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    • 1. 发明授权
    • Semiconductor logic integrated circuit device having first and second
operation modes for testing
    • 具有用于测试的第一和第二操作模式的半导体逻辑集成电路器件
    • US4825439A
    • 1989-04-25
    • US86447
    • 1987-08-18
    • Kazuhior SakashitaSatoru KishidaToshiaki Hanibuchi
    • Kazuhior SakashitaSatoru KishidaToshiaki Hanibuchi
    • G01R31/28G01R31/3185G11C19/28H03K19/003
    • H03K19/00346G01R31/318541
    • A semiconductor logic integrated circuit device comprising a signal selection means and a storing means, which is capable of adjusting the logic levels of an output signal therefrom. With such a circuit device, the signal selection means and the storing means are controlled in normal operation mode so that a parallel input signal is allowed to be output as a parallel output signal from output terminals of the circuit device after subjecting the parallel input signal to logical signal processing. On the other hand, the signal selection means and the storing means are controlled in a testing opertion mode so that the parallel input signal are output in serial mode from a serial signal output terminal of the circuit device, and a serial input signal to the signal selection means is allowed to be stored in the storing means to adjust the logic levels of the output signal from the circuit device at desired levels voluntarily.
    • 一种包括信号选择装置和存储装置的半导体逻辑集成电路装置,其能够调节其输出信号的逻辑电平。 利用这样的电路装置,信号选择装置和存储装置在正常工作模式下被控制,从而允许并行输入信号作为来自电路装置的输出端的并行输出信号输出, 逻辑信号处理。 另一方面,信号选择装置和存储装置被控制在测试操作模式中,使得并行输入信号以串行模式从电路装置的串行信号输出端输出,并将串行输入信号输出到信号 选择装置被允许存储在存储装置中,以自愿地将电路装置的输出信号的逻辑电平调整到所希望的电平。