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1. 发明申请

WO2010071278A1 WAFER TRANSFER UNIT AND PROBE STATION INCLUDING THE SAME 审中-公开
标题翻译： WAFER传输单元和包含它的探测站
公开(公告)号：WO2010071278A1
公开(公告)日：2010-06-24
申请号：PCT/KR2009/002676
申请日：2009-05-21
申请人： SECRON CO., LTD. , JIN, Jeon-Ho , CHOI, Ki-Uk , JUNG, Jin-Yung , HWANG, In-Wook , KIM, Woo-Yeol , HWANG, Chan-Wook
发明人： JIN, Jeon-Ho , CHOI, Ki-Uk , JUNG, Jin-Yung , HWANG, In-Wook , KIM, Woo-Yeol , HWANG, Chan-Wook
IPC分类号： H01L21/677
CPC分类号： H01L21/67742
摘要： A wafer transfer unit includes a rotary chuck, a transfer arm positioned over the rotary chuck, the transfer arm transferring a wafer, a driving part positioned under the rotary chuck, the driving part linearly moving the transfer arm and a cover covering the rotary chuck and the transfer arm, the cover including a first opening formed therethrough such that a cleaning gas flows downward toward the wafer.
摘要翻译：晶片转印单元包括旋转卡盘，位于旋转卡盘上方的传送臂，传送晶片的传送臂，位于旋转卡盘下方的驱动部分，驱动部分线性移动传送臂和覆盖旋转卡盘的盖，所述传送臂，所述盖包括穿过其形成的第一开口，使得清洁气体朝向所述晶片向下流动。

2. 发明申请

WO2010071277A1 PROBE STATION 审中-公开
标题翻译：探索站
公开(公告)号：WO2010071277A1
公开(公告)日：2010-06-24
申请号：PCT/KR2009/002675
申请日：2009-05-21
申请人： SECRON CO., LTD. , JIN, Jeon-Ho , CHOI, Ki-Uk , JUNG, Jin-Yung , HWANG, In-Wook , KIM, Woo-Yeol , HWANG, Chan-Wook
发明人： JIN, Jeon-Ho , CHOI, Ki-Uk , JUNG, Jin-Yung , HWANG, In-Wook , KIM, Woo-Yeol , HWANG, Chan-Wook
IPC分类号： G01R1/067
CPC分类号： G01R31/2886
摘要： A probe station includes a stage unit having a test space for testing a plurality of chips formed on a wafer, a loading unit providing the wafer for the stage unit, a first gas supplying unit disposed on a first sidewall of the stage unit, the first gas supplying unit supplying a first cleaning gas into the test space, and a first gas discharging unit disposed on a second sidewall of the loading unit, the first gas discharging unit discharging the first cleaning gas to remove particles from the test space and the second sidewall facing the first sidewall.
摘要翻译：探测台包括具有用于测试形成在晶片上的多个芯片的测试空间的阶段单元，为舞台单元提供晶片的装载单元，设置在舞台单元的第一侧壁上的第一气体供应单元，第一向测试空间供给第一清洗气体的气体供给单元以及设置在装载单元的第二侧壁上的第一气体排出单元，第一气体排出单元排出第一清洗气体，从测试空间除去微粒和第二侧壁面向第一侧壁。

3. 发明申请

WO2008072877A1 PROBING TESTER AND TESTING METHOD FOR A WAFER USING THE SAME 审中-公开
标题翻译：使用该方法的探针测试和测试方法
公开(公告)号：WO2008072877A1
公开(公告)日：2008-06-19
申请号：PCT/KR2007/006435
申请日：2007-12-11
申请人： SECRON CO., LTD. , KIM, Meang Kwon , JIN, Jeon Ho , CHOI, Ki Uk , CHOI, Su Hyun
发明人： KIM, Meang Kwon , JIN, Jeon Ho , CHOI, Ki Uk , CHOI, Su Hyun
IPC分类号： H01L21/66
CPC分类号： H01L21/68742 , G01R31/2887 , H01L21/6838
摘要： Disclosed herein are a probing tester and a testing method for a wafer using the same. The probing tester includes a chuck, a plurality of supporting pins, and a vacuum device. The chuck is configured such that a wafer is seated thereon, and is provided with a plurality of through- holes, which pass through the chuck vertically with respect to the upper surface thereof. The supporting pins are located under the chuck, are provided with vacuum holes, which formed from upper to lower ends thereof, and are provided at locations respectively corresponding to the plurality of through-holes. The vacuum device is configured to form a vacuum state inside the plurality of vacuum holes such that the wafer is drawn to and held on the upper ends of the plurality of supporting pins.
摘要翻译：本文公开了使用其的晶片的探测测试器和测试方法。探测器包括卡盘，多个支撑销和真空装置。卡盘构造成使得晶片位于其上，并且设置有多个通孔，其相对于其上表面垂直地穿过卡盘。支撑销位于卡盘下方，设有从上到下形成的真空孔，并且分别设置在与多个通孔对应的位置处。真空装置构造成在多个真空孔内形成真空状态，使得晶片被拉出并保持在多个支撑销的上端。

