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    • 1. 发明授权
    • Bicycle crankset
    • 自行车曲柄
    • US06164157A
    • 2000-12-26
    • US352756
    • 1999-07-14
    • Hsing-Lung Chen
    • Hsing-Lung Chen
    • B62M3/00F16C9/02
    • B62M3/003Y10T74/2164
    • A bicycle crankset includes a chain ring, a sleeve, two bearing sets, two bearings, two fastening nuts, two rubber washers, a retaining washer, a tightening nut, and a crank arm provided with outer threads. The crankset is mounted on the crank arm by the sleeve in conjunction with the retaining washer and the tightening nut which is engaged with the outer threads of the crank arm. The two fastening nuts are provided with a circular groove for retaining the rubber washer which is semicircular in its cross section and is provided at both edges on the flat side with an angled corner to facilitate the inserting of the rubber washer into the circular groove of the fastening nuts.
    • 自行车曲柄组件包括链环,套筒,两个轴承组,两个轴承,两个紧固螺母,两个橡胶垫圈,保持垫圈,紧固螺母和设有外螺纹的曲柄臂。 曲柄组件通过套筒与保持垫圈和紧固螺母一起安装在曲柄臂上,紧固螺母与曲柄臂的外螺纹啮合。 两个紧固螺母设置有圆形槽,用于保持其横截面为半圆形的橡胶垫圈,并且在平坦侧面的两个边缘处设有成角度的角部,以便于将橡胶垫圈插入到 紧固螺母
    • 3. 发明申请
    • High Frequency Vertical Spring Probe
    • 高频垂直弹簧探头
    • US20110241715A1
    • 2011-10-06
    • US13077986
    • 2011-04-01
    • Cheng-Lung HuangPou-Huang ChenHsing-Lung Chen
    • Cheng-Lung HuangPou-Huang ChenHsing-Lung Chen
    • G01R1/067
    • G01R1/06772G01R1/06716G01R1/06733G01R31/2886
    • A high frequency vertical spring probe is provided in the present invention. The probe includes an unclosed ring structure having a gap disposed therein to provide an elastic property for vertical deformation. At least a first contacting component and a second contacting component are disposed on the ring structure of the probe to provide electrical connection of an external component when the probe is compressed. The first contacting component is located near two terminals of the ring structure adjacent to the gap and the second contacting component is disposed vertically corresponding to the first contacting component. The probe can serve as the electrical connection between two components or can be installed in the probe card to provide chip testing with high-frequency, high-speed and good-contacting environment.
    • 在本发明中提供了一种高频垂直弹簧探针。 探针包括未封闭的环形结构,其中设置有间隙,以提供用于垂直变形的弹性特性。 至少第一接触部件和第二接触部件设置在探头的环形结构上,以在探头被压缩时提供外部部件的电连接。 第一接触部件位于邻近间隙的环结构的两个端子附近,并且第二接触部件垂直对应于第一接触部件设置。 探头可以作为两个组件之间的电气连接,或者可以安装在探针卡中,以提供高频,高速和良好接触环境的芯片测试。
    • 4. 发明授权
    • High frequency vertical spring probe
    • 高频垂直弹簧探头
    • US08710857B2
    • 2014-04-29
    • US13077986
    • 2011-04-01
    • Cheng-Lung HuangPou-Huang ChenHsing-Lung Chen
    • Cheng-Lung HuangPou-Huang ChenHsing-Lung Chen
    • G01R31/00
    • G01R1/06772G01R1/06716G01R1/06733G01R31/2886
    • A high frequency vertical spring probe is provided in the present invention. The probe includes an unclosed ring structure having a gap disposed therein to provide an elastic property for vertical deformation. At least a first contacting component and a second contacting component are disposed on the ring structure of the probe to provide electrical connection of an external component when the probe is compressed. The first contacting component is located near two terminals of the ring structure adjacent to the gap and the second contacting component is disposed vertically corresponding to the first contacting component. The probe can serve as the electrical connection between two components or can be installed in the probe card to provide chip testing with high-frequency, high-speed and good-contacting environment.
    • 在本发明中提供了一种高频垂直弹簧探针。 探针包括未封闭的环形结构,其中设置有间隙,以提供用于垂直变形的弹性特性。 至少第一接触部件和第二接触部件设置在探头的环形结构上,以在探头被压缩时提供外部部件的电连接。 第一接触部件位于邻近间隙的环结构的两个端子附近,并且第二接触部件垂直对应于第一接触部件设置。 探头可以作为两个组件之间的电气连接,或者可以安装在探针卡中,以提供高频,高速和良好接触环境的芯片测试。