会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Thickness control method and double side polisher
    • 厚度控制方法和双面抛光机
    • US07147541B2
    • 2006-12-12
    • US11359397
    • 2006-02-23
    • Hitoshi NagayamaYusuke Inoue
    • Hitoshi NagayamaYusuke Inoue
    • B24B49/00
    • B24B37/08B24B41/067B24B49/02B24B49/10
    • The object of the present invention is to provide a double side polisher capable of maintaining thickness control accuracy over a long period of time without being affected by a gradual change in thickness of a polishing pad, and a thickness control method. The first polishing operation is finished based on the polishing duration time, and the second and subsequent polishing operations are finished based on the measured distance values of a distance sensor, and after each polishing operation including the first polishing, the measured value of the distance sensor is calibrated based on the measured value and target value of finishing thickness of the work piece. Since the calibration is performed for each polishing operation, it is possible to maintain thickness control accuracy over a long period of time.
    • 本发明的目的是提供一种能够在不受抛光垫的厚度的逐渐变化的影响的情况下长时间地保持厚度控制精度的双面抛光机和厚度控制方法。 基于研磨持续时间完成第一研磨操作,并且基于测量的距离传感器的距离值完成第二次和随后的抛光操作,并且在包括第一抛光的每次抛光操作之后,距离传感器的测量值 基于工件的精加工厚度的测量值和目标值进行校准。 由于对每次研磨操作进行校准,因此能够长时间保持厚度控制精度。
    • 5. 发明授权
    • Work planarizing method and apparatus
    • 工作平面化方法和装置
    • US6039638A
    • 2000-03-21
    • US17010
    • 1998-02-02
    • Hitoshi NagayamaMotoi Nezu
    • Hitoshi NagayamaMotoi Nezu
    • B24B37/005B24B37/04B24B37/30H01L21/304B24B5/00
    • B24B37/102B24B37/30B24B41/06
    • A method and apparatus for planarizing works can adjust an urging force or pressure applied to a work with ease in a short period of time, but also avoid wasteful use of rings. Wafers 100 adhered to a block 110 is made into contact with a lower surface plate 1. An annular ring 5 which encloses the wafers 100 is disposed in the peripheral portion of the block 110. The peripheral portion of the block 110 is pressed by a head 4 through an annular ring 5. Simultaneous with this, by rotating the lower surface plate 1 while pressing the central portion of the block 110 at a desired pressure by means of a center-pressing member 6 provided on the head 4, the wafers 100 are planarized. Preferably, the center-pressing member 6 includes a pressure chamber 7 formed in the central portion of the head 4, a pressing plate 8 mounted in an opening of the pressure chamber 7 for movement relative thereto so that it can project from the opening to thereby press the central portion of the block 110, and an air pump 9 for controlling the air pressure in the pressure chamber 7.
    • 用于平坦化工作的方法和装置可以在短时间内容易地调节施加到工件上的推动力或压力,而且还避免浪费使用环。 与块体110粘附的晶片100与下表面板1接触。封闭晶片100的环形环5设置在块110的周边部分中。块110的周边部分被头部 与此同时,通过旋转下表面板1,同时通过设置在头部4上的中心按压构件6,在期望的压力下按压块110的中心部分,晶片100是 平面化 优选地,中心按压部件6包括形成在头部4的中心部分的压力室7,安装在压力室7的开口中以相对于其移动的压板8,使得其能够从开口突出 按压块110的中心部分,以及用于控制压力室7中的空气压力的空气泵9。