4. 发明申请

WO2008078886A1 CARRYING APPARATUS FOR PROBE CARD 审中-公开
标题翻译：携带探针卡
公开(公告)号：WO2008078886A1
公开(公告)日：2008-07-03
申请号：PCT/KR2007/006436
申请日：2007-12-11
申请人： SECRON Co., Ltd. , CHOI, Su Hyun , KIM, Meang Kwon , JIN, Jeon Ho , CHOI, Ki Uk
发明人： CHOI, Su Hyun , KIM, Meang Kwon , JIN, Jeon Ho , CHOI, Ki Uk
IPC分类号： H01L21/677
CPC分类号： G01R31/2887
摘要： Disclosed herein is a carrying apparatus for probe card that is used in probe test equipment for testing wafers. The carrying apparatus for probe card includes a probe card holding unit, an arm unit, an ascending and descending shaft, and a load support unit. The probe card holding unit is configured to hold a probe card and is provided with a load sensing unit for sensing the weight of the held probe card. The arm unit is configured such that the probe card holding unit is mounted thereto. The ascending and descending shaft is connected to the arm unit so as to freely rotate the arm unit. The load support unit is configured to support the ascending and descending shaft. The force that is applied to the load support unit to support the ascending and descending shaft varies in proportion to the weight of the held probe card.
摘要翻译：本文公开了一种用于探针测试设备中用于测试晶片的探针卡的运载装置。用于探针卡的运送装置包括探针卡保持单元，臂单元，上升和下降轴以及负载支撑单元。探针卡保持单元被配置为保持探针卡，并且设置有用于感测保持的探针卡的重量的负载感测单元。臂单元构造成使得探针卡保持单元被安装到其上。上升和下降的轴连接到臂单元，以便自由地旋转臂单元。负载支撑单元构造成支撑上升和下降的轴。施加到负载支撑单元以支撑上升和下降轴的力与保持的探针卡的重量成比例地变化。

5. 发明申请

WO2008078939A1 PROBE STATION, AND TESTING METHOD OF WAFER USING THE SAME 审中-公开
标题翻译：探测台和使用其的测试方法
公开(公告)号：WO2008078939A1
公开(公告)日：2008-07-03
申请号：PCT/KR2007/006777
申请日：2007-12-24
申请人： SECRON Co., Ltd. , CHOI, Su Hyun , KIM, Meang Kwon , JIN, Jeon Ho , CHOI, Ki Uk
发明人： CHOI, Su Hyun , KIM, Meang Kwon , JIN, Jeon Ho , CHOI, Ki Uk
IPC分类号： H01L21/66
CPC分类号： G01R31/2893 , G01R31/2887
摘要： Disclosed herein is probe station that is used to test semiconductor devices formed on a wafer. The equipment includes a chuck, a probe card holder, a holder fixing unit, a transfer unit, and a holder movement unit. The chuck supports the wafer. The probe card holder is configured such that a probe card, which is provided with a plurality of probes, is seated therein. The holder fixing unit fastens the probe card holder. The transfer unit enables seating of the probe card in the probe card holder by laterally moving the probe card holder from the probe station to the outside, and laterally moving the probe card holder is seated, into the probe station. The holder movement unit causes the probe card holder to be fastened to the holder fixing unit by changing the location of probe card holder while supporting the holder fixing unit.
摘要翻译：这里公开了用于测试形成在晶片上的半导体器件的探针台。该设备包括卡盘，探针卡座，保持器固定单元，转印单元和保持器移动单元。卡盘支撑晶片。探针卡保持器构造成使得设置有多个探针的探针卡位于其中。支架固定单元固定探针卡夹。转印单元可以通过将探针卡夹从探针台侧向移动到外部将探针卡安置在探针卡固定器中，并且将探针卡夹持器横向移动到探针台中。保持器移动单元通过在支撑固定器固定单元的同时改变探针卡夹持器的位置，使探针卡保持器固定到保持器固定单元。

