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1. 发明授权

US08474127B2 Method for enhancing thermal stability, improving biasing and reducing damage from electrostatic discharge in self-pinned abutted junction heads 有权
标题翻译：提高热稳定性，改善偏压和减少自固定邻接接头中静电放电损伤的方法
公开(公告)号：US08474127B2
公开(公告)日：2013-07-02
申请号：US11494241
申请日：2006-07-27
申请人： Hardayal Singh Gill , Wen-Chien Hsiao , Jih-Shiuan Luo
发明人： Hardayal Singh Gill , Wen-Chien Hsiao , Jih-Shiuan Luo
IPC分类号： G11B5/127 , H04R31/00
CPC分类号： G11B5/3932 , Y10T29/49032 , Y10T29/49043 , Y10T29/49044 , Y10T29/49046 , Y10T29/49048 , Y10T29/49052
摘要： A method for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. The method includes forming a free layer, forming first hard bias layers abutting the free layer and forming second hard bias layers over the first hard bias layers discontiguous from the free layer, the second hard bias layers being anti-parallel to the first hard bias layers, the first and second hard bias layers providing a net longitudinal bias on the free layer.
摘要翻译：一种用于增强热稳定性，改善偏压并减少自固定邻接接头中电涌的损伤的方法。该方法包括形成自由层，形成邻接自由层的第一硬偏压层，并在与自由层不相邻的第一硬偏压层上形成第二硬偏压层，第二硬偏压层与第一硬偏压层反平行第一和第二硬偏压层在自由层上提供净纵向偏压。

2. 发明授权

US08040131B2 Method for testing the acceptability of a magnetic read sensor 有权
标题翻译：测试磁读取传感器可接受性的方法
公开(公告)号：US08040131B2
公开(公告)日：2011-10-18
申请号：US12166078
申请日：2008-07-01
申请人： David Ernest Call , Ciaran Avram Fox , Jih-Shiuan Luo , Robert Langland Smith , Chin-Yu Yeh
发明人： David Ernest Call , Ciaran Avram Fox , Jih-Shiuan Luo , Robert Langland Smith , Chin-Yu Yeh
IPC分类号： G01R33/12
CPC分类号： G11B27/36 , G11B5/455 , G11B5/4555 , G11B2220/2516
摘要： A method for testing a magnetic head to determine whether the magnetic head is unacceptably affected by temperature variations. The test includes testing the magnetic head at different temperatures and measuring either or both of a signal amplitude and a signal asymmetry of a signal from the magnetic head at the different temperatures. If signal amplitude or signal asymmetry vary excessively as a result of the temperature change then the head can be scrapped.
摘要翻译：一种用于测试磁头以确定磁头是否不可接受地受温度变化影响的方法。该测试包括在不同温度下测试磁头，并测量不同温度下来自磁头的信号的信号幅度和信号不对称之一或两者。如果由于温度变化而导致信号幅度或信号不对称变化过大，则可以报废头部。

3. 发明申请

US20070064353A1 Read sensor defined by lateral stack templates and method for fabrication 失效
标题翻译：读取由横向堆栈模板定义的传感器和制造方法
公开(公告)号：US20070064353A1
公开(公告)日：2007-03-22
申请号：US11231438
申请日：2005-09-20
申请人： David Heim , Kim Lee , Tsann Lin , Jih-Shiuan Luo , Chun-Ming Wang
发明人： David Heim , Kim Lee , Tsann Lin , Jih-Shiuan Luo , Chun-Ming Wang
IPC分类号： G11B5/127 , G11B5/33
CPC分类号： G11B5/398 , B82Y10/00 , B82Y25/00 , G11B5/3163 , G11B5/3932 , H01L43/12 , Y10T29/49039 , Y10T29/49043 , Y10T29/49044 , Y10T29/49046 , Y10T29/49048 , Y10T29/49052
摘要： A method is disclosed for fabricating a read sensor for a magnetic head for a hard disk drive having a read sensor stack and two lateral stacks. The method of fabrication includes forming lateral stacks on a gap layer, surrounding a groove to form a template. The read sensor stack is then formed in the groove, which defines the lateral dimensions of the read sensor stack, and lead layers are then formed on the lateral stacks. Also disclosed is a read head for a disk drive having a sensor stack defined by pre-established lateral stacks, and a disk drive having the read head.
摘要翻译：公开了一种用于制造用于具有读取传感器堆叠和两个横向堆叠的硬盘驱动器的磁头的读取传感器的方法。制造方法包括在间隙层上形成横向叠层，围绕凹槽形成模板。然后将读取的传感器堆叠形成在凹槽中，其限定读取的传感器堆叠的横向尺寸，然后在横向堆叠件上形成引线层。还公开了一种用于具有由预先建立的横向叠层定义的传感器堆叠的磁盘驱动器的读取头，以及具有读取磁头的磁盘驱动器。

