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    • 9. 发明申请
    • VOLTAGE GENERATION CIRCUIT AND NONVOLATILE MEMORY DEVICE INCLUDING THE SAME
    • 包括其的电压发生电路和非易失性存储器件
    • US20100284226A1
    • 2010-11-11
    • US12702480
    • 2010-02-09
    • Yu Jong Noh
    • Yu Jong Noh
    • G11C16/06G11C5/14G11C7/04
    • G11C7/14G11C5/147G11C11/5642G11C16/0483G11C16/30G11C2211/5634
    • A voltage generation circuit for providing a read or verification voltage of a nonvolatile memory device includes a first voltage generation unit configured to output a first voltage using a first reference voltage, a bouncing compensation unit configured to change the first voltage using a first control signal, the first voltage, and a voltage of a global source line when a read or verification operation is performed on the nonvolatile memory device, and to output a changed first voltage as a second voltage, a second reference voltage generation unit configured to generate a second reference voltage, and an amplification unit configured to amplify a difference between the second voltage and the second reference voltage according to a set resistance ratio and to output a result of the amplification as a third voltage.
    • 用于提供非易失性存储器件的读取或验证电压的电压产生电路包括:第一电压生成单元,被配置为使用第一参考电压输出第一电压;弹跳补偿单元,被配置为使用第一控制信号来改变第一电压; 所述第一电压和在所述非易失性存储器件上执行读取或验证操作时的全局源极线的电压,以及输出改变的第一电压作为第二电压;第二参考电压产生单元,被配置为产生第二参考 电压和放大单元,被配置为根据设定的电阻比放大第二电压和第二参考电压之间的差,并将放大的结果输出为第三电压。
    • 10. 发明申请
    • READ/VERIFICATION REFERENCE VOLTAGE SUPPLY UNIT OF NONVOLATILE MEMORY DEVICE
    • 非易失性存储器件的读取/验证参考电压供应单元
    • US20090290428A1
    • 2009-11-26
    • US12468250
    • 2009-05-19
    • Yu Jong NOH
    • Yu Jong NOH
    • G11C16/06G11C5/14G11C7/00
    • G11C7/14G11C5/147G11C7/04G11C16/0483G11C16/28G11C16/30
    • A verification reference voltage supply unit includes a reference voltage supply unit, a temperature-dependent voltage supply unit, and an amplification unit. The reference voltage supply unit is configured to supply a first reference voltage and a second reference voltage, each of which is configured to maintain a constant value irrespective of a temperature variation. The temperature-dependent voltage supply unit is configured to receive the first reference voltage and generate a temperature-dependent voltage having a voltage level that increases in proportion to a temperature increase. The amplification unit is configured to amplify the temperature-dependent voltage and the second reference voltage and generate a verification reference voltage.
    • 验证参考电压供应单元包括参考电压供应单元,温度依赖电压供应单元和放大单元。 参考电压提供单元被配置为提供第一参考电压和第二参考电压,每个基准电压和第二参考电压被配置为保持恒定值而与温度变化无关。 温度依赖性电压供给单元被配置为接收第一参考电压并产生具有与温度增加成比例地增加的电压电平的依赖于温度的电压。 放大单元被配置为放大依赖于温度的电压和第二参考电压并产生验证参考电压。