6. 发明申请

US20200207492A1 AUTOMATIC PACKAGING MACHINE INCLUDING CIRCULATION SYSTEM 审中-公开
公开(公告)号：US20200207492A1
公开(公告)日：2020-07-02
申请号：US16262501
申请日：2019-01-30
申请人： Byung Sun JEON , Byung Jin JEON
发明人： Byung Sun JEON , Byung Jin JEON
IPC分类号： B65B5/04 , B65B25/06 , B65B35/24 , B65B43/30 , B65B57/00
摘要： An automatic packaging system for continuously and automatically packaging products without interruption using triple circulation systems. The triple circulation systems include an unpackaged product feeding circulation system continuously feeding unpackaged products via circulation, a package feeding circulation system continuously feeding packages via circulation, and a packaged product circulation conveying system continuously transporting packaged products wrapped in the packages via circulation. The automatic packaging system continuously and automatically packages products without interruption, thereby efficiently improving productivity.

7. 发明授权

US09746727B2 Display apparatus 有权
公开(公告)号：US09746727B2
公开(公告)日：2017-08-29
申请号：US11860240
申请日：2007-09-24
申请人： Yong-Koo Her , Jin Jeon , Kee-Han Uh , Yong-Je Jeon , Yong-Han Park
发明人： Yong-Koo Her , Jin Jeon , Kee-Han Uh , Yong-Je Jeon , Yong-Han Park
IPC分类号： G02F1/1345 , G09G3/36
CPC分类号： G09G3/3677 , G02F1/1345 , G02F1/13452 , G02F1/136209 , G02F1/136286 , G09G3/3648 , G09G2300/0408 , G09G2300/0426 , G09G2310/0286
摘要： A display apparatus includes a first substrate, a second substrate, and a driver chip. The first substrate includes a plurality of gate lines disposed in the display area and extended in a first direction, a plurality of data lines disposed on a gate insulating layer insulating the gate lines and extended in a second direction substantially perpendicular to the first direction, and a gate driving circuit section disposed in the first peripheral area adjacent to first ends of the gate lines. The second substrate is opposite to the first substrate. A liquid crystal is interposed between the first and second substrates. The driver chip is disposed in the second peripheral area adjacent to second ends of the gate lines opposite to the first ends so that the width of the upper and lower portions of the display area may be decreased.

8. 发明授权

US09229265B2 Method of preparing monodisperse particle, monodisperse particle prepared by using the method, and tunable photonic crystal device using the monodisperse particle 有权
标题翻译：制备单分散粒子的方法，使用该方法制备的单分散粒子和使用单分散粒子的可调谐光子晶体器件
公开(公告)号：US09229265B2
公开(公告)日：2016-01-05
申请号：US13517789
申请日：2012-06-14
申请人： Moon Gyu Han , Chang Gyun Shin , HongShik Shim , Seog-jin Jeon
发明人： Moon Gyu Han , Chang Gyun Shin , HongShik Shim , Seog-jin Jeon
IPC分类号： G02B26/00 , G02B26/08 , G02F1/29 , G02F1/1335 , C08F2/12 , G02B1/00 , C08F220/14 , B82Y30/00 , B82Y40/00
CPC分类号： G02F1/133514 , B82Y30/00 , B82Y40/00 , C08F2/12 , C08F220/14 , G02B1/005 , G02F2202/32 , G02F2203/62 , C08F212/08
摘要： A method of preparing a monodisperse particle may include mixing at least two types of monomers in a solvent, placing an initiator in the solvent, and forming a particle having a copolymer shape by polymerizing the at least two types of monomers. The particle may have a size controlled by a content of the at least two types of monomers.
摘要翻译：制备单分散颗粒的方法可以包括在溶剂中混合至少两种类型的单体，将引发剂置于溶剂中，并通过聚合至少两种类型的单体形成具有共聚物形状的颗粒。颗粒可以具有由至少两种类型的单体的含量控制的尺寸。

