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1. 发明申请

US20050103995A1 Method and apparatus for crystal analysis 失效
标题翻译：晶体分析方法和装置
公开(公告)号：US20050103995A1
公开(公告)日：2005-05-19
申请号：US10988086
申请日：2004-11-12
申请人： Katsuaki Yanagiuchi , Wakako Okawa
发明人： Katsuaki Yanagiuchi , Wakako Okawa
IPC分类号： G01N23/225 , H01J37/20 , H01J37/22 , H01J37/244 , H01J37/252 , H01J37/256 , G01N23/00 , G21K7/00
CPC分类号： H01J37/256 , G01N23/225 , H01J2237/2527
摘要： The method of measuring crystallographic orientations, crystal systems or the like of the surface of a specimen has steps of: irradiating the specimen with an ion beam; measuring tho secondary electrons generated by the irradiation of the ion beam; repeating the irradiation of the ion beam and the measurement of the secondary electrons with each variation in an angle of incidence of the ion beam with respect to the specimen; and determining the crystalline state based on the variation in the amount of the secondary electrons corresponding to the variation of the angle of incidence.
摘要翻译：测量样品表面的晶体取向，晶体系统等的方法具有以下步骤：用离子束照射样品; 测量由离子束照射产生的二次电子; 重复离子束的照射和二次电子的测量，其中离子束相对于试样的入射角各自变化; 并且基于对应于入射角的变化的二次电子量的变化来确定晶体状态。

2. 发明授权

US6040052A Magnetic recording medium 失效
标题翻译：磁记录介质
公开(公告)号：US6040052A
公开(公告)日：2000-03-21
申请号：US58135
申请日：1998-04-10
申请人： Hiromichi Kanazawa , Kunihiro Ueda , Katsuaki Yanagiuchi , Tsunehiko Ikarashi , Masahide Kohno
发明人： Hiromichi Kanazawa , Kunihiro Ueda , Katsuaki Yanagiuchi , Tsunehiko Ikarashi , Masahide Kohno
IPC分类号： C23C14/08 , C23C16/50 , G11B5/64 , G11B5/66 , G11B5/72 , G11B5/725 , G11B5/84 , B32B9/00
CPC分类号： G11B5/8408 , G11B5/72 , G11B5/725 , Y10S428/90 , Y10T428/30
摘要： A magnetic recording (vapor deposition) film medium having improved friction characteristics, running durability, and still characteristics are provided. The magnetic recording thin film medium comprises a non-magnetic support having on at least one surface thereof a magnetic layer, a protective layer formed on the magnetic layer, and a lubricant layer formed on the protective layer, wherein the magnetic recording medium is obtained by that after forming the magnetic layer on the surface of the non-magnetic support conveyed along the surface of a cooling roll, a carbon-containing plasma polymerized film is formed on the magnetic layer as the protective layer, while conveying the non-magnetic support having the magnetic layer along the surface of a cooling roll, and after surface-treating the carbon-containing plasma polymerized film on the same cooling roll as the protective layer-forming roll or on a different cooling roll from the protective layer-forming roll without applying a bias voltage to the surface-treatment roll, whereby a double bond component of carbon and oxygen is incorporated in the surface of the carbon-containing plasma polymerized film at a ratio of from 1.4 to 7.5 atomic % to the whole carbon amount of the surface of the carbon-containing plasma polymerized film, and the lubricant layer made up of an ester of a fluorinated alcohol and a fatty acid is then formed on the carbon-containing plasma polymerized film.
摘要翻译：提供了具有改善的摩擦特性，运行耐久性和静止特性的磁记录（气相沉积）薄膜介质。磁记录薄膜介质包括在其至少一个表面上具有磁性层，形成在磁性层上的保护层和形成在保护层上的润滑层的非磁性载体，其中磁记录介质由在沿着冷却辊的表面输送的非磁性载体的表面上形成磁性层之后，在作为保护层的磁性层上形成含碳等离子体聚合膜，同时输送具有沿着冷却辊的表面的磁性层，并且在与保护层形成辊相同的冷却辊上或与保护层形成辊不同的冷却辊上表面处理含碳等离子体聚合膜，而不施加表面处理辊的偏置电压，由此将碳和氧的双键成分并入含碳等离子体的表面然后，形成以含碳等离子体聚合膜表面的全碳量为基准的1.4〜7.5原子％的比例的聚合膜，由氟化醇和脂肪酸的酯构成的润滑剂层在含碳等离子体聚合膜上。