4. 发明授权

US07092220B2 Apparatus for enhancing thermal stability, improving biasing and reducing damage from electrostatic discharge in self-pinned abutted junction heads having a first self-pinned layer extending under the hard bias layers 失效
标题翻译：用于增强热稳定性，改善偏压并减少在自固定的邻接接头中的静电放电的损伤的装置，其具有在硬偏压层下延伸的第一自固位层
公开(公告)号：US07092220B2
公开(公告)日：2006-08-15
申请号：US10629535
申请日：2003-07-29
申请人： Hardayal Singh Gill , Wen-Chien Hsiao , Jih-Shiuan Luo
发明人： Hardayal Singh Gill , Wen-Chien Hsiao , Jih-Shiuan Luo
IPC分类号： G11B5/39
CPC分类号： B82Y25/00 , B82Y10/00 , B82Y40/00 , G11B5/3903 , G11B5/3932 , H01F10/3281 , H01F41/302
摘要： A method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. A first self-pinned layer having a first magnetic orientation is provided, wherein the first self-pinned layer has a first end, a second end and central portion. A second self-pinned layer is formed over only the central portion of the first self-pinned layer and an interlayer is disposed between the first and second self-pinned layers. A free layer is formed in a central region over the second self-pinned layer. First and second hard bias layers are formed over the first and second ends of the first self-pinned layer respectively, the first and second hard bias layer abutting the free layer, the first and second end of the first self-pinned layer extending under the hard bias layers at the first and second ends.
摘要翻译：一种用于增强热稳定性，改善偏压并减少自销接合接头中的电涌的损伤的方法和装置。提供了具有第一磁性取向的第一自固位层，其中第一自固位层具有第一端，第二端和中心部分。仅在第一自被钉扎层的中心部分上形成第二自固位层，并且中间层设置在第一和第二自固位层之间。在第二自固位层上的中心区域形成自由层。第一和第二硬偏压层分别形成在第一自固位层的第一和第二端上，第一和第二硬偏置层邻接自由层，第一自固位层的第一和第二端延伸在在第一和第二端的硬偏压层。

5. 发明授权

US07050277B2 Apparatus having a self-pinned abutted junction magnetic read sensor with hard bias layers formed over ends of a self-pinned layer and extending under a hard bias layer 失效
标题翻译：具有自固定邻接接合磁读取传感器的装置，其具有形成在自固定层的端部上并在硬偏置层下方延伸的硬偏置层
公开(公告)号：US07050277B2
公开(公告)日：2006-05-23
申请号：US10629319
申请日：2003-07-29
申请人： Hardayal Singh Gill , Wen-Chien Hsiao , Jih-Shiuan Luo
发明人： Hardayal Singh Gill , Wen-Chien Hsiao , Jih-Shiuan Luo
IPC分类号： G11B5/39
CPC分类号： G11B5/31
摘要： A method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. The head includes a self-pinned layer, the self-pinned layer having a first end, a second end and central portion, a free layer disposed over the central portion of the self-pinned layer in a central region and a first and second hard bias layers formed over the first and second ends of the self-pinned layer respectively, the first and second hard bias layer abutting the free layer, the first and second end of the self-pinned layer extending under the hard bias layers at the first and second ends.
摘要翻译：一种用于增强热稳定性，改善偏压并减少自销接合接头中的电涌的损伤的方法和装置。头部包括自固位层，自固位层具有第一端，第二端和中心部分，自由层设置在中心区域中的自固位层的中心部分上，第一和第二硬偏置层分别形成在自固位层的第一和第二端上，第一和第二硬偏置层邻接自由层，自固位层的第一和第二端在第一和第二硬质偏压层的下面延伸，第二端

