会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Hard-disk drive
    • 硬盘驱动器
    • US08089720B2
    • 2012-01-03
    • US12537213
    • 2009-08-06
    • Yosuke UrakamiJun OhnoHideaki MaedaHiroyasu Tanabe
    • Yosuke UrakamiJun OhnoHideaki MaedaHiroyasu Tanabe
    • G11B5/55G11B5/596
    • G11B5/012B82Y10/00G11B5/743G11B5/82
    • A hard-disk drive. The hard-disk drive includes a magnetic-recording disk in which tracks adjacent to each other are magnetically separated, a spindle motor which drives the magnetic-recording disk, a magnetic-recording head equipped with write element and read element, an actuator for positioning the magnetic-recording head on a predetermined track on the magnetic-recording disk, and a control unit. The control unit is configured to store information about an over-write-only track that is provided for a plurality of tracks including n consecutive tracks in at least a partial radial area of the magnetic-recording disk and an offset amount. In a radial area of the magnetic disk where the over-write-only track is located, the control unit is configured to record with an offset by an offset amount from a center of a track toward the over-write-only track with respect to n−1 tracks of the plurality of n tracks, excluding the over-write-only track.
    • 硬盘驱动器。 硬盘驱动器包括磁记录盘,其中彼此相邻的轨道磁分离,驱动磁记录盘的主轴电机,配备有写元件和读元件的磁记录头,用于定位的致动器 在磁记录盘上的预定轨道上的磁记录头,以及控制单元。 控制单元被配置为存储关于在磁记录盘的至少部分径向区域中包括n个连续轨道的多个轨道提供的仅写入磁道的信息和偏移量。 在位于仅写入磁道的磁盘的径向区域中,控制单元被配置为以偏移量从轨道的中心朝向仅写入磁道的偏移量相对于 除了仅写入磁道之外的多个n个磁道的n-1个磁道。
    • 2. 发明授权
    • Semiconductor memory, test method of semiconductor memory and system
    • 半导体存储器,半导体存储器和系统的测试方法
    • US07675773B2
    • 2010-03-09
    • US12130480
    • 2008-05-30
    • Kaoru MoriToshikazu NakamuraJun OhnoMasaki Okuda
    • Kaoru MoriToshikazu NakamuraJun OhnoMasaki Okuda
    • G11C11/34
    • G11C8/18G11C11/401G11C11/406G11C11/40615G11C29/1201G11C29/18G11C29/48G11C2029/1802
    • An address switch circuit receives a row address signal supplied to a first address terminal group and a column address signal supplied to a second address terminal group. Further, the address switch circuit receives the row address signal supplied to the second address terminal group and thereafter receives the column address signal supplied to the second address terminal group and supplies the received row address signal and the received column address signal to the row decoder and the column decoder during a second operation mode. The number of semiconductor memories that are tested at once can be increased by executing an operation test of the semiconductor memories in the second operation mode. In addition, it becomes possible to test a semiconductor memory using test assets for other semiconductor memories. Consequently, the test efficiency can be improved, and the test cost can be reduced.
    • 地址开关电路接收提供给第一地址端子组的行地址信号和提供给第二地址端子组的列地址信号。 此外,地址开关电路接收提供给第二地址端子组的行地址信号,然后接收提供给第二地址端子组的列地址信号,并将接收到的行地址信号和接收的列地址信号提供给行解码器, 列解码器在第二操作模式期间。 可以通过在第二操作模式中执行半导体存储器的操作测试来增加一次测试的半导体存储器的数量。 此外,可以使用用于其他半导体存储器的测试资产来测试半导体存储器。 因此,可以提高测试效率,并且可以降低测试成本。
    • 3. 发明申请
    • Information recording device
    • 信息记录装置
    • US20080204924A1
    • 2008-08-28
    • US12072001
    • 2008-02-21
    • Jun OhnoAtsushi YatagaiSatoshi OhkiHiroshi Ide
    • Jun OhnoAtsushi YatagaiSatoshi OhkiHiroshi Ide
    • G11B21/02
    • G11B5/6029G11B5/607G11B5/6076
    • Embodiments of the present invention help to compute controlling quantity to make the spacing between a floating head slider and a recording medium optimum without damaging the floating head slider and the recording medium by detecting the floating head slider's contact with the recording medium with high sensitivity. According to one embodiment, when the floating head slider is floating over the magnetic disk, a controller takes samples of a notable characteristic value (amplitude) from signals reproduced by a reproducing head, retains the variation of the sample amplitude as a reference signal, takes samples of amplitude from signals reproduced by the reproducing head while reducing the spacing between the floating head slider and the magnetic disk gradually, produces a signal which is the sample signal from which the reference signal is subtracted, detects the floating head slider's contact with the magnetic disk when the fluctuation of the signal so produced exceeds a reference value and, on the basis of a fly-height-control mechanism's controlling quantity at the time of the contact, computes the controlling quantity for making the spacing between the floating head slider and the magnetic disk optimum.
