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1. 发明专利

JP2009225664A Boats-towing type jellyfish-catching and processing system 审中-公开
标题翻译：船只式JELLYFISH捕捞和加工系统
公开(公告)号：JP2009225664A
公开(公告)日：2009-10-08
申请号：JP2008070878
申请日：2008-03-19
申请人： Kiyoto Nakamura , Seiichi Nakamura , Seiji Nakamura , Yoko Nakamura , 洋子中村 , 清一中村 , 清人中村 , 清治中村
发明人： NAKAMURA KIYOTO , NAKAMURA YOKO , NAKAMURA SEIICHI , NAKAMURA SEIJI
IPC分类号： A01M27/00 , A01M29/00 , A01M29/30
摘要： PROBLEM TO BE SOLVED: To provide a jellyfish-catching, processing, and recovering system which can efficiently catch, process, recover, and exterminate Echizen jellyfish massively growing in Japan Sea, flow in ocean currents, fill up sea areas, and move northward, from summer to autumn, and can give large effects.
SOLUTION: Provided are a wire cut treatment system for towing a plurality of fishing boats to increase a towing force, and cutting the jellyfish with wires longitudinally and latitudinally extended in the front and rear portions of a body frame or on the front and rear sides thereof by the use of the increased towing force, and a jellyfish cutter catching treatment system for utilizing a towing water pressure generated by towing an article sunk in sea to rotate a water wheel, and rotating cutters disposed on the shaft of the water wheel to cut the caught jellyfish.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够有效捕捞，加工，回收和灭绝日本海洋大规模生长的水母捕捞，加工和回收系统，在海洋中流动，填补海域，向北移动，从夏季到秋季，可以产生很大的影响。解决方案：提供一种用于牵引多个渔船以增加拖曳力的线切割处理系统，并且在身体框架的前部和后部或前面纵向和纬向延伸的丝线切割水母，以及通过使用增加的牵引力的后侧，以及水母切割器捕捉处理系统，用于利用通过牵引在海中卷入的物品产生的牵引水压来旋转水轮，以及旋转设置在水轮轴上的切割器切割被捕的水母。版权所有（C）2010，JPO＆INPIT

2. 发明授权

US08952383B2 Test carrier 有权
标题翻译：测试载体
公开(公告)号：US08952383B2
公开(公告)日：2015-02-10
申请号：US13644140
申请日：2012-10-03
申请人： Kiyoto Nakamura , Takashi Fujisaki
发明人： Kiyoto Nakamura , Takashi Fujisaki
IPC分类号： H01L23/58 , G01R1/04
CPC分类号： H01L23/58 , G01R1/0466 , H01L2224/16225
摘要： A test carrier which can suppress the occurrence of contact defects while securing positional precision of the terminals is provided. A test carrier 10 comprises: a base film 40 which has one main surface which has bumps which contact electrodes 91 of the die 90; and a cover film 70 which is laid over the base film 40, the die 90 is held between the base film 40 and the cover film 70, the base film 40 has: a first region 40a which has a first thickness t1; and a second region 40b which has a second thickness t2 which is thinner than the first thickness t1, and the second region 40b faces at least a part of the edge 92 of the die 90.
摘要翻译：提供一种能够在确保端子的位置精度的同时抑制接触缺陷的发生的测试载体。测试载体10包括：基膜40，其具有一个主表面，其具有与模具90的电极91接触的凸块; 以及覆盖在基膜40上的覆盖膜70，模具90保持在基膜40和覆盖膜70之间，基膜40具有：具有第一厚度t1的第一区域40a; 第二区域40b具有比第一厚度t1薄的第二厚度t2，第二区域40b面对模具90的边缘92的至少一部分。

3. 发明申请

US20130214809A1 SOCKET AND ELECTRONIC DEVICE TEST APPARATUS 有权
标题翻译：插座和电子设备测试装置
公开(公告)号：US20130214809A1
公开(公告)日：2013-08-22
申请号：US13644197
申请日：2012-10-03
申请人： Kiyoto NAKAMURA , Takashi FUJISAKI
发明人： Kiyoto NAKAMURA , Takashi FUJISAKI
IPC分类号： G01R1/04
CPC分类号： G01R1/0433 , G01R1/0466 , G01R1/0483 , G01R1/0735 , G01R31/2601 , G01R31/2886
摘要： A socket which enables occurrence of contact defects to be suppressed is provided. A socket 11 to which a test carrier 20, which has: a base film 32 on which bumps 324 are formed for contact with electrode pads 51 of a die 50; and external terminals 312 which are electrically connected to the bumps 324, is electrically connected comprises: contactors 125 which contact external terminals 312; and an elastic member 131 which pushes against bump-forming portions 32a and bump-surrounding portions 32b on the base film 32. The elastic member 131 has: a first elastic layer 132; and a second elastic layer 133 which is more flexible than the first elastic layer 132, and a second elastic layer 133 is laid over the first elastic layer 132 and contacts the base film 32.
摘要翻译：提供能够抑制接触缺陷发生的插座。具有测试载体20的插座11，其具有：基底膜32，其上形成有用于与模具50的电极焊盘51接触的凸块324; 电连接到凸块324的外部端子312电连接包括：接触外部端子312的接触器125; 以及弹性构件131，其在基底膜32上推动凸起形成部分32a和凸起部分32b。弹性构件131具有：第一弹性层132; 以及比第一弹性层132更柔性的第二弹性层133，并且第二弹性层133被放置在第一弹性层132上并与基膜32接触。