6. 发明授权

US07049809B2 System, method, and apparatus for handling and testing individual sliders in a row-like format in single slider processing systems 失效
公开(公告)号：US07049809B2
公开(公告)日：2006-05-23
申请号：US10891777
申请日：2004-07-15
申请人： Jih-Shiuan Luo , Ali Sanayei , Darrick Taylor Smith
发明人： Jih-Shiuan Luo , Ali Sanayei , Darrick Taylor Smith
IPC分类号： G01R33/12 , G01R31/28
CPC分类号： G11B5/3173 , G11B5/102 , G11B5/105 , G11B5/3106 , G11B5/3163 , G11B5/3166 , G11B5/3169 , G11B5/3189 , G11B5/40 , G11B5/455
摘要： A device for handling and testing individual sliders in a row-like format utilizes an elongated, row-like holder having a series of small pockets, each of which receives a single slider. After the sliders enter the holder, a clamp is moved to a closed position to retain the sliders in the holder. The holder is placed in a test fixture such that permanently mounted probes precisely engage the small pads on the sliders for multiple testing purposes. Enlarged probe pads on the test fixture are electrically interconnected with the probes to provide an operator with easy access to the slider pads. The sliders are tested in a row-like format, side by side, to reduce handling-induced electrostatic discharge and mechanical damage.

7. 发明申请

US20050227184A1 Topographically defined thin film CPP read head fabrication 失效
标题翻译：图形定位薄膜CPP读头制造
公开(公告)号：US20050227184A1
公开(公告)日：2005-10-13
申请号：US10815447
申请日：2004-03-31
申请人： David Heim , Kim Lee , Tsann Lin , Jih-Shiuan Luo
发明人： David Heim , Kim Lee , Tsann Lin , Jih-Shiuan Luo
IPC分类号： G11B5/127 , G11B5/31
CPC分类号： B82Y10/00 , G11B5/3163 , Y10T29/49048 , Y10T403/58
摘要： A method of constructing a small trackwidth magnetorsesistive sensor by defining a trench between first and second hard bias layers and depositing the sensor into the trench.
摘要翻译：一种通过在第一和第二硬偏置层之间限定沟槽并将传感器沉积到沟槽中来构造小轨道磁体主动传感器的方法。

8. 发明授权

US07639458B2 System and method for pre-stressing a read head for improving performance thereof 失效
标题翻译：用于预加重读头以提高其性能的系统和方法
公开(公告)号：US07639458B2
公开(公告)日：2009-12-29
申请号：US10887992
申请日：2004-07-09
申请人： Lydia Baril , Ciaran A. Fox , Jih-Shiuan Luo , Peter J. Melz , Chin-Yu Yeh
发明人： Lydia Baril , Ciaran A. Fox , Jih-Shiuan Luo , Peter J. Melz , Chin-Yu Yeh
IPC分类号： G11B5/33 , H04R31/00
CPC分类号： G11B5/012 , G11B2005/0002 , G11B2005/0008 , G11B2005/0018 , G11B2005/0021 , Y10T29/49034 , Y10T29/49044
摘要： A system, method and computer program product provide an annealing process for setting a magnetization condition of a read head. An amount of heat for stabilizing magnetization condition of a read head is calculated. A width and amplitude of a voltage pulse that generates the calculated amount of heat in the read head are calculated. A voltage pulse of the calculated width and amplitude is applied to the read head for generating Joule heating in the read head. The width of the voltage pulse is less than one second.
摘要翻译：系统，方法和计算机程序产品提供用于设置读取头的磁化条件的退火处理。计算用于稳定读取头的磁化条件的热量。计算在读取头中产生计算出的热量的电压脉冲的宽度和幅度。所计算的宽度和幅度的电压脉冲被施加到读头，用于在读头中产生焦耳加热。电压脉冲的宽度小于1秒。