9. 发明授权

US09187625B2 Method of preparing high refractive nanoparticles, nanoparticles prepared by the method, and photonic crystal device using the nanoparticles 有权
$Method of preparing high refractive nanoparticles, nanoparticles prepared by the method, and photonic crystal device using the nanoparticles$
标题翻译：制备高折射纳米粒子的方法，通过该方法制备的纳米粒子和使用纳米粒子的光子晶体器件
公开(公告)号：US09187625B2
公开(公告)日：2015-11-17
申请号：US13477311
申请日：2012-05-22
申请人： Moon Gyu Han , HongShik Shim , Chang Gyun Shin , Seog-jin Jeon
发明人： Moon Gyu Han , HongShik Shim , Chang Gyun Shin , Seog-jin Jeon
IPC分类号： G02F1/00 , G02B26/08 , G02F1/29 , C08K9/08 , C09C1/36 , C09C1/04 , B82Y30/00
CPC分类号： C08K9/08 , B82Y30/00 , C01P2002/85 , C01P2002/88 , C01P2004/03 , C01P2004/04 , C01P2004/62 , C01P2004/64 , C09C1/04 , C09C1/043 , C09C1/3676 , Y10T428/2982
摘要： A method of preparing high refractive index nanoparticles includes adding a polymer stabilizer to a solvent, and forming high refractive index nanoparticles by adding high refractive index nanoparticle materials to the solvent and stirring the same. The high refractive index nanoparticle materials may have a refractive index equal to or greater than 1.8, and sizes of the high refractive index nanoparticles may be determined by adjusting a content of the polymer stabilizer to control an amount of the polymer stabilizer adsorbed to surfaces of the high refractive index nanoparticles.
摘要翻译：制备高折射率纳米颗粒的方法包括向溶剂中加入聚合物稳定剂，并通过向溶剂中加入高折射率纳米颗粒材料并搅拌形成高折射率纳米颗粒。高折射率纳米颗粒材料可以具有等于或大于1.8的折射率，并且高折射率纳米颗粒的尺寸可以通过调节聚合物稳定剂的含量来控制吸附在表面上的聚合物稳定剂的量高折射率纳米粒子。

10. 发明授权

US09079992B2 Olefin block copolymer and preparation method thereof 有权
标题翻译：烯烃嵌段共聚物及其制备方法
公开(公告)号：US09079992B2
公开(公告)日：2015-07-14
申请号：US13980860
申请日：2012-01-19
申请人： Kyung-Seop Noh , Nan-Young Lee , Won-Hee Kim , Sang-Eun An , Sang-Jin Jeon , Cheon-Il Park , Choong-Hoon Lee
发明人： Kyung-Seop Noh , Nan-Young Lee , Won-Hee Kim , Sang-Eun An , Sang-Jin Jeon , Cheon-Il Park , Choong-Hoon Lee
IPC分类号： C08F210/16 , C08F4/6592 , C08F4/653 , C08L23/08 , C08L23/14 , C08F297/08
CPC分类号： C08F295/00 , C08F4/64013 , C08F4/65904 , C08F4/6592 , C08F210/16 , C08F297/08 , C08L23/08 , C08L23/0815 , C08L23/14 , C08L23/142 , C08F4/64044 , C08F210/00
摘要： The present description relates to an olefin block copolymer having excellences in elasticity and heat resistance and its preparation method. The olefin block copolymer includes a plurality of blocks or segments, each of which includes an ethylene or propylene repeating unit and an α-olefin repeating unit at different weight fractions. The olefin block copolymer has a density of 0.85 to 0.92 g/cm3, and density X (g/cm3) and TMA (Thermal Mechanical Analysis) value Y (° C.) satisfy a defined relationship.
摘要翻译：本发明涉及具有优异的弹性和耐热性的烯烃嵌段共聚物及其制备方法。烯烃嵌段共聚物包括多个嵌段或链段，其各自包括不同重量分数的乙烯或丙烯重复单元和α-烯烃重复单元。烯烃嵌段共聚物的密度为0.85〜0.92g / cm 3，密度X（g / cm 3）和TMA（热机械分析）值Y（℃）满足规定的关系。

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