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    • 1. 发明申请
    • PROCESS FOR COMPENSATING FOR THE INCORRECT OPERATION OF MEASURING DEVICES CAUSED BY EXTERNAL INFLUENCES
    • FOR赔偿外部效应大小的方法会造成测量设备的不当行为
    • WO1997009587A1
    • 1997-03-13
    • PCT/DE1996001657
    • 1996-08-30
    • SIEMENS AKTIENGESELLSCHAFTKRISCH, Burkhard
    • SIEMENS AKTIENGESELLSCHAFT
    • G01D03/028
    • G01D3/0365G01L9/025G01L27/002
    • The invention relates to a process for compensating for the incorrect operation of measuring devices fitted with a programming section caused by external influences in which the measuring devices together with a sensor responding to the influence are fitted in a chamber exposed to said influencing factor. When the influencing factor changes, measurements from the measuring device and the sensor are detected by a data processing system which provides the programming section of the measuring devices with signals compensating for the incorrect operation caused by said influencing factor. In order to be able to perform such a process rapidly and thus economically, the influencing factor is continuously changed and the current output value of the sensor (6) and the current measurement provided by the measuring device (3) are detected with a timing predetermined by the data processing system.
    • 本发明涉及一种方法,用于通过设置有起因于外部影响因素一个编程部分测量设备,其中测量装置与一个有吸引力的一起收容在影响变量空间的一个暴露的影响变量传感器补偿的不当行为。 在改性影响测量装置和数据处理装置的传感器的变量的测量值被检测到,它提供了所造成的尺寸的不当行为补偿信号至测量设备的编程部分的影响。 为了执行这样的方法是快速的,因此成本的影响变量被连续地改变,由此检测传感器(6),并在由所述数据处理设备的时钟规定的测量装置(3)的相应的测量值的相应的输出变量。