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    • 2. 发明授权
    • Luminous multiple glazing unit comprising light-emitting diodes
    • 发光多层玻璃单元包括发光二极管
    • US09453361B2
    • 2016-09-27
    • US13576506
    • 2011-01-24
    • Aude MontgermontJingwei ZhangDavid Delhorme
    • Aude MontgermontJingwei ZhangDavid Delhorme
    • F21V1/00E06B3/66F21V8/00
    • E06B3/66G02B6/0096
    • A luminous multiple glazing unit including: first and second flat glass elements; light-emitting diodes located in an internal space; a reflector including a part fixed to the glazing unit in the internal space; and a first luminous zone associated with the first glass element. In a first configuration, the reflector has a central reflective area for reflecting at least 30% of total flux emitted by the diodes in the group onto a first mechanism scattering light, or, in a second configuration, the reflector forms a beam splitter and has a double-image central reflective area of a first central area for reflecting first central rays onto a first mechanism scattering light and a second central area for reflecting second central rays onto a second scattering mechanism, the reflector reflecting at least 30% of total flux emitted by the diodes in the group.
    • 一种发光多层玻璃单元,包括:第一和第二平板玻璃元件; 位于内部空间的发光二极管; 反射器,其包括固定到内部空间中的玻璃窗单元的部分; 以及与第一玻璃元件相关联的第一发光区域。 在第一配置中,反射器具有中心反射区域,用于将组中二极管发射的总通量的至少30%反射到散射光的第一机构上,或者在第二配置中,反射器形成分束器,并具有 第一中心区域的双重图像中心反射区域,用于将第一中心射线反射到散射光的第一机构上,以及用于将第二中心射线反射到第二散射机构的第二中心区域,所述反射器反射出的总通量的至少30% 由组中的二极管组成。
    • 8. 发明授权
    • Process and device for measuring the thickness of a transparent material using a modulated frequency light source
    • 使用调制频率光源测量透明材料的厚度的方法和装置
    • US06215556B1
    • 2001-04-10
    • US09346708
    • 1999-07-02
    • Jingwei ZhangPascal Grente
    • Jingwei ZhangPascal Grente
    • G01B1102
    • G01B11/06
    • The invention relates to a process and to a device for measuring the thickness of transparent materials. More particularly, but not exclusively, the invention concerns the thickness measurement of glass materials and, even more precisely, the thickness measurement of flat glass, in particular float glass. According to the invention, a light beam with modulated frequency is focused, two light beams or rays reflected by each of the surfaces of the transparent material are received, interference is created between them, the number of oscillations per modulation period of the interference signal is determined, the path difference (&dgr;) between the two beams and the thickness (e) of the transparent material are deduced and the phase shift (&phgr;) of the said interference signal is determined. This determination of the phase-shift between the two signals each coming from one of the surfaces of the transparent material can then be used to deduce other characteristics of the said material. It may in particular be applied to the precise measurement of local thickness variations, in particular of a strip of float glass. Similarly, it is proposed to apply it to measuring the thickness of a thin transparent material, preferably more than 0.2 mm.
    • 本发明涉及一种用于测量透明材料厚度的方法和装置。 更具体地但并不排他地,本发明涉及玻璃材料的厚度测量,甚至更确切地说,是平板玻璃,特别是浮法玻璃的厚度测量。 根据本发明,对具有调制频率的光束进行聚焦,接收由透明材料的每个表面反射的两个光束或射线,在它们之间产生干涉,干扰信号的每个调制周期的振荡次数为 确定了两个光束之间的路径差(delta)和透明材料的厚度(e),并确定了所述干涉信号的相移(phi)。 然后可以使用来自透明材料的一个表面的两个信号之间的相移的确定来推断所述材料的其它特性。 特别适用于局部厚度变化的精确测量,特别是浮法玻璃条。 类似地,建议将其应用于测量薄透明材料的厚度,优选大于0.2mm。