    • 本发明的实施例有助于通过以高灵敏度检测浮动磁头滑块与记录介质的接触来计算控制量以使浮动磁头滑块和记录介质之间的间隔最佳而不损坏浮动磁头滑块和记录介质。 根据一个实施例,当浮动磁头滑动器浮动在磁盘上时,控制器从由再现磁头再现的信号中获取显着的特征值(振幅)的采样,保持采样振幅的变化作为参考信号, 逐渐减小浮动磁头滑块和磁盘之间的间隔,产生一个信号,该信号是从其中减去参考信号的采样信号,检测浮动磁头滑块与磁铁的接触。 当这样产生的信号的波动超过参考值时,并且基于飞行高度控制机构在接触时的控制量,计算用于使浮动滑块滑块和 磁盘最佳。
    • 4. 发明授权
    • Semiconductor circuit
    • 半导体电路
    • US07362652B2
    • 2008-04-22
    • US11502421
    • 2006-08-11
    • Jun Ohno
    • Jun Ohno
    • G11C5/00G11C7/00
    • H03K17/6877H03K17/687H03K2217/0036
    • A semiconductor circuit which includes one or plural fuse circuits being disconnectable and having a connected or disconnected state and a control circuit controlling a controlled circuit is provided. The control circuit controls the controlled circuit according to the state of the fuse circuit or the states of the fuse circuits when a normal mode is designated and controls the controlled circuit according to the state of the fuse circuit or the states of the fuse circuits and an input signal or input signals when a test mode is designated.
    • 提供一种半导体电路,其包括可断开并具有连接或断开状态的一个或多个熔丝电路和控制受控电路的控制电路。 当指定正常模式时,控制电路根据熔丝电路的状态或熔丝电路的状态来控制受控电路,并根据熔丝电路的状态或熔丝电路的状态来控制受控电路, 指定测试模式时的输入信号或输入信号。
    • 8. 发明授权
    • Fluid distribution apparatus, an artificial moving bed, and a continuous
adsorption method
    • 流体分配装置,人造移动床和连续吸附法
    • US5478475A
    • 1995-12-26
    • US154077
    • 1993-11-18
    • Minoru MoritaJun Ohno
    • Minoru MoritaJun Ohno
    • B01D15/00B01D15/02B01J8/04B01J47/10F16K11/06
    • B01J47/105B01D15/14B01D15/1842Y10T137/86533
    • The artificial moving bed of this invention includes a fluid distribution apparatus consisting of an upper fluid distributor and a lower fluid distributor, and a plurality of processing chambers held and fixed between the upper and lower fluid distributors. Each fluid distributor has a rotary valve held in a slidable condition between a fixed supply valve and a pipe fixing plate. These fluid distributors are formed with fluid passages therein. The processing chambers are divided into several groups, each assigned a specific process. Using this artificial moving bed, the processing chambers are operated simultaneously and when the process is finished in each group of processing chambers, the fluid distribution apparatus is rotated clockwise when viewed from above so that each group of chambers proceeds to the next process, thus allowing continuous adsorption operation.
    • 本发明的人造移动床包括由上部流体分配器和下部流体分配器组成的流体分配装置,以及保持并固定在上部和下部流体分配器之间的多个处理室。 每个流体分配器具有保持在固定供给阀和管固定板之间的可滑动状态的旋转阀。 这些流体分配器在其中形成有流体通道。 处理室分为几组,每组分配一个具体过程。 使用这种人造移动床,处理室同时操作,并且当在每组处理室中完成处理时,当从上方观察时,流体分配装置顺时针旋转,使得每组室进行到下一个处理,从而允许 连续吸附操作。
    • 10. 发明申请
    • SEMICONDUCTOR MEMORY, TEST METHOD OF SEMICONDUCTOR MEMORY AND SYSTEM
    • 半导体存储器,半导体存储器和系统的测试方法
    • US20090040850A1
    • 2009-02-12
    • US12130480
    • 2008-05-30
    • Kaoru MoriToshikazu NakamuraJun OhnoMasaki Okuda
    • Kaoru MoriToshikazu NakamuraJun OhnoMasaki Okuda
    • G11C29/00G11C8/00
    • G11C8/18G11C11/401G11C11/406G11C11/40615G11C29/1201G11C29/18G11C29/48G11C2029/1802
    • An address switch circuit receives a row address signal supplied to a first address terminal group and a column address signal supplied to a second address terminal group. Further, the address switch circuit receives the row address signal supplied to the second address terminal group and thereafter receives the column address signal supplied to the second address terminal group and supplies the received row address signal and the received column address signal to the row decoder and the column decoder during a second operation mode. The number of semiconductor memories that are tested at once can be increased by executing an operation test of the semiconductor memories in the second operation mode. In addition, it becomes possible to test a semiconductor memory using test assets for other semiconductor memories. Consequently, the test efficiency can be improved, and the test cost can be reduced.
    • 地址开关电路接收提供给第一地址端子组的行地址信号和提供给第二地址端子组的列地址信号。 此外,地址开关电路接收提供给第二地址端子组的行地址信号,然后接收提供给第二地址端子组的列地址信号,并将接收到的行地址信号和接收的列地址信号提供给行解码器, 列解码器在第二操作模式期间。 可以通过在第二操作模式下执行半导体存储器的操作测试来增加一次测试的半导体存储器的数量。 此外,可以使用用于其他半导体存储器的测试资产来测试半导体存储器。 因此,可以提高测试效率,并且可以降低测试成本。