3. 发明授权

US6030679A Optical recording material and its fabrication method 失效
标题翻译：光学记录材料及其制作方法
公开(公告)号：US6030679A
公开(公告)日：2000-02-29
申请号：US131864
申请日：1998-08-10
申请人： Takao Saito , Hiroshi Shingai , Tatsuya Kato , Hajime Utsunomiya , Katsuaki Yanagiuchi
发明人： Takao Saito , Hiroshi Shingai , Tatsuya Kato , Hajime Utsunomiya , Katsuaki Yanagiuchi
IPC分类号： G11B7/24 , G11B7/243 , G11B7/257 , G11B7/26 , B32B3/00
CPC分类号： G11B7/26 , G11B7/2403 , G11B7/243 , G11B7/257 , G11B2007/24308 , G11B2007/2431 , G11B2007/24316 , G11B2007/25706 , G11B2007/2571 , G11B2007/25715 , G11B2007/25716 , G11B7/00454 , G11B7/24 , G11B7/2534 , G11B7/2542 , G11B7/258 , G11B7/2585 , G11B7/2595 , Y10S428/913 , Y10S430/146 , Y10T428/21
摘要： An optical recording medium comprises a substrate and a multilayer structure on the substrate. The multilayer structure comprises a phase change type recording layer and a pair of dielectric layers, at least one of which contains zinc sulfide optionally with silicon oxide. When a depth profile of the multilayer structure in a thickness direction thereof is found by Auger electron spectroscopy, a region having an intensity ratio S/Zn of 2 or lower exists across a thickness of at least 6.0 nm, calculated as SiO.sub.2, from the vicinity of an interface between the dielectric layer and the recording layer into the recording layer. In the vicinity of the interface between the dielectric layer and the recording layer, there is also a region having an intensity ratio S/Zn vs. O/Si relation that satisfies S/Zn
摘要翻译：光学记录介质包括基底和基底上的多层结构。多层结构包括相变型记录层和一对电介质层，其中至少一层含有任选含有氧化硅的硫化锌。通过俄歇电子能谱法发现其厚度方向上的多层结构的深度分布，从附近存在以SiO 2计算的至少6.0nm的厚度的区域，其强度比S / Zn为2以下。介电层和记录层之间的界面的记录层。在电介质层和记录层之间的界面附近，还存在具有满足S / Zn

4. 发明授权

US07091484B2 Method and apparatus for crystal analysis 失效
标题翻译：晶体分析方法和装置
公开(公告)号：US07091484B2
公开(公告)日：2006-08-15
申请号：US10988086
申请日：2004-11-12
申请人： Katsuaki Yanagiuchi , Wakako Okawa
发明人： Katsuaki Yanagiuchi , Wakako Okawa
IPC分类号： H01J37/252 , H01J49/46 , G01N23/207 , G01N23/225
CPC分类号： H01J37/256 , G01N23/225 , H01J2237/2527
摘要： The method of measuring crystallographic orientations, crystal systems or the like of the surface of a specimen has steps of: irradiating the specimen with an ion beam; measuring the secondary electrons generated by the irradiation of the ion beam; repeating the irradiation of the ion beam and the measurement of the secondary electrons with each variation in an angle of incidence of the ion beam with respect to the specimen; and determining the crystalline state based on the variation in the amount of the secondary electrons corresponding to the variation of the angle of incidence.
摘要翻译：测量样品表面的晶体取向，晶体系统等的方法具有以下步骤：用离子束照射样品; 测量由离子束照射产生的二次电子; 重复离子束的照射和二次电子的测量，其中离子束相对于试样的入射角各自变化; 并且基于对应于入射角的变化的二次电子量的变化来确定晶体状态。

5. 发明授权

US06735056B2 ELECTRON DEVICE COMPOSED OF LAMINATED LAYERS WITH A REGION BETWEEN TWO OF THE LAYERS COMPOSED OF METAL OR METAL ALLOY SELECTED TO BE A COMBINATION OF MATERIALS FROM WHICH THE LAYERS ARE MADE WITH A COVER FILM OVER END FACES OF THE LAYERS 有权
标题翻译：由组成的金属或金属合金组成的两层之间的区域组成的层压板的电子器件是由层与材料组合而成的层与层之间的覆盖膜
公开(公告)号：US06735056B2
公开(公告)日：2004-05-11
申请号：US10122380
申请日：2002-04-16
申请人： Katsuaki Yanagiuchi , Wakako Shiramura
发明人： Katsuaki Yanagiuchi , Wakako Shiramura
IPC分类号： G11B539
CPC分类号： B82Y25/00 , B82Y10/00 , G11B5/3903 , G11B5/3909 , G11B5/3932 , G11B5/3967
摘要： An electron device includes a first layer formed of a metal or metal alloy and a second layer adjoining the first layer and formed of a metal or metal alloy different from that of the first layer. In the region adjacent the first layer and the second layer, there is provided a concentration gradient layer formed of a mixture containing a metal or metal alloy contained in the first layer and a metal or metal alloy contained in the second layer. A covering film covers end faces of the first and second layers. With this arrangement, when a cleaning as by etching is carried out on the end faces of the multilayered film structure of the electron device, the end faces are etched in relatively smoothly connected surfaces because of the etched end face of the concentration gradient layer in a gentle slope, so that coverage of the covering film on the end faces of the multilayered film structure can be improved to increase the adherence strength of the covering film.
摘要翻译：电子器件包括由金属或金属合金形成的第一层和邻接第一层并由不同于第一层的金属或金属合金形成的第二层。在与第一层和第二层相邻的区域中，提供了由包含在第一层中的金属或金属合金和包含在第二层中的金属或金属合金的混合物形成的浓度梯度层。覆盖膜覆盖第一层和第二层的端面。通过这种布置，当在电子器件的多层膜结构的端面上进行通过蚀刻的清洁时，由于在浓度梯度层的蚀刻端面在从而可以提高多层膜结构的端面上的覆盖膜的覆盖率，以提高覆膜的粘附强度。

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