的写入两者分别由只有其极性不同的第一和第二双极信息脉冲电流来执行。

10. 外观设计

USD652062S1 Wheel loader 有权
标题翻译：轮式装载机
公开(公告)号：USD652062S1
公开(公告)日：2012-01-10
申请号：US29396133
申请日：2011-06-27
申请人： Kazuhiko Hiraoka , Jujitsu Murota , Hirofumi Oouchi , Katsuhiko Tokuda , Mikio Hara , Keisuke Kobayashi , Tsutomu Aoki
设计人： Kazuhiko Hiraoka , Jujitsu Murota , Hirofumi Oouchi , Katsuhiko Tokuda , Mikio Hara , Keisuke Kobayashi , Tsutomu Aoki

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