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    • 7. 发明授权
    • High speed semiconductor memory having a direct-bypass signal path
    • 具有直接旁路信号路径的高速半导体存储器
    • US5146427A
    • 1992-09-08
    • US825782
    • 1992-01-21
    • Katsuro SasakiNobuyuki MoriwakiShigeru HonjoHideaki Nakamura
    • Katsuro SasakiNobuyuki MoriwakiShigeru HonjoHideaki Nakamura
    • G11C7/10
    • G11C7/1006G11C7/1051
    • In a semiconductor memory, a latch circuit is arranged between the outputs of a sense amplifier and the inputs of a data output buffer. First pass-gates are arranged between the outputs of the sense amplifier and the latch circuit, while second pass-gates are arranged between the latch circuit and the inputs of the data output buffer. The outputs of the sense amplifier are transmitted to the inputs of the data output buffer through signal paths which bypass the first pass-gates, the latch circuit and the second pass-gates, whereby the data output buffer generates a data output quickly. Thereafter, the first pass-gates and the second pass-gates are controllably brought to a signal-through condition, whereby the output information items of the sense amplifier are stored in the latch circuit. The data output buffer holds the data output in conformity with the stored information items of the latch circuit. For a period of time for which the data output buffer holds the data output, the sense amplifier is held in a non-activated condition, so that the power consumption of the semiconductor memory is lowered.
    • 在半导体存储器中,锁存电路布置在读出放大器的输出端和数据输出缓冲器的输入端之间。 第一通过门被布置在读出放大器和锁存电路的输出之间,而第二通过门被布置在锁存电路和数据输出缓冲器的输入之间。 读出放大器的输出通过旁路第一通过门,锁存电路和第二传递门的信号路径被发送到数据输出缓冲器的输入,从而数据输出缓冲器快速产生数据输出。 此后,第一通过门和第二通过门被可控地带到信号通过状态,由此将读出放大器的输出信息项存储在锁存电路中。 数据输出缓冲器保存符合存储的锁存电路的信息项的数据输出。 在数据输出缓冲器保持数据输出的一段时间内,读出放大器保持在非激活状态,从而降低了半导体存储器的功耗。
    • 9. 发明授权
    • Constant current-constant voltage circuit
    • 恒流恒压电路
    • US5047706A
    • 1991-09-10
    • US577512
    • 1990-09-05
    • Koichiro IshibashiKatsuro SasakiKatsuhiro Shimohigashi
    • Koichiro IshibashiKatsuro SasakiKatsuhiro Shimohigashi
    • G05F1/46G05F3/24G11C11/407H01L21/822H01L27/04
    • G05F3/247G05F1/463G05F1/465G05F3/245Y10S323/907
    • In a constant current-constant voltage circuit disclosed herein, gates of MOSFETs Q.sub.1 and Q.sub.2 are connected together, and the gate of the MOSFET Q.sub.1 is connected to the drain thereof. Further, the source of the MOSFET Q.sub.1 is connected to ground potential GND whereas the source of the MOSFET Q.sub.2 is connected to the drain of a MOSFET Q.sub.3 having a gate connected to power supply voltage V.sub.DD and a source connected to the ground voltage GND. A current mirror circuit including Q.sub.4 and Q.sub.5 has an input and an output respectively connected to the drain of the second MOSFET Q.sub.2 and the drain of the first MOSFET Q.sub.1. A first coefficient (W.sub.3 L.sub.2 /L.sub.3 W.sub.2) depending upon channel lengths (L.sub.2, L.sub.3) and channel widths (W.sub.2, W.sub.3) of the MOSFETs Q.sub.2 and Q.sub.3 is set at a value not larger than a predetermined value. Therefore, the MOSFET Q.sub.3 operates in a linear region as high resistance, and the MOSFETs Q.sub.1 and Q.sub.2 operate in a sub-threshold region. As a result, the dependence upon temperature is significantly improved.
    • 在本文公开的恒定电流恒定电压电路中,MOSFET Q1和Q2的栅极连接在一起,并且MOSFET Q1的栅极连接到其漏极。 此外,MOSFET Q1的源极连接到地电位GND,而MOSFET Q2的源极连接到具有连接到电源电压VDD的栅极和连接到地电压GND的源极的MOSFET Q3的漏极。 包括Q4和Q5的电流镜电路具有分别连接到第二MOSFET Q2的漏极和第一MOSFET Q1的漏极的输入和输出。 取决于MOSFET Q2和Q3的沟道长度(L2,L3)和沟道宽度(W2,W3)的第一系数(W3L2 / L3W2)被设置为不大于预定值的值。 因此,MOSFET Q3以高电阻工作在线性区域,并且MOSFET Q1和Q2在亚阈值区域中工作。 结果,对温度的依赖性显着提高。