4. 发明申请

US20120235699A1 TEST CARRIER 有权
标题翻译：测试载体
公开(公告)号：US20120235699A1
公开(公告)日：2012-09-20
申请号：US13502655
申请日：2010-05-10
申请人： Kiyoto Nakamura , Yoshinari Kogure
发明人： Kiyoto Nakamura , Yoshinari Kogure
IPC分类号： G01R31/26 , G01R31/00
CPC分类号： G01R31/2893 , G01R31/2891 , H01L21/6835 , H01L23/544 , H01L24/81 , H01L2223/5442 , H01L2223/54426 , H01L2224/81121 , H01L2224/81801 , H01L2924/01019 , H01L2924/09701 , H01L2924/12042 , H01L2924/14 , Y10T29/4913 , Y10T29/49131 , Y10T29/53174 , Y10T29/53183 , H01L2924/00
摘要： A test carrier includes a base member and a cover member between which a die is interposed. The base film of the base member has: first interconnect patterns which are formed in advance; and a printing region where second interconnect patterns which electrically connect to the first interconnect patterns are to be formed by printing.
摘要翻译：一种测试载体包括一个基底构件和一个盖构件，模具插在其间。基体的基膜具有：预先形成的第一互连图案; 以及通过印刷形成电连接到第一布线图案的第二布线图案的印刷区域。

5. 发明申请

US20110271774A1 TEST CARRIER 有权
标题翻译：测试载体
公开(公告)号：US20110271774A1
公开(公告)日：2011-11-10
申请号：US13103142
申请日：2011-05-09
申请人： Kiyoto NAKAMURA , Yoshinari KOGURE
发明人： Kiyoto NAKAMURA , Yoshinari KOGURE
IPC分类号： G01N17/00
CPC分类号： G01R1/0408
摘要： [Problem] A test carrier able to secure a high air-tightness is provided.[Solution] A test carrier 10 comprises a cover member 50A and a base member 20A which are bonded together while sandwiching a die 90 between them. ultraviolet rays can pass through the cover member 50A.[Selected Drawings] FIG. 4
摘要翻译： [问题]提供了能够确保高气密性的测试载体。 [解决方案]测试托架10包括盖构件50A和基座构件20A，它们在它们之间夹住模具90时结合在一起。紫外线可以通过盖构件50A。 [所选图] 4

6. 发明授权

US07800386B2 Contact device and method for producing the same 有权
标题翻译：接触装置及其制造方法
公开(公告)号：US07800386B2
公开(公告)日：2010-09-21
申请号：US12174645
申请日：2008-07-17
申请人： Kiyoto Nakamura , Hiroshi Arikawa , Yoshiaki Moro , Hirokazu Sampei
发明人： Kiyoto Nakamura , Hiroshi Arikawa , Yoshiaki Moro , Hirokazu Sampei
IPC分类号： G01R31/02 , G01R31/28
CPC分类号： B81C1/00674 , B81B3/0005 , B81B2201/018 , B81B2203/0118 , B81B2203/04 , B81C1/0096 , G01R1/06761 , G01R3/00 , H01H1/0036 , H01H2001/0052 , Y10T428/12493
摘要： Provided is a method for producing a contact device, including a step of forming a first conductive film; a step of forming a second conductive film containing a metal or an alloy of the metal on the first conductive film; a step of forming a third conductive film on the second conductive film; and a step of forming a surface layer on the third conductive film, the surface layer containing an oxidative product of the metal in the second conductive film, which metal has been diffused to be precipitated out from the surface of the third conductive film and oxidized.
摘要翻译：提供一种接触装置的制造方法，包括形成第一导电膜的工序; 在第一导电膜上形成含有金属或金属合金的第二导电膜的步骤; 在第二导电膜上形成第三导电膜的步骤; 以及在所述第三导电膜上形成表面层的步骤，所述表面层含有所述金属在所述第二导电膜中的氧化产物，所述金属已被扩散以从所述第三导电膜的表面析出并被氧化。