9. 发明申请

US20060061366A1 SYSTEM AND METHOD FOR DECREASING ESD DAMAGE DURING COMPONENT LEVEL LONG TERM TESTING 失效
标题翻译：在组件级长期测试期间降低ESD损伤的系统和方法
公开(公告)号：US20060061366A1
公开(公告)日：2006-03-23
申请号：US10949998
申请日：2004-09-23
申请人： Jih-Shiuan Luo
发明人： Jih-Shiuan Luo
IPC分类号： G01N27/60
CPC分类号： G01N27/60
摘要： A method is disclosed for minimizing damage from electrostatic discharge (ESD) during long-term testing of electronic components and assemblies. The method includes conducting a stress-test, during which a protection circuit is engaged, which shields components and assemblies from ESD. Then at least one functional test is conducted, at which time, the protection circuit is disengaged. Also disclosed is a system for conducting long-term testing of electronic components and assemblies while providing protection from ESD. The system includes a testing circuit for providing current to the components and assemblies during the long-term testing which includes at least one stress-testing phase and at least one functional testing phase. Also included is a protection circuit for protecting the components and assemblies during said stress-testing phase of said long-term testing. A switch is included for disengaging the protection circuit from the components and assemblies during said functional testing phase of said long-term testing.
摘要翻译：公开了一种在电子部件和组件的长期测试期间最小化静电放电（ESD）损伤的方法。该方法包括进行应力测试，在此期间保护电路被接合，其将部件和组件屏蔽ESD。然后进行至少一次功能测试，此时保护电路脱离。还公开了一种用于进行电子部件和组件的长期测试的系统，同时提供ESD的保护。该系统包括用于在长期测试期间向组件和组件提供电流的测试电路，其包括至少一个压力测试阶段和至少一个功能测试阶段。还包括用于在所述长期测试的所述应力测试阶段期间保护部件和组件的保护电路。包括开关，用于在所述长期测试的所述功能测试阶段期间将保护电路与部件和组件分离。

10. 发明授权

US07005858B1 System and method for decreasing ESD damage during component level long term testing 失效
标题翻译：在组件级长期测试期间减少ESD损伤的系统和方法
公开(公告)号：US07005858B1
公开(公告)日：2006-02-28
申请号：US10949998
申请日：2004-09-23
申请人： Jih-Shiuan Luo
发明人： Jih-Shiuan Luo
IPC分类号： G01N27/60 , H02H9/00
CPC分类号： G01N27/60
摘要： A method is disclosed for minimizing damage from electrostatic discharge (ESD) during long-term testing of electronic components and assemblies. The method includes conducting a stress-test, during which a protection circuit is engaged, which shields components and assemblies from ESD. Then at least one functional test is conducted, at which time, the protection circuit is disengaged.Also disclosed is a system for conducting long-term testing of electronic components and assemblies while providing protection from ESD. The system includes a testing circuit for providing current to the components and assemblies during the long-term testing which includes at least one stress-testing phase and at least one functional testing phase. Also included is a protection circuit for protecting the components and assemblies during said stress-testing phase of said long-term testing. A switch is included for disengaging the protection circuit from the components and assemblies during said functional testing phase of said long-term testing.
摘要翻译：公开了一种在电子部件和组件的长期测试期间最小化静电放电（ESD）损伤的方法。该方法包括进行应力测试，在此期间保护电路被接合，其将部件和组件屏蔽ESD。然后进行至少一次功能测试，此时保护电路脱离。

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