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    • 2. 发明申请
    • PROCESS FOR PRODUCING REFLECTIVE MASK BLANK FOR EUV LITHOGRAPHY AND PROCESS FOR PRODUCING SUBSTRATE WITH FUNCTIONAL FILM FOR THE MASK BLANK
    • 用于生产用于EUV光刻的反射掩模的方法和用于生产具有用于掩蔽空白的功能膜的基板的方法
    • US20120145534A1
    • 2012-06-14
    • US12967724
    • 2010-12-14
    • Junichi KAGEYAMA
    • Junichi KAGEYAMA
    • C23C14/14C23C14/34
    • C23C14/46C23C14/18C23C14/3464G03F1/24
    • To provide a process for producing an EUV mask blank, capable of reducing foreign matter attributable to a sputtering target, and a process for producing a substrate with a functional film for such a mask blank.A process for producing a reflective mask blank for EUVL, which comprises at least a step of forming a Mo/Si multilayer reflective film, a step of forming a ruthenium (Ru) film or Ru compound film as a protective layer on the multilayer reflective film, and a step of forming an absorber layer to absorb EUV light, on the Ru film or Ru compound film, wherein the formation of the Mo film, the Si film, and the Ru film or Ru compound film, is carried out by means of an ion beam sputtering method, and in the formation of the Si film of the Mo/Si multilayer reflective film and in the formation of the Ru film or Ru compound film, the target angle, the type of the process gas, the process gas pressure, the RF power of ion source, the suppresser voltage, the ion beam voltage and the ion beam current are adjusted to be substantially the same; and based on an erosion region of a sputtering target used for the formation of the Si film, an erosion region and a non-erosion region of a sputtering target to be used for the formation of the Ru film or Ru compound film, are predicted, roughening treatment is applied to the non-erosion region thus predicted of the Ru target or Ru compound target, and then the formation of the Ru film or Ru compound film is carried out.
    • 提供能够减少归因于溅射靶的异物的EUV掩模毛坯的制造方法以及用于制造这种掩模毛坯用功能膜的基板的工序。 一种用于EUVL的反射掩模板的制造方法,其至少包括形成Mo / Si多层反射膜的步骤,在多层反射膜上形成钌(Ru)膜或Ru化合物膜作为保护层的步骤 以及在Ru膜或Ru化合物膜上形成吸收EUV光的吸收层的步骤,其中Mo膜,Si膜和Ru膜或Ru化合物膜的形成通过以下方式进行: 离子束溅射法,并且在形成Mo / Si多层反射膜的Si膜中,并且在形成Ru膜或Ru化合物膜时,目标角度,处理气体的类型,工艺气体压力 ,将离子源的RF功率,抑制电压,离子束电压和离子束电流调整为基本相同; 并且基于用于形成Si膜的溅射靶的侵蚀区域,预测用于形成Ru膜或Ru化合物膜的溅射靶的侵蚀区域和非侵蚀区域, 对如此预测的Ru靶或Ru化合物靶的非腐蚀区域进行粗糙化处理,然后进行Ru膜或Ru化合物膜的形成。
    • 3. 发明申请
    • GLASS SUBSTRATE-HOLDING TOOL
    • 玻璃基板保持工具
    • US20120100464A1
    • 2012-04-26
    • US12909399
    • 2010-10-21
    • Junichi KAGEYAMA
    • Junichi KAGEYAMA
    • G03F1/00B23Q3/00G03F7/20
    • H01L21/6831G03F1/24G03F7/70741H01L21/67742
    • To provide a glass substrate-holding tool which is capable of avoiding scratching to the deposition surface of a glass substrate and dusting thereby caused as well as scratching and deposition of foreign substances at a center portion of the rear surface of the substrate and which is capable of suppressing dusting from the holding tool itself at the time of forming a multi-layered reflection film and an absorptive layer.A glass substrate-holding tool having, formed on a surface of a flat base, a catching portion for catching and holding by van der Waals forces, wherein the catching portion is in contact with only the periphery of the glass substrate.
    • 为了提供一种玻璃基板保持工具,其能够避免刮擦玻璃基板的沉积表面并引起粉尘,从而引起外来物质在基板后表面的中心部分的划伤和沉积,并且能够 在形成多层反射膜和吸收层时抑制来自保持工具本身的粉尘。 一种玻璃基板保持工具,其形成在平坦基座的表面上,用于通过范德华力捕获和保持的捕获部分,其中捕获部分仅与玻璃基板的周边接触。