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1. 发明申请

US20210139269A1 RETRACTABLE REEL FOR A TIGER TAIL 有权
公开(公告)号：US20210139269A1
公开(公告)日：2021-05-13
申请号：US16677629
申请日：2019-11-07
申请人： Jay Jordan , Steven Rech
发明人： Jay Jordan , Steven Rech
IPC分类号： B65H75/42
摘要： An illustrated view of an exemplary retractable rope reel device for protecting a tiger tail or jetter hose of a jet truck and trailer mounted unit. The retractable rope reel device keeps the tiger tail in place and stops the jetter hose from dragging or scraping along an edge of a pipe or manhole and causing replacement or leaking of the jetter hose. The retractable rope reel device is useful for protecting users working on the jet truck and trailer from being in the road when retrieving a rope from a side cargo area of the jet truck and trailer. Further, the retractable rope reel device is useful for saving time and energy of the users from retrieving and returning the rope from the jet truck and trailer thus being more efficient and safer in the use of time and costs. The device has a canister with a retractable reel and a trigger on an inside of the canister. The trigger allows retraction of a rope that is coupled to the reel. The rope is coupled to a tiger tail for keeping the tiger tail securely in a desired position. The device has a bracket for attaching the device to a bumper and then can be removed or kept for future use.

2. 发明授权

US07511282B2 Sample preparation 有权
标题翻译：样品制备
公开(公告)号：US07511282B2
公开(公告)日：2009-03-31
申请号：US11440799
申请日：2006-05-25
申请人： Enrique Agorio , Michael Tanguay , Christophe Roudin , Liang Hong , Jay Jordan , Craig Henry , Mark Darus
发明人： Enrique Agorio , Michael Tanguay , Christophe Roudin , Liang Hong , Jay Jordan , Craig Henry , Mark Darus
IPC分类号： G21K5/10
CPC分类号： G01N1/286 , G01N1/32 , G01N2001/2833 , G01N2001/2886 , G02B21/32 , H01J2237/31745 , Y10T428/24355
摘要： Methods of extracting a TEM sample from a substrate include milling a hole on the sample and inserting a probe into the hole. The sample adheres to the probe, and can be processed on transferred while on the probe. In another embodiment, the sample is freed from a substrate and adheres to a probe by electrostatic attraction. The sample is placed onto a TEM sample holder in a vacuum chamber.
摘要翻译：从基材提取TEM样品的方法包括在样品上研磨孔并将探针插入孔中。样品粘附到探头上，并且可以在探头上进行处理。在另一个实施方案中，样品从基底中释放出来并通过静电吸附粘附到探针上。将样品置于真空室中的TEM样品架上。

3. 发明授权

US07423263B2 Planar view sample preparation 有权
公开(公告)号：US07423263B2
公开(公告)日：2008-09-09
申请号：US11474519
申请日：2006-06-23
申请人： Liang Hong , Craig Henry , Jay Jordan , Young-Chung Wang
发明人： Liang Hong , Craig Henry , Jay Jordan , Young-Chung Wang
IPC分类号： G01N1/28 , H01J37/20
CPC分类号： G01N1/32 , H01J2237/208 , H01J2237/31745
摘要： A method and apparatus is described for orienting samples for charged particle beam operations. A sample is attached to a probe with a major surface of the sample at a non-normal angle to the probe shaft, and the probe shaft is rotated to reorient the sample. The invention is particularly useful for preparing planar view TEM samples. The invention allows for a sample to be mounted to a TEM grid and thinning by an ion beam without removing the grid from the vacuum chamber for reorienting. In one embodiment, a probe oriented at an angle, such as 45 degrees, to the sample stage has a probe tip with a flat area oriented parallel at 45 degrees to the probe axis, that is, the flat area is parallel to the sample stage. The flat area of the probe tip is attached to the sample, and when the probe is rotated 180 degrees, the orientation of the sample changes by 90 degrees, from horizontal to vertical. The sample can then be attached to a vertically oriented TEM grid on a sample stage. The sample stage is rotated and tilted to present the backside of the sample to the ion beam for thinning.

4. 发明申请

US20080073535A1 Planar view sample preparation 有权
标题翻译：平面图样品准备
公开(公告)号：US20080073535A1
公开(公告)日：2008-03-27
申请号：US11474519
申请日：2006-06-23
申请人： Liang Hong , Craig Henry , Jay Jordan , Young-Chung Wang
发明人： Liang Hong , Craig Henry , Jay Jordan , Young-Chung Wang
IPC分类号： G21K7/00
CPC分类号： G01N1/32 , H01J2237/208 , H01J2237/31745
摘要： A method and apparatus is described for orienting samples for charged particle beam operations. A sample is attached to a probe with a major surface of the sample at a non-normal angle to the probe shaft, and the probe shaft is rotated to reorient the sample. The invention is particularly useful for preparing planar view TEM samples. The invention allows for a sample to be mounted to a TEM grid and thinning by an ion beam without removing the grid from the vacuum chamber for reorienting. In one embodiment, a probe oriented at an angle, such as 45 degrees, to the sample stage has a probe tip with a flat area oriented parallel at 45 degrees to the probe axis, that is, the flat area is parallel to the sample stage. The flat area of the probe tip is attached to the sample, and when the probe is rotated 180 degrees, the orientation of the sample changes by 90 degrees, from horizontal to vertical. The sample can then be attached to a vertically oriented TEM grid on a sample stage. The sample stage is rotated and tilted to present the backside of the sample to the ion beam for thinning.
摘要翻译：描述了用于定向带电粒子束操作的样本的方法和装置。将样品连接到具有与探针轴成非正常角度的样品主表面的探针上，并且探针轴旋转以重新取向样品。本发明特别可用于制备平面视图TEM样品。本发明允许将样品安装到TEM网格并通过离子束减薄而不从真空室移除网格以进行重新定向。在一个实施例中，以一定角度（例如45度）到达样品台的探针具有探针尖端，其具有平行于与探针轴成45度的平坦区域，即平坦区域平行于样品台。探针尖端的平坦区域连接到样品上，当探头旋转180度时，样品的取向从水平向垂直方向变化90度。然后将样品连接到样品台上的垂直取向的TEM网格。样品台旋转并倾斜以将样品的背面呈现到离子束以进行稀释。

5. 发明申请

US20070272854A1 Sample Preparation 有权
标题翻译：样品制备
公开(公告)号：US20070272854A1
公开(公告)日：2007-11-29
申请号：US11440799
申请日：2006-05-25
申请人： Enrique Agorio , Michael Tanguay , Christophe Roudin , Liang Hong , Jay Jordan , Craig Henry , Mark Darus
发明人： Enrique Agorio , Michael Tanguay , Christophe Roudin , Liang Hong , Jay Jordan , Craig Henry , Mark Darus
IPC分类号： G01N1/08
CPC分类号： G01N1/286 , G01N1/32 , G01N2001/2833 , G01N2001/2886 , G02B21/32 , H01J2237/31745 , Y10T428/24355
摘要： Methods of extracting a TEM sample from a substrate include milling a hole on the sample and inserting a probe into the hole. The sample adheres to the probe, and can be processed on transferred while on the probe. In another embodiment, the sample is freed from a substrate and adheres to a probe by electrostatic attraction. The sample is placed onto a TEM sample holder in a vacuum chamber.
摘要翻译：从基材提取TEM样品的方法包括在样品上研磨孔并将探针插入孔中。样品粘附到探头上，并且可以在探头上进行处理。在另一个实施方案中，样品从基底中释放出来并通过静电吸附粘附到探针上。将样品置于真空室中的TEM样品架上。

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