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1. 发明授权

US07642527B2 Multi-attribute light effects for use in curing and other applications involving photoreactions and processing 有权
标题翻译：用于固化和涉及光反应和加工的其他应用的多属性光效应
公开(公告)号：US07642527B2
公开(公告)日：2010-01-05
申请号：US11614753
申请日：2006-12-21
申请人： Jon Marson , Alex Schreiner
发明人： Jon Marson , Alex Schreiner
IPC分类号： G21K5/00
CPC分类号： G03F7/2024 , B32B2429/02 , G11B7/26
摘要： Systems and methods that provide multi-attribute light effects, including one or more channels for each light effect, preferably both channels being provided in an array of solid state light emitters.
摘要翻译：提供多属性光效应的系统和方法，包括用于每种光效应的一个或多个通道，优选地在固态发光体阵列中提供两个通道。

2. 发明授权

US08080812B2 Multi-attribute light effects for use in curing and other applications involving photoreactions and processing 有权
标题翻译：用于固化和涉及光反应和加工的其他应用的多属性光效应
公开(公告)号：US08080812B2
公开(公告)日：2011-12-20
申请号：US12628160
申请日：2009-11-30
申请人： Jon Marson , Alex Schreiner
发明人： Jon Marson , Alex Schreiner
IPC分类号： G21K5/00
CPC分类号： G03F7/2024 , B32B2429/02 , G11B7/26
摘要： Systems and methods that provide multi-attribute light effects, including one or more channels for each light effect, preferably both channels being provided in an array of solid state light emitters.
摘要翻译：提供多属性光效应的系统和方法，包括用于每种光效应的一个或多个通道，优选地在固态发光体阵列中提供两个通道。

3. 发明授权

US08110804B2 Through substrate optical imaging device and method 有权
标题翻译：通过基板光学成像装置和方法
公开(公告)号：US08110804B2
公开(公告)日：2012-02-07
申请号：US12588504
申请日：2009-10-16
申请人： Taufiq Habib , Alex F. Schreiner , Jon Marson
发明人： Taufiq Habib , Alex F. Schreiner , Jon Marson
IPC分类号： G01J5/20
CPC分类号： G01N21/9501 , G01N21/9505
摘要： A through-substrate optical imaging device for through-imaging of translucent work objects, includes a radiation source outputting radiation that will be transmissive through the work object and an imaging system configured for capturing inspection information from the radiation source through the work object. The radiation source is configured such that the radiation impinges on the surface of the work object under various angles of incidence. A method for through-substrate optical imaging of a translucent work object includes irradiating the translucent work object by radiation from a radiation source; capturing inspection information from the radiation source through the translucent work object, the inspection information being captured by an imaging system; and irradiating the translucent work object. The translucent work object is irradiated by radiation which impinges on the surface of the translucent work object under one of various angles of incidence and orientations.
摘要翻译：一种用于半透明工件的透射成像的贯穿基板光学成像装置，包括：输出将通过工作对象透射的辐射的辐射源;以及被配置为从所述辐射源通过所述工作对象捕获检查信息的成像系统。辐射源被配置成使得辐射以不同的入射角射入工作物体的表面上。半透明工件的透光基板光学成像方法包括通过来自辐射源的辐射照射半透明工件; 从辐射源通过半透明工作对象捕获检查信息，所述检查信息由成像系统捕获; 并照射半透明工件。半透明加工对象被辐射照射在各种入射角度和取向角之下的半透明加工对象的表面上。

4. 发明申请

US20100076111A1 MULTI-ATTRIBUTE LIGHT EFFECTS FOR USE IN CURING AND OTHER APPLICATIONS INVOLVING PHOTOREACTIONS AND PROCESSING 有权
标题翻译：用于固化和其他涉及光电和加工的应用的多属性光效应
公开(公告)号：US20100076111A1
公开(公告)日：2010-03-25
申请号：US12628160
申请日：2009-11-30
申请人： JON MARSON , ALEX SCHREINER
发明人： JON MARSON , ALEX SCHREINER
IPC分类号： C08F2/46
CPC分类号： G03F7/2024 , B32B2429/02 , G11B7/26
摘要： Systems and methods that provide multi-attribute light effects, including one or more channels for each light effect, preferably both channels being provided in an array of solid state light emitters.
摘要翻译：提供多属性光效应的系统和方法，包括用于每种光效应的一个或多个通道，优选地在固态发光体阵列中提供两个通道。

5. 发明申请

US20070154823A1 MULTI-ATTRIBUTE LIGHT EFFECTS FOR USE IN CURING AND OTHER APPLICATIONS INVOLVING PHOTOREACTIONS AND PROCESSING 有权
标题翻译：用于固化和其他涉及光电和加工的应用的多属性光效应
公开(公告)号：US20070154823A1
公开(公告)日：2007-07-05
申请号：US11614753
申请日：2006-12-21
申请人： Jon Marson , Alex Schreiner
发明人： Jon Marson , Alex Schreiner
IPC分类号： G03C5/00
CPC分类号： G03F7/2024 , B32B2429/02 , G11B7/26
摘要： Systems and methods that provide multi-attribute light effects, including one or more channels for each light effect, preferably both channels being provided in an array of solid state light emitters.
摘要翻译：提供多属性光效应的系统和方法，包括用于每种光效应的一个或多个通道，优选地在固态发光体阵列中提供两个通道。

6. 发明申请

US20100181483A1 Through-substrate optical imaging device and method 有权
标题翻译：透光成像装置及方法
公开(公告)号：US20100181483A1
公开(公告)日：2010-07-22
申请号：US12588504
申请日：2009-10-16
申请人： Taufiq Habib , Alex F. Schreiner , Jon Marson
发明人： Taufiq Habib , Alex F. Schreiner , Jon Marson
IPC分类号： G01N21/88 , G01N21/01
CPC分类号： G01N21/9501 , G01N21/9505
摘要： A through-substrate optical imaging device for through-imaging of translucent work objects, includes a radiation source outputting radiation that will be transmissive through the work object and an imaging system configured for capturing inspection information from the radiation source through the work object. The radiation source is configured such that the radiation impinges on the surface of the work object under various angles of incidence. A method for through-substrate optical imaging of a translucent work object includes irradiating the translucent work object by radiation from a radiation source; capturing inspection information from the radiation source through the translucent work object, the inspection information being captured by an imaging system; and irradiating the translucent work object. The translucent work object is irradiated by radiation which impinges on the surface of the translucent work object under one of various angles of incidence and orientations.
摘要翻译：一种用于半透明工件的透射成像的贯穿基板光学成像装置，包括：输出将通过工作对象透射的辐射的辐射源;以及被配置为从所述辐射源通过所述工作对象捕获检查信息的成像系统。辐射源被配置成使得辐射以不同的入射角射入工作物体的表面上。半透明工件的透光基板光学成像方法包括通过来自辐射源的辐射照射半透明工件; 从辐射源通过半透明工作对象捕获检查信息，所述检查信息由成像系统捕获; 并照射半透明工件。半透明加工对象被辐射照射在各种入射角度和取向角之下的半透明加工对象的表面上。

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