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    • 1. 发明授权
    • Light emitting diode (LED) die having recessed electrode and light extraction structures and method of fabrication
    • 具有凹陷电极和光提取结构和制造方法的发光二极管(LED)裸片
    • US08759128B2
    • 2014-06-24
    • US13426705
    • 2012-03-22
    • Jiunn-Yi ChuTrung Tri Doan
    • Jiunn-Yi ChuTrung Tri Doan
    • H01L33/00H01L21/461H01L21/44H01L33/38
    • H01L21/461H01L21/44H01L33/22H01L33/382H01L2933/0016
    • A light emitting diode (LED) die includes a semiconductor substrate having an n-type confinement layer, a multiple quantum well (MQW) layer in electrical contact with the n-type confinement layer configured to emit electromagnetic radiation, a p-type confinement layer in electrical contact with the multiple quantum well (MQW) layer; multiple light extraction structures on the n-type confinement layer configured to scatter the electromagnetic radiation; and an electrode in a recess embedded in the n-type confinement layer proximate to the light extraction structures. A method of fabrication includes: forming the semiconductor substrate; forming a recess in the n-type confinement layer having sidewalls and a planar bottom surface; forming an electrode in the recess comprising a conductive material conforming to the sidewalls and to the bottom surface of the recess; planarizing the electrode; and forming a plurality of light extraction structures in the n-type confinement layer proximate to the electrode.
    • 发光二极管(LED)裸片包括具有n型限制层的半导体衬底,与被配置为发射电磁辐射的n型限制层电接触的多量子阱(MQW)层,p型限制层 与多量子阱(MQW)层电接触; n型限制层上的多个光提取结构被配置成散射电磁辐射; 以及嵌入在靠近光提取结构的n型约束层中的凹槽中的电极。 一种制造方法包括:形成半导体衬底; 在具有侧壁和平坦底面的n型限制层中形成凹部; 在所述凹部中形成电极,所述电极包括符合所述侧壁和所述凹部的所述底表面的导电材料; 平面化电极; 以及在靠近电极的n型约束层中形成多个光提取结构。
    • 9. 发明授权
    • Method of separating semiconductor dies
    • 分离半导体管芯的方法
    • US07829440B2
    • 2010-11-09
    • US11835289
    • 2007-08-07
    • Jiunn-Yi ChuChao-Chen ChengChen-Fu ChuTrung Tri Doan
    • Jiunn-Yi ChuChao-Chen ChengChen-Fu ChuTrung Tri Doan
    • H01L21/301
    • H01L21/78H01L33/0079H01L33/0095
    • A method for the separation of multiple dies during semiconductor fabrication is described. On an upper surface of a semiconductor wafer containing multiple dies, a seed metal layer may be used to grow hard metal layers above it for handling. Metal may be plated above these metal layers everywhere except where a block of stop electroplating (EP) material exists. The stop EP material may be obliterated, and a barrier layer may be formed above the entire remaining structure. The substrate may be removed, and the individual dies may have any desired bonding pads and/or patterned circuitry added to the semiconductor surface. The remerged hard metal after laser cutting and heating should be strong enough for handling. Tape may be added to the wafer, and a breaker may be used to break the dies apart. The resulting structure may be flipped over, and the tape may be expanded to separate the individual dies.
    • 描述了在半导体制造期间分离多个管芯的方法。 在包含多个管芯的半导体晶片的上表面上,种子金属层可以用于在其上方生长硬金属层用于处理。 除了存在一块停止电镀(EP)材料之外,金属可以被覆盖在这些金属层之上。 停止EP材料可能被擦除,并且阻挡层可以形成在整个剩余结构之上。 可以去除衬底,并且各个管芯可以具有添加到半导体表面的任何期望的接合焊盘和/或图案化电路。 激光切割加热后的重金属硬度应足够强大。 可以将胶带加入到晶片中,并且可以使用断路器将模具分开。 可以将所得到的结构翻转,并且可以将带扩展以分离各个管芯。