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    • 1. 发明申请
    • ALIGNMENT SYSTEM
    • 对齐系统
    • US20120127033A1
    • 2012-05-24
    • US12951359
    • 2010-11-22
    • Gilbert M. ShowsJacob Kim
    • Gilbert M. ShowsJacob Kim
    • H01Q3/00
    • H01Q25/02F41A33/02F41G3/26G01S3/28H01Q11/08
    • An apparatus for determining alignment of a first subsystem relative to a second subsystem. The apparatus includes a first antenna system for simultaneously transmitting a delta pattern radiation beam at a first frequency and a sum pattern radiation beam at a second frequency. The apparatus also includes a second antenna system for receiving the delta pattern radiation beam at the first frequency and the sum pattern radiation beam at the second frequency. The apparatus also includes a processor to process the received delta pattern radiation beam and sum pattern radiation beam to determine if a predetermined alignment criterion between the first antenna system and the second antenna system is satisfied.
    • 一种用于确定第一子系统相对于第二子系统的对准的装置。 该装置包括第一天线系统,用于同时以第一频率发射Δ模式辐射束,并以第二频率发射和模式辐射束。 该装置还包括第二天线系统,用于以第一频率接收增量图案辐射束,并以第二频率接收总和图案辐射束。 该装置还包括一个处理器,用于处理接收的增量图形辐射束和总和图案辐射束,以确定第一天线系统和第二天线系统之间的预定对准标准是否被满足。