7. 发明授权

US08994394B2 Test carrier 有权
标题翻译：测试载体
公开(公告)号：US08994394B2
公开(公告)日：2015-03-31
申请号：US13448911
申请日：2012-04-17
申请人： Yoshinari Kogure , Takashi Fujisaki , Kiyoto Nakamura
发明人： Yoshinari Kogure , Takashi Fujisaki , Kiyoto Nakamura
IPC分类号： G01R31/00 , G01R1/04 , G01R31/28
CPC分类号： G01R1/0408 , G01R31/2893
摘要： A test carrier includes a film-shaped base film which has first bumps which contact test pads of a die; and a cover film which is superposed over the base film, and the test carrier holds the die between the base film and the cover film. The first bumps are relatively higher than second bumps which the die has.
摘要翻译：测试载体包括膜状基膜，其具有与模具的测试焊盘接触的第一凸块; 以及覆盖在所述基膜上的覆盖膜，所述测试载体将所述模具保持在所述基膜和所述覆盖膜之间。第一凸起相对高于模具具有的第二凸块。

8. 发明授权

US08970243B2 Test carrier and board assembly 有权
标题翻译：测试载体和电路板组件
公开(公告)号：US08970243B2
公开(公告)日：2015-03-03
申请号：US13448839
申请日：2012-04-17
申请人： Yoshinari Kogure , Takashi Fujisaki , Kiyoto Nakamura
发明人： Yoshinari Kogure , Takashi Fujisaki , Kiyoto Nakamura
IPC分类号： G01R31/00 , G01R1/04 , G01R31/28
CPC分类号： G01R1/0408 , G01R31/2893 , H01L2224/16235
摘要： A test carrier 10A comprises: a base board 21A which holds a die 90; and a cover board 31A which is laid over the base board 21A so as to cover the die 90. The test carrier 10A comprises a seal member 24 which is interposed between the base board 21A and the cover board 31A and which surrounds the die 90.
摘要翻译：测试载体10A包括：保持模具90的基板21A; 以及覆盖基板21A以覆盖模具90的盖板31A。试验载体10A包括密封构件24，该密封构件24插入在基板21A和盖板31A之间并且围绕模具90。

9. 发明申请

US20130120013A1 TEST CARRIER AND METHOD OF ASSEMBLY OF TEST CARRIER 审中-公开
标题翻译：测试载体和测试载体装配方法
公开(公告)号：US20130120013A1
公开(公告)日：2013-05-16
申请号：US13672051
申请日：2012-11-08
申请人： Takashi FUJISAKI , Kiyoto NAKAMURA
发明人： Takashi FUJISAKI , Kiyoto NAKAMURA
IPC分类号： G01R1/04 , B32B25/00
CPC分类号： G01R1/0408 , B32B3/08 , B32B7/02 , B32B25/00 , B32B25/20 , B32B2307/7242 , B32B2457/00 , G01R1/0483 , G01R31/2893 , Y10T156/10
摘要： A test carrier which enables a reduction of cost to be achieved. The test carrier 10 comprises: a base film 40 which holds a die 90; and a film-shaped cover film 70 which is laid over the base film 40 and covers the die 90, the cover film 70 has a self-adhesiveness and is more flexible than the base film 40.
摘要翻译：能够实现降低成本的测试载体。测试载体10包括：保持模具90的基膜40; 以及覆盖在基膜40上并覆盖模具90的膜状覆盖膜70，覆盖膜70具有自粘性，比基膜40更柔软。

10. 发明申请

US20130082259A1 TEST CARRIER 有权
标题翻译：测试载体
公开(公告)号：US20130082259A1
公开(公告)日：2013-04-04
申请号：US13644140
申请日：2012-10-03
申请人： Kiyoto NAKAMURA , Takashi FUJISAKI
发明人： Kiyoto NAKAMURA , Takashi FUJISAKI
IPC分类号： H01L23/58
CPC分类号： H01L23/58 , G01R1/0466 , H01L2224/16225
摘要： A test carrier which can suppress the occurrence of contact defects while securing positional precision of the terminals is provided. A test carrier 10 comprises: a base film 40 which has one main surface which has bumps which contact electrodes 91 of the die 90; and a cover film 70 which is laid over the base film 40, the die 90 is held between the base film 40 and the cover film 70, the base film 40 has: a first region 40a which has a first thickness t1; and a second region 40b which has a second thickness t2 which is thinner than the first thickness t1, and the second region 40b faces at least a part of the edge 92 of the die 90.
摘要翻译：提供一种能够在确保端子的位置精度的同时抑制接触缺陷的发生的测试载体。测试载体10包括：基膜40，其具有一个主表面，其具有与模具90的电极91接触的凸块; 以及覆盖在基膜40上的覆盖膜70，模具90保持在基膜40和覆盖膜70之间，基膜40具有：具有第一厚度t1的第一区域40a; 第二区域40b具有比第一厚度t1薄的第二厚度t2，第二区域40b面对模具90的边缘92的至少